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                             117 results found
no title author magazine year volume issue page(s) type
1 Accelerator based X-ray facilities applied to freight control Gaillard, G.
 1996
 113 1-4 p. 128-133
6 p.
 article
2 A computer controlled PIGE setup for the analysis of thin samples Strivay, D.
 1996
 113 1-4 p. 407-410
4 p.
 article
3 Aerosol study in the town of Genova with a PIXE analysis Formenti, P.
 1996
 113 1-4 p. 359-362
4 p.
 article
4 A high capacity ion source for AMS Kieser, W.E.
 1996
 113 1-4 p. 461-464
4 p.
 article
5 Alpha backscattering used in stoichiometry determination of thin SiC coatings on Si(100) wafers Somatri, R.
 1996
 113 1-4 p. 284-287
4 p.
 article
6 Aluminum ion implantation under backfilling oxygen Hausner, R.M.
 1996
 113 1-4 p. 176-181
6 p.
 article
7 AMS 14C dating of ancient human bones in missing layers Sixun, Yuan
 1996
 113 1-4 p. 477-478
2 p.
 article
8 A new injector for the ISL-cyclotron at HMI Engels, O.
 1996
 113 1-4 p. 16-20
5 p.
 article
9 An IBA and Raman study of irradiated thin films of YBa2Cu3O7 superconductor Vlastou, R.
 1996
 113 1-4 p. 253-256
4 p.
 article
10 Application of ion implantation in tooling industry Straede, Christen A.
 1996
 113 1-4 p. 161-166
6 p.
 article
11 Application of nuclear analytical and electron microscopic techniques to the investigation of the oxidation behavior of Mg-implanted steel samples Noli, F.
 1996
 113 1-4 p. 171-175
5 p.
 article
12 Applications of nuclear microprobes in environmental research Malmqvist, Klas G.
 1996
 113 1-4 p. 336-346
11 p.
 article
13 Applications of nuclear microprobes in the semiconductor industry Takai, M.
 1996
 113 1-4 p. 330-335
6 p.
 article
14 Ar+-beam experiments with the high-current heavy-ion Spiral-RFQ at GSI Bessler, U.
 1996
 113 1-4 p. 30-33
4 p.
 article
15 A study on the metallisation and stabilisation of porous silicon Giaddui, T.
 1996
 113 1-4 p. 201-204
4 p.
 article
16 Author index 1996
 113 1-4 p. 539-550
12 p.
 article
17 Beam-current measurement based on residual gas ionization Bohne, W.
 1996
 113 1-4 p. 78-80
3 p.
 article
18 Biomedical applications of hadron accelerators Amaldi, Ugo
 1996
 113 1-4 p. 513-521
9 p.
 article
19 Boron localisation in silicon, an application of nuclear reaction channelling for materials analysis Vollmer, M.
 1996
 113 1-4 p. 403-406
4 p.
 article
20 BSCAT: Code for simulation and for analysis of the RBS/NRA spectra Rajchel, Bogusław
 1996
 113 1-4 p. 300-302
3 p.
 article
21 41Ca measurements at the Zurich AMS facility Dittrich-Hannen, B.
 1996
 113 1-4 p. 453-456
4 p.
 article
22 Committees and sponsors 1996
 113 1-4 p. viii-
1 p.
 article
23 Compact flash X-ray sources and their applications Pouvesle, J.M.
 1996
 113 1-4 p. 134-140
7 p.
 article
24 Computer aided simulations of high current small energy electron beam channels Marghitu, S.
 1996
 113 1-4 p. 114-118
5 p.
 article
25 Computer simulation for electrostatic lenses by using piecewise polynomials Kiss, L.
 1996
 113 1-4 p. 71-74
4 p.
 article
26 Concept and status of the new sample preparation and analyzing facility at Bochum Kubsky, S.
 1996
 113 1-4 p. 63-66
4 p.
 article
27 Cross section measurements of proton induced reactions using a gas target Parrat, Y.
 1996
 113 1-4 p. 470-473
4 p.
 article
28 Cross section of the 14N(α,p0)17O nuclear reaction for analytical applications Giorginis, G.
 1996
 113 1-4 p. 396-398
3 p.
 article
29 Cross section of the 32S(α, p)35Cl nuclear reaction for sulphur determination Soltani-Farshi, M.
 1996
 113 1-4 p. 399-402
4 p.
 article
30 Crystallographic structure of δ-TiN films prepared by photon and ion beam assisted deposition Wengenmair, H.
 1996
 113 1-4 p. 196-200
5 p.
