nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Accelerator mass spectrometry: New trends and applications
|
Tuniz, C. |
|
2008 |
|
8 |
p. 1837-1845 9 p. |
artikel |
2 |
A detailed ray-tracing simulation of the high resolution microbeam at the AIFIRA facility
|
Andersson, F. |
|
2008 |
|
8 |
p. 1653-1658 6 p. |
artikel |
3 |
Advanced physics and algorithms in the IBA DataFurnace
|
Barradas, N.P. |
|
2008 |
|
8 |
p. 1875-1879 5 p. |
artikel |
4 |
Age-related elemental change in bones
|
Wang, C. |
|
2008 |
|
8 |
p. 1619-1622 4 p. |
artikel |
5 |
Angular dependence of electronic sputtering from HOPG
|
Tripathi, A. |
|
2008 |
|
8 |
p. 1265-1268 4 p. |
artikel |
6 |
An ion track based approach to nano- and micro-electronics
|
Hoppe, K. |
|
2008 |
|
8 |
p. 1642-1646 5 p. |
artikel |
7 |
Application of mass-separated focused ion beams in nano-technology
|
Bischoff, L. |
|
2008 |
|
8 |
p. 1846-1851 6 p. |
artikel |
8 |
Application of PIXE to study ancient Iranian silver coins
|
Hajivaliei, M. |
|
2008 |
|
8 |
p. 1578-1582 5 p. |
artikel |
9 |
A theoretical study of excitation functions of isomers and isomeric cross section ratios in alpha induced reactions on 107,109Ag
|
Gul, K. |
|
2011 |
|
8 |
p. 764-769 6 p. |
artikel |
10 |
Atomic scale characterization of ion-induced amorphization of GaAs and InAs using perturbed angular correlation spectroscopy
|
Dogra, R. |
|
2008 |
|
8 |
p. 1460-1463 4 p. |
artikel |
11 |
Au2+ ion-beam irradiation effects on optical properties of CdSe and CdS quantum dots
|
Venkatram, N. |
|
2008 |
|
8 |
p. 1816-1819 4 p. |
artikel |
12 |
Author Index Proceedings
|
|
|
2008 |
|
8 |
p. 1918-1932 15 p. |
artikel |
13 |
A way forward for the development of an exposure computational model to computed tomography dosimetry
|
Ferreira, C.C. |
|
2011 |
|
8 |
p. 778-785 8 p. |
artikel |
14 |
Calendar
|
|
|
2011 |
|
8 |
p. 793- 1 p. |
artikel |
15 |
Channeling study of thermal decomposition of III-N compound semiconductors
|
Stonert, A. |
|
2008 |
|
8 |
p. 1224