| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Doppler broadening positron annihilation technique for the study of defects in bulk samples
|
Dunlap, R.A.
|
|
1996
|
108 |
3 |
p. 339-342
4 p.
|
artikel
|
| 2 |
Application of hydrogen ion beams to Silicon On Insulator material technology
|
Bruel, Michel
|
|
1996
|
108 |
3 |
p. 313-319
7 p.
|
artikel
|
| 3 |
Calendar
|
|
|
1996
|
108 |
3 |
p. 364-366
3 p.
|
artikel
|
| 4 |
Charging damage in a hybrid parallel-scanning medium-eurrent ion implanter
|
Takahashi, Mitsutoshi
|
|
1996
|
108 |
3 |
p. 320-323
4 p.
|
artikel
|
| 5 |
Comments on theoretical limitations for experimental values of photoeffect cross sections at low energies
|
Kiran Kumar, T.
|
|
1996
|
108 |
3 |
p. 267-275
9 p.
|
artikel
|
| 6 |
Cross section for non-Rutherford backscattering of α on Be
|
Liu, Jiarui
|
|
1996
|
108 |
3 |
p. 247-250
4 p.
|
artikel
|
| 7 |
Dissociative ionisation of D2 by fast fully stripped lithium ions
|
Bapat, Bhas
|
|
1996
|
108 |
3 |
p. 243-246
4 p.
|
artikel
|
| 8 |
Energy loss of MeV heavy ions in carbon
|
Hari kumar, V.
|
|
1996
|
108 |
3 |
p. 223-226
4 p.
|
artikel
|
| 9 |
Erratum to: “Elastic scattering of electrons and positrons by atoms: differential and transport cross section calculations” [Nucl. Instr. and Meth. B 95 (1995) 470]
|
Dapor, Maurizio
|
|
1996
|
108 |
3 |
p. 363-
1 p.
|
artikel
|
| 10 |
Formation and optical characterization of multi-component Ag−Sb nanometer dimension colloids formed by sequential ion implantation in silica
|
Magruder III, R.H.
|
|
1996
|
108 |
3 |
p. 305-312
8 p.
|
artikel
|
| 11 |
Ion storage and laser-induced fluorescence measurements in an RFQ trap
|
Zhao, W.Z.
|
|
1996
|
108 |
3 |
p. 354-358
5 p.
|
artikel
|
| 12 |
Micro-analysis of SiC−Si3N4 ceramics made by hot isostatic pressing
|
Wang, Wenmin
|
|
1996
|
108 |
3 |
p. 343-346
4 p.
|
artikel
|
| 13 |
Monte Carlo calculation of charge-deposition depth profile in slabs irradiated by electrons
|
Lazurik, Valentin
|
|
1996
|
108 |
3 |
p. 276-281
6 p.
|
artikel
|
| 14 |
14N depth distribution measurements for ultrathin dielectric films on silicon (100)
|
Tang, H.T.
|
|
1996
|
108 |
3 |
p. 347-353
7 p.
|
artikel
|
| 15 |
Path integral for problem of radiation of fast charged particles in matter
|
Laskin, Nikolai V.
|
|
1996
|
108 |
3 |
p. 251-266
16 p.
|
artikel
|
| 16 |
Proposal for a new Mössbauer experimental test of special relativity
|
Kholmetskii, A.L.
|
|
1996
|
108 |
3 |
p. 359-362
4 p.
|
artikel
|
| 17 |
Secondary ion and electron yield measurements for surfaces bombarded with large molecular ions
|
Westmacott, G.
|
|
1996
|
108 |
3 |
p. 282-289
8 p.
|
artikel
|
| 18 |
Semi-empirical systematics for (n, α) reaction cross sections at the energy of 14.5 MeV
|
Konobeyev, A.Yu.
|
|
1996
|
108 |
3 |
p. 233-242
10 p.
|
artikel
|
| 19 |
Structural changes and tribological behaviors of nitrogen ion-implanted tantalum
|
Wang, W.J.
|
|
1996
|
108 |
3 |
p. 300-304
5 p.
|
artikel
|
| 20 |
The surface effect on Au 4f X-ray photoelectron spectra
|
Wang, J.P.
|
|
1996
|
108 |
3 |
p. 331-338
8 p.
|
artikel
|
| 21 |
Total M X-ray fluorescence cross sections and fluorescence yields for Pt, Au and Pb in the energy region 5.47 ≤ E ≤ 9.36 keV
|
Rao, D.V.
|
|
1996
|
108 |
3 |
p. 227-232
6 p.
|
artikel
|
| 22 |
Total sputtering yield of Ag/Cu alloys for low energy argon ions
|
Pierson, K.W.
|
|
1996
|
108 |
3 |
p. 290-299
10 p.
|
artikel
|
| 23 |
Trace element sensitivity for Heavy Ion Backscattering Spectrometry
|
Knapp, J.A.
|
|
1996
|
108 |
3 |
p. 324-330
7 p.
|
artikel
|
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