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                             25 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A new device for XAFS data collection up to 2000 K (or 3700 K under vacuum) Farges, F.
1995
101 4 p. 493-498
6 p.
artikel
2 A newly developed chemical bevelling technique used for depth independent high depth resolution SIMS analysis Hsu, C.M.
1995
101 4 p. 427-434
8 p.
artikel
3 An optimized and simplified compact ECR ion source for gaseous species Boukari, F.
1995
101 4 p. 459-463
5 p.
artikel
4 A simple model of photon transport Cullen, Dermott E.
1995
101 4 p. 499-510
12 p.
artikel
5 Author index 1995
101 4 p. 523-529
7 p.
artikel
6 Calendar 1995
101 4 p. 519-521
3 p.
artikel
7 Charge exchange of low energy particles passing through thin carbon foils: Dependence on foil thickness and charge state yields of Mg, Ca, Ti, Cr and Ni Gonin, M.
1995
101 4 p. 313-320
8 p.
artikel
8 Electron depth dose distributions in water, iron and lead: the GEPTS system Chibani, Omar
1995
101 4 p. 357-378
22 p.
artikel
9 Electron emission from conducting surfaces impacted by multiply-charged polyatomic ions Axelsson, J.
1995
101 4 p. 343-356
14 p.
artikel
10 Formation of a CoSi2 layer by Co ion implantation using a metal vapor vacuum arc ion source Zhu, D.H.
1995
101 4 p. 394-399
6 p.
artikel
11 Improvement of adhesion of TiN coatings on stainless steel substrates by high energy heavy ion irradiation Srivastav, Sangeeta
1995
101 4 p. 400-405
6 p.
artikel
12 Isotopic mass effects in low-energy sputtering of copper and molybdenum Bieck, W.
1995
101 4 p. 335-342
8 p.
artikel
13 L-subshell ionization studies in Au and Bi by 4.8-8.8 MeV boron ion bombardment Dhal, B.B.
1995
101 4 p. 327-334
8 p.
artikel
14 14 MeV neutron spectra measurements with 4% energy resolution using a type IIa diamond detector Pillon, M.
1995
101 4 p. 473-483
11 p.
artikel
15 On-line beam monitoring for neutron capture therapy at the MIT Research Reactor Harling, Otto K.
1995
101 4 p. 464-472
9 p.
artikel
16 On the correction for multiple scattering of linearly polarized X-rays in Compton profile measurements Bell, Friedhelm
1995
101 4 p. 379-387
9 p.
artikel
17 On the shape of the diffraction peaks measured by Fourier reverse time-of-flight spectrometry Kudryashev, V.A.
1995
101 4 p. 484-492
9 p.
artikel
18 PIXE analysis of plant leaves of domestic use in Mexico Aspiazu, J.
1995
101 4 p. 453-458
6 p.
artikel
19 Preparation and analysis of targets with implanted thick Ar layers for in-beam γ-spectroscopy Grabowy, U
1995
101 4 p. 422-426
5 p.
artikel
20 Radiation damage problems in high power spallation neutron sources Ullmaier, H
1995
101 4 p. 406-421
16 p.
artikel
21 Stopping power for low-velocity heavy ions: (0.01-0.9) MeV/nucleon Si ions in 18 (Z = 13–79) metals Arstila, K.
1995
101 4 p. 321-326
6 p.
artikel
22 Studies on an electrostatic ion-collection methodology Howard, A.J.
1995
101 4 p. 511-517
7 p.
artikel
23 Subject index 1995
101 4 p. 530-533
4 p.
artikel
24 Surface-sensitive X-ray diffraction methods: physics, applications and related X-ray and SR instrumentation Kovalchuk, M.V
1995
101 4 p. 435-452
18 p.
artikel
25 Thermal and ion beam diffusion constants of Sb impurity implanted into 〈100〉 Ni single crystal Belattar, A.
1995
101 4 p. 388-393
6 p.
artikel
                             25 gevonden resultaten
 
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