| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
Analysis of interaction tracks in a stacked film track detector
|
Hasegawa, H.
|
|
1985
|
12 |
2 |
p. 298-303
6 p.
|
article
|
| 2 |
Analysis of metal alloys by Rayleigh to Compton ratios and X-ray fluorescence peaks in the 50 to 122 keV energy range
|
Gigante, G.E.
|
|
1985
|
12 |
2 |
p. 229-234
6 p.
|
article
|
| 3 |
An experimental setup for surface ionization and desorption studies
|
Mårtenson, B.Mattias
|
|
1985
|
12 |
2 |
p. 273-281
9 p.
|
article
|
| 4 |
Annealing of fission fragment tracks in inorganic solids
|
Modgil, S.K.
|
|
1985
|
12 |
2 |
p. 212-218
7 p.
|
article
|
| 5 |
A quantitative basis for hair analysis using PIXE
|
Li, Hong-Kou
|
|
1985
|
12 |
2 |
p. 248-256
9 p.
|
article
|
| 6 |
A simple method for determining the elemental distribution over the transverse cross section of a hair
|
Li, Hong-Kou
|
|
1985
|
12 |
2 |
p. 257-264
8 p.
|
article
|
| 7 |
Axial dechanneling IV. Stacking faults
|
Gärtner, Konrad
|
|
1985
|
12 |
2 |
p. 205-211
7 p.
|
article
|
| 8 |
Calendar
|
|
|
1985
|
12 |
2 |
p. 311-313
3 p.
|
article
|
| 9 |
Channeling phenomena in off-axis ion implanted (001) silicon
|
Cembali, F.
|
|
1985
|
12 |
2 |
p. 225-228
4 p.
|
article
|
| 10 |
Design criteria for an angle resolved electron spectrometer of novel toroidal geometry
|
Toffoletto, F.
|
|
1985
|
12 |
2 |
p. 282-297
16 p.
|
article
|
| 11 |
Evaluation of depth profiling with PIXE
|
Brissaud, Ivan
|
|
1985
|
12 |
2 |
p. 235-244
10 p.
|
article
|
| 12 |
On the electrical (in)activity of group V impurities implanted in silicon
|
Antoncik, E.
|
|
1985
|
12 |
2 |
p. 219-224
6 p.
|
article
|
| 13 |
On the emission of radiation from relattvistic charged particles in ferroelectrics
|
Zioutas, K.
|
|
1985
|
12 |
2 |
p. 200-204
5 p.
|
article
|
| 14 |
On the optimization of an external PIXE arrangement
|
Anttila, A.
|
|
1985
|
12 |
2 |
p. 245-247
3 p.
|
article
|
| 15 |
Radiation damage effects in tritium implanted Si(Li) detectors
|
Dixon, W.R.
|
|
1985
|
12 |
2 |
p. 304-310
7 p.
|
article
|
| 16 |
Rutherford backscattering — A tool for quantification of the results of PIXE analysis of single hair strands
|
Li, Hong-Kou
|
|
1985
|
12 |
2 |
p. 265-268
4 p.
|
article
|
| 17 |
Screening corrections to the Rutherford cross section
|
Huttel, E.
|
|
1985
|
12 |
2 |
p. 193-199
7 p.
|
article
|
| 18 |
The effect of oxides on PIXE measurements
|
Rickards, J.
|
|
1985
|
12 |
2 |
p. 269-272
4 p.
|
article
|
Journal description