 article
31 Custom-tailored dose with the IMPELA electron irradiator Drewell, N.H.
 1996
 113 1-4 p. 93-95
3 p.
 article
32 Damage and sputtering of fullerene by low energy medium and heavy ions Fink, D.
 1996
 113 1-4 p. 244-247
4 p.
 article
33 Damage in semiconductor materials during heavy-ion elastic recoil detection analysis Walker, S.R.
 1996
 113 1-4 p. 312-316
5 p.
 article
34 Damage production and annealing of ion implanted silicon carbide Heft, A.
 1996
 113 1-4 p. 239-243
5 p.
 article
35 Defect development and dopant location due to elevated temperature implantation of InP with MeV zinc ions Krause, H.
 1996
 113 1-4 p. 209-213
5 p.
 article
36 Density of thin TiO2 films Laube, M.
 1996
 113 1-4 p. 288-292
5 p.
 article
37 Depth profile analysis and study of the electronic properties of silicon nitride layers produced by ion implantation Markwitz, A.
 1996
 113 1-4 p. 223-226
4 p.
 article
38 Depth resolving phase analysis of ion implanted stainless steel Walter, G.
 1996
 113 1-4 p. 167-170
4 p.
 article
39 Design of low frequency RFQ accelerators for ion implantation Vormann, H.
 1996
 113 1-4 p. 38-41
4 p.
 article
40 Detection of 236U: a possible 100-million year neutron flux integrator Purser, Kenneth H.
 1996
 113 1-4 p. 445-452
8 p.
 article
41 Determination of the microbeam profile using deconvolution procedures Maj, B.
 1996
 113 1-4 p. 391-395
5 p.
 article
42 Development of heavy ion IHQ linac for material irradiation Ito, T.
 1996
 113 1-4 p. 46-49
4 p.
 article
43 Diffusion phenomena of implanted nitrogen in chromium Symietz, I.
 1996
 113 1-4 p. 182-185
4 p.
 article
44 Direct measurement and Monte Carlo simulation of a bremsstrahlung source created by 10 MeV electrons Stritt, N.
 1996
 113 1-4 p. 150-153
4 p.
 article
45 Editorial Kubik, P.W.
 1996
 113 1-4 p. vii-
1 p.
 article
46 Editorial Board 1996
 113 1-4 p. ii-iii
nvt p.
 article
47 Effect of Cr implantation on the morphology of Al:Si films Zaborowski, M.
 1996
 113 1-4 p. 191-195
5 p.
 article
48 Elastic recoil detection (ERD) with extremely heavy ions Forster, J.S.
 1996
 113 1-4 p. 308-311
4 p.
 article
49 Electrical conduction in ion implanted Nylon-6 films Balasubramanian, V.
 1996
 113 1-4 p. 257-260
4 p.
 article
50 Electron beam technology for improvement of the recovery characteristics of power thyristors Iliescu, Elena
 1996
 113 1-4 p. 103-105
3 p.
 article
51 Elemental concentration profile in ancient gold artifacts by ion beam scattering Ruvalcaba-Sil, J.L.
 1996
 113 1-4 p. 275-278
4 p.
 article
52 Energy widths of ion beams from a tandem accelerator Hartmann, B.
 1996
 113 1-4 p. 50-53
4 p.
 article
53 Environmental levels of carbon-14 around a Swedish nuclear power plant measured with accelerator mass spectrometry Stenström, K.
 1996
 113 1-4 p. 474-476
3 p.
 article
54 Epitaxial crystallization and nucleation during MeV-ion beam processing of amorphous GaAs surface layers Bachmann, T.
 1996
 113 1-4 p. 214-217
4 p.
 article
55 ERDA of solar selective absorbers Assmann, W.
 1996
 113 1-4 p. 303-307
5 p.
 article
56 Excimer lasers induced electron beams on metal cathodes under a plasma effect Beloglazov, A.
 1996
 113 1-4 p. 110-113
4 p.
 article
57 Excitation function of alpha-particle induced nuclear reactions on natural nickel Takács, S.
 1996
 113 1-4 p. 424-428
5 p.
 article
58 Fine-focusing system of intense beams for application of ion-induced plasma Sasa, K.
 1996
 113 1-4 p. 67-70
4 p.
 article
59 Focused high-voltage electron beams in material science Sigle, W.
 1996
 113 1-4 p. 88-92
5 p.
