| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A gamma-ray diffraction instrument for high-intensity Mössbauer sources
|
Yelon, W.B.
|
|
1986
|
14 |
3 |
p. 341-347
7 p.
|
artikel
|
| 2 |
Aggregation of ion-implanted silver in magnesium oxide single crystals
|
Abouchacra, G.
|
|
1986
|
14 |
3 |
p. 282-289
8 p.
|
artikel
|
| 3 |
Analysis of optical density data generated from neutron radiographs of uranium-plutonium mixed oxide fuel pellets inside sealed nuclear fuel pins
|
Panakkal, J.P.
|
|
1986
|
14 |
3 |
p. 310-313
4 p.
|
artikel
|
| 4 |
An effective method for spectra storage
|
Zolnai, L.
|
|
1986
|
14 |
3 |
p. 360-362
3 p.
|
artikel
|
| 5 |
Angular distribution of Ag atoms sputtered with A 5 keV Ar+ ion beam
|
Szymonski, Marek
|
|
1986
|
14 |
3 |
p. 263-267
5 p.
|
artikel
|
| 6 |
A simple soft X-ray (1 < λ < 11 nm) spectrometer for relative line intensity measurements in charge exchange studies
|
Fleury, A.
|
|
1986
|
14 |
3 |
p. 353-359
7 p.
|
artikel
|
| 7 |
A test of two depth profiling techniques using PIXE
|
Frontier, Jean-Pierre
|
|
1986
|
14 |
3 |
p. 348-352
5 p.
|
artikel
|
| 8 |
Calendar
|
|
|
1986
|
14 |
3 |
p. 369-372
4 p.
|
artikel
|
| 9 |
Cold moving mice: A microfoil internal conversion electron detector for low and intermediate energy Mössbauer transitions
|
Mullen, James G.
|
|
1986
|
14 |
3 |
p. 323-340
18 p.
|
artikel
|
| 10 |
Data acquisition and display system for a scanning proton probe
|
Santos, D.M.
|
|
1986
|
14 |
3 |
p. 363-367
5 p.
|
artikel
|
| 11 |
Equilibrium charge fractions of 1 MeV/u Fe and Ni ions after passage through a carbon foil
|
Shima, K.
|
|
1986
|
14 |
3 |
p. 275-277
3 p.
|
artikel
|
| 12 |
Ion-bombarded-assisted intermetallic compound formation in Ti-Sn bilayers
|
Ma, E.
|
|
1986
|
14 |
3 |
p. 294-296
3 p.
|
artikel
|
| 13 |
Postirradiation enhanced lattice site occupation of cadmium in the implanted Al-Cd system
|
Kloska, M.K.
|
|
1986
|
14 |
3 |
p. 268-274
7 p.
|
artikel
|
| 14 |
Radiation damage and its annealing in apatite
|
Ritter, W.
|
|
1986
|
14 |
3 |
p. 314-322
9 p.
|
artikel
|
| 15 |
Residual defects in implanted silicon submitted to RTA: Evidence of a chemical effect
|
Hasenack, C.M.
|
|
1986
|
14 |
3 |
p. 290-293
4 p.
|
artikel
|
| 16 |
The initial crack development in teflon surfaces under energetic particle bombardment
|
Michael, R.
|
|
1986
|
14 |
3 |
p. 278-281
4 p.
|
artikel
|
| 17 |
Tritium depth profiling in surface regions of solids by use of the T(d, α)n reaction
|
Shuichi Okuda,
|
|
1986
|
14 |
3 |
p. 304-309
6 p.
|
artikel
|
| 18 |
Use of rutherford scattering on a secondary carbon target for correcting intermediate thickness sample PIXE measurements
|
Aloupogiannis, P.
|
|
1986
|
14 |
3 |
p. 297-303
7 p.
|
artikel
|
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