nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A new device for XAFS data collection up to 2000 K (or 3700 K under vacuum)
|
Farges, F. |
|
1995 |
101 |
4 |
p. 493-498 6 p. |
artikel |
2 |
A newly developed chemical bevelling technique used for depth independent high depth resolution SIMS analysis
|
Hsu, C.M. |
|
1995 |
101 |
4 |
p. 427-434 8 p. |
artikel |
3 |
An optimized and simplified compact ECR ion source for gaseous species
|
Boukari, F. |
|
1995 |
101 |
4 |
p. 459-463 5 p. |
artikel |
4 |
A simple model of photon transport
|
Cullen, Dermott E. |
|
1995 |
101 |
4 |
p. 499-510 12 p. |
artikel |
5 |
Author index
|
|
|
1995 |
101 |
4 |
p. 523-529 7 p. |
artikel |
6 |
Calendar
|
|
|
1995 |
101 |
4 |
p. 519-521 3 p. |
artikel |
7 |
Charge exchange of low energy particles passing through thin carbon foils: Dependence on foil thickness and charge state yields of Mg, Ca, Ti, Cr and Ni
|
Gonin, M. |
|
1995 |
101 |
4 |
p. 313-320 8 p. |
artikel |
8 |
Electron depth dose distributions in water, iron and lead: the GEPTS system
|
Chibani, Omar |
|
1995 |
101 |
4 |
p. 357-378 22 p. |
artikel |
9 |
Electron emission from conducting surfaces impacted by multiply-charged polyatomic ions
|
Axelsson, J. |
|
1995 |
101 |
4 |
p. 343-356 14 p. |
artikel |
10 |
Formation of a CoSi2 layer by Co ion implantation using a metal vapor vacuum arc ion source
|
Zhu, D.H. |
|
1995 |
101 |
4 |
p. 394-399 6 p. |
artikel |
11 |
Improvement of adhesion of TiN coatings on stainless steel substrates by high energy heavy ion irradiation
|
Srivastav, Sangeeta |
|
1995 |
101 |
4 |
p. 400-405 6 p. |
artikel |
12 |
Isotopic mass effects in low-energy sputtering of copper and molybdenum
|
Bieck, W. |
|
1995 |
101 |
4 |
p. 335-342 8 p. |
artikel |
13 |
L-subshell ionization studies in Au and Bi by 4.8-8.8 MeV boron ion bombardment
|
Dhal, B.B. |
|
1995 |
101 |
4 |
p. 327-334 8 p. |
artikel |
14 |
14 MeV neutron spectra measurements with 4% energy resolution using a type IIa diamond detector
|
Pillon, M. |
|
1995 |
101 |
4 |
p. 473-483 11 p. |
artikel |
15 |
On-line beam monitoring for neutron capture therapy at the MIT Research Reactor
|
Harling, Otto K. |
|
1995 |
101 |
4 |
p. 464-472 9 p. |
artikel |
16 |
On the correction for multiple scattering of linearly polarized X-rays in Compton profile measurements
|
Bell, Friedhelm |
|
1995 |
101 |
4 |
p. 379-387 9 p. |
artikel |
17 |
On the shape of the diffraction peaks measured by Fourier reverse time-of-flight spectrometry
|
Kudryashev, V.A. |
|
1995 |
101 |
4 |
p. 484-492 9 p. |
artikel |
18 |
PIXE analysis of plant leaves of domestic use in Mexico
|
Aspiazu, J. |
|
1995 |
101 |
4 |
p. 453-458 6 p. |
artikel |
19 |
Preparation and analysis of targets with implanted thick Ar layers for in-beam γ-spectroscopy
|
Grabowy, U |
|
1995 |
101 |
4 |
p. 422-426 5 p. |
artikel |
20 |
Radiation damage problems in high power spallation neutron sources
|
Ullmaier, H |
|
1995 |
101 |
4 |
p. 406-421 16 p. |
artikel |
21 |
Stopping power for low-velocity heavy ions: (0.01-0.9) MeV/nucleon Si ions in 18 (Z = 13–79) metals
|
Arstila, K. |
|
1995 |
101 |
4 |
p. 321-326 6 p. |
artikel |
22 |
Studies on an electrostatic ion-collection methodology
|
Howard, A.J. |
|
1995 |
101 |
4 |
p. 511-517 7 p. |
artikel |
23 |
Subject index
|
|
|
1995 |
101 |
4 |
p. 530-533 4 p. |
artikel |
24 |
Surface-sensitive X-ray diffraction methods: physics, applications and related X-ray and SR instrumentation
|
Kovalchuk, M.V |
|
1995 |
101 |
4 |
p. 435-452 18 p. |
artikel |
25 |
Thermal and ion beam diffusion constants of Sb impurity implanted into 〈100〉 Ni single crystal
|
Belattar, A. |
|
1995 |
101 |
4 |
p. 388-393 6 p. |
artikel |