 article
60 From micro- to nanoprobes: auspices and horizons Butz, T.
 1996
 113 1-4 p. 317-322
6 p.
 article
61 Further results from PIXE analysis of inks in Galileo's notes on motion Del Carmine, P.
 1996
 113 1-4 p. 354-358
5 p.
 article
62 Glancing incident MeV ion beams for total reflection PIXE (TPIXE) and RBS surface analysis van Kan, J.A.
 1996
 113 1-4 p. 373-377
5 p.
 article
63 High-current positron beams in γ-defectoscopy Gorev, V.V.
 1996
 113 1-4 p. 526-529
4 p.
 article
64 High-precision radiocarbon measurements at the ANTARES AMS Centre Hotchkis, M.A.C.
 1996
 113 1-4 p. 457-460
4 p.
 article
65 IAP linacs in applied research Martin, D.
 1996
 113 1-4 p. 106-109
4 p.
 article
66 Improvement of heavy element tomography results using tunable gamma-ray beams Bertschy, M.
 1996
 113 1-4 p. 146-149
4 p.
 article
67 Improving beam profiles in the Super-ALIS super conducting storage ring Yamada, K.
 1996
 113 1-4 p. 119-121
3 p.
 article
68 Increase of 129I in the environment Wagner, M.J.M.
 1996
 113 1-4 p. 490-494
5 p.
 article
69 Influence of plasma density and plasma sheath dynamics on the ion implantation by plasma immersion technique Bender, H.
 1996
 113 1-4 p. 266-269
4 p.
 article
70 Influence of pulsed laser annealing on rare earth implanted luminescence Can, N.
 1996
 113 1-4 p. 248-252
5 p.
 article
71 Investigation of chemical processes at mineral surfaces using accelerator-based and surface analytical techniques: heavy metal sorption on zeolite crystals Misaelides, P.
 1996
 113 1-4 p. 296-299
4 p.
 article
72 Investigation of the resolution affecting parameters of a nuclear microprobe using a solenoid lens Stephan, A.
 1996
 113 1-4 p. 387-390
4 p.
 article
73 Ion beam-based studies for tribological phenomena Racolta, P.M.
 1996
 113 1-4 p. 420-423
4 p.
 article
74 Ion beam mixing at copper/alumina interfaces using marker geometry Neubeck, K.
 1996
 113 1-4 p. 186-190
5 p.
 article
75 Ion beam modification for submicron technology Kalbitzer, S.
 1996
 113 1-4 p. 154-160
7 p.
 article
76 Ion beam studies of archaeological gold jewellery items Demortier, G.
 1996
 113 1-4 p. 347-353
7 p.
 article
77 Ion irradiation facility for materials research at the 1.4 MeV/u high-charge state injector of GSI Tinschert, K.
 1996
 113 1-4 p. 59-62
4 p.
 article
78 Large area ion and plasma beam sources Waldorf, J.
 1996
 113 1-4 p. 8-15
8 p.
 article
79 Light ion induced damage in CdTe and Hg(1 − x)Cd(x)Te epitaxial thin films Russo, S.P.
 1996
 113 1-4 p. 218-222
5 p.
 article
80 Low energy ion beam irradiation of silicon Nebiker, P.W.
 1996
 113 1-4 p. 205-208
4 p.
 article
81 Low-energy ion source characteristics for producing an ultra-fine microbeam Ishii, Yasuyuki
 1996
 113 1-4 p. 75-77
3 p.
 article
82 Low-energy 15N implantation in carbon for the synthesis of carbon nitride layers Link, F.
 1996
 113 1-4 p. 235-238
4 p.
 article
83 Medical application of 26Al Steinhausen, C.
 1996
 113 1-4 p. 479-483
5 p.
 article
84 Microstructural characterization of stoichiometric buried Si3N4 films Paloura, E.C.
 1996
 113 1-4 p. 227-230
4 p.
 article
85 Nuclear microprobe design Mutsaers, P.H.A.
 1996
 113 1-4 p. 323-329
7 p.
 article
86 Nuclear waste transmutation Leray, S.
 1996
 113 1-4 p. 495-500
6 p.
 article
87 On the production of 36Cl by high energy protons in thin and thick targets Schiekel, Th.
 1996
 113 1-4 p. 484-489
6 p.
 article
88 Perturbed angular correlations in metal oxides with radioactive tracer beams Lupascu, D.
 1996
 113 1-4 p. 507-512
6 p.
 article
89 PIGE-PIXE analysis of chewing sticks of pharmacological importance Olabanji, S.O.
 1996
 113 1-4 p. 368-372
5 p.
 article
90 Preliminary research concerning the use of electron accelerators to improve the conservability and to extend the shelf-life of fruits and vegetables Minea, R.
