nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Axial dechanneling in compound crystals with point defects and defect analysis by RBS
|
Gärtner, K. |
|
1997 |
132 |
1 |
p. 147-158 |
artikel |
2 |
Broad-band hard X-ray reflectors
|
Joensen, Karsten Dan |
|
1997 |
132 |
1 |
p. 221-227 |
artikel |
3 |
Calculation and experimental determination of dimensions of hardening and tempering zones in quenched U7A steel irradiated with a pulsed electron beam
|
Markov, A.B. |
|
1997 |
132 |
1 |
p. 79-86 |
artikel |
4 |
Calculations of neutron transport through a simulated waste matrix
|
Womble, P.C. |
|
1997 |
132 |
1 |
p. 123-134 |
artikel |
5 |
Calendar
|
|
|
1997 |
132 |
1 |
p. 229-230 |
artikel |
6 |
Direct observation of lattice strain in Si 1−x Ge x Si crystals using planar channeling patterns
|
Breese, M.B.H. |
|
1997 |
132 |
1 |
p. 177-187 |
artikel |
7 |
Editorial Board
|
|
|
1997 |
132 |
1 |
p. ii-iii |
artikel |
8 |
Effect of ion bombardment on the Tl-response of both LiF (TLD-100) and a home-made LiF: Mg,Cu,P phosphors
|
Abdel-Hamid, H.M. |
|
1997 |
132 |
1 |
p. 119-122 |
artikel |
9 |
Energy loss of 10 MeV/amu atomic helium in carbon
|
Ogawa, H. |
|
1997 |
132 |
1 |
p. 36-40 |
artikel |
10 |
Fast fluorescence decay of naphthalene induced by Ar ion irradiation
|
Taguchi, Mitsumasa |
|
1997 |
132 |
1 |
p. 135-141 |
artikel |
11 |
Frequency dependence on temperature of AC conductance in silicon detectors
|
Croitoru, N. |
|
1997 |
132 |
1 |
p. 199-206 |
artikel |
12 |
Functional behaviour of solar bleached thermoluminescence in calcites
|
Liritzis, I. |
|
1997 |
132 |
1 |
p. 87-92 |
artikel |
13 |
High current Ni-ion implantation into Al films
|
Gao, K.Y. |
|
1997 |
132 |
1 |
p. 68-72 |
artikel |
14 |
High frequency electro-acoustic chopper for synchrotron radiation
|
Tucoulou, R. |
|
1997 |
132 |
1 |
p. 207-213 |
artikel |
15 |
H+ secondary ions emission stimulated by impact of energetic ions on heated target
|
Barros Leite, C.V. |
|
1997 |
132 |
1 |
p. 55-60 |
artikel |
16 |
Intercomparison of photon dose measurements at the 8 MeV electron accelerator
|
Angelescu, T. |
|
1997 |
132 |
1 |
p. 193-198 |
artikel |
17 |
Isotropy of ion-induced electron emission from crystal targets bombarded with MeV ions
|
Kudo, Hiroshi |
|
1997 |
132 |
1 |
p. 41-44 |
artikel |
18 |
Lattice location of N in ZnSe by channeling-NRA
|
Kobayashi, H. |
|
1997 |
132 |
1 |
p. 142-146 |
artikel |
19 |
Measurement of general etch rate for CR-39 plastic at short distance scale
|
He, Y.D. |
|
1997 |
132 |
1 |
p. 109-113 |
artikel |
20 |
Multiple scattering in inelastic X-ray scattering spectroscopy: A Monte-Carlo study
|
Felsteiner, J. |
|
1997 |
132 |
1 |
p. 1-10 |
artikel |
21 |
On light suppressed divacancy formation at photon assisted ion implantation of silicon
|
Barabanenkov, M.Yu. |
|
1997 |
132 |
1 |
p. 73-78 |
artikel |
22 |
Photon-tagged nuclear reaction analysis for trace element determination
|
Kristiansson, Per |
|
1997 |
132 |
1 |
p. 159-176 |
artikel |
23 |
Raman scattering and optical absorption studies of Ar+ implanted CdS thin films
|
Narayanan, K.L. |
|
1997 |
132 |
1 |
p. 61-67 |
artikel |
24 |
Range parameters of bismuth ions in polystyrene
|
Liang, J.H. |
|
1997 |
132 |
1 |
p. 29-35 |
artikel |
25 |
Repulsive interatomic potentials calculated using Hartree-Fock and density-functional theory methods
|
Nordlund, K. |
|
1997 |
132 |
1 |
p. 45-54 |
artikel |
26 |
Self-neutralized ion implantation into insulators
|
Liu, F. |
|
1997 |
132 |
1 |
p. 188-192 |
artikel |
27 |
Stopping power of Nd ions in Pb determined from γ-ray lineshape analysis in Coulomb excitation
|
Brandolini, F. |
|
1997 |
132 |
1 |
p. 11-17 |
artikel |
28 |
The Brandt-Kitagawa heavy ion model: Embedding in the homogeneous electron gas
|
Mathar, Richard J. |
|
1997 |
132 |
1 |
p. 18-28 |
artikel |
29 |
The use of the EGS4-PRESTA code for the thermoluminescent dosemeter response simulation
|
Isabey, R. |
|
1997 |
132 |
1 |
p. 114-118 |
artikel |
30 |
Track separation due to dissociation of MeV C60 inside a solid
|
Dunlop, A. |
|
1997 |
132 |
1 |
p. 93-108 |
artikel |
31 |
Use of the Hough transform to determine the center of digitized X-ray diffraction patterns
|
Dammer, Christoph |
|
1997 |
132 |
1 |
p. 214-220 |
artikel |