 1996
 113 1-4 p. 99-102
4 p.
 article
91 Production of cosmogenic nuclides in meteoroids: accelerator experiments and model calculations to decipher the cosmic ray record in extraterrestrial matter Michel, R.
 1996
 113 1-4 p. 434-444
11 p.
 article
92 Production of residual nuclei from irradiation of thin Pb-targets with protons up to 1.6 GeV Gloris, M.
 1996
 113 1-4 p. 429-433
5 p.
 article
93 Quantification of fluorine in SiF x etch residues on silicon with proton induced γ-emission van Ijzendoorn, L.J.
 1996
 113 1-4 p. 411-414
4 p.
 article
94 Radiation damage in spinel single crystals Turos, A.
 1996
 113 1-4 p. 261-265
5 p.
 article
95 Radioactive ion beams for solid state research Correia, J.G.
 1996
 113 1-4 p. 501-506
6 p.
 article
96 RBS characterization of iridium silicides formed by RTA in vacuum Rodríguez, T.
 1996
 113 1-4 p. 279-283
5 p.
 article
97 RBS with monolayer resolution Kimura, Kenji
 1996
 113 1-4 p. 270-274
5 p.
 article
98 Review of industrial applications of electron accelerators Mehnert, R.
 1996
 113 1-4 p. 81-87
7 p.
 article
99 Scanning transmission ion microscopy (STIM) with a 3 MeV proton cyclotron beam van Maanen, I.F.
 1996
 113 1-4 p. 382-386
5 p.
 article
100 SIMS characterization of thin layers of IR and its silicides Blanco, JoséM.
 1996
 113 1-4 p. 530-533
4 p.
 article
101 Study of structural differences between stoichiometric and congruent lithium niobate Kling, A.
 1996
 113 1-4 p. 293-295
3 p.
 article
102 Study on a tuning-free network for the rf accelerating cavity Sato, K.
 1996
 113 1-4 p. 42-45
4 p.
 article
103 Technique for fluence attenuation by acceleration of decay particles Itahashi, T.
 1996
 113 1-4 p. 21-25
5 p.
 article
104 Testing of radiation detectors by IBIC imaging Jakšić, M.
 1996
 113 1-4 p. 378-381
4 p.
 article
105 The behaviour of Si and CoSi2 during low energy nitrogen bombardment, with and without O2-flooding Deleu, J.
 1996
 113 1-4 p. 534-538
5 p.
 article
106 The cooler synchrotron COSY in Jülich Bechstedt, U.
 1996
 113 1-4 p. 26-29
4 p.
 article
107 The effect of ion implantation in the microstructure of Si3N4 films: an X-ray absorption study Paloura, E.C.
 1996
 113 1-4 p. 231-234
4 p.
 article
108 The feasibility of high power cyclotrons Stammbach, Th.
 1996
 113 1-4 p. 1-7
7 p.
 article
109 The Frankfurt ECRIS-RFQ facility for materials research with highly charged ions Stiebing, K.
 1996
 113 1-4 p. 34-37
4 p.
 article
110 The Groningen AMS facility Wijma, S.
 1996
 113 1-4 p. 465-469
5 p.
 article
111 The measurement, control, and validation of critical parameters in an electron beam sterilization facility Burns, P.
 1996
 113 1-4 p. 96-98
3 p.
 article
112 The Proton Irradiation Facility at the Paul Scherrer Institute Hajdas, Wojtek
 1996
 113 1-4 p. 54-58
5 p.
 article
113 The proton therapy system for the NPTC: equipment description and progress report Jongen, Y.
 1996
 113 1-4 p. 522-525
4 p.
 article
114 Thin layer activation of non-metallic materials by using nuclear implantation Ditrói, F.
 1996
 113 1-4 p. 415-419
5 p.
 article
115 X-ray detectors with digitized preamplifiers Stein, J.
 1996
 113 1-4 p. 141-145
5 p.
 article
116 X-ray emission spectroscopy applied for bulk and individual analysis of airborne particulates Valkovic, V.
 1996
 113 1-4 p. 363-367
5 p.
 article
117 X-ray microprobes Chevallier, P.
 1996
 113 1-4 p. 122-127
6 p.
 article
                             117 results found
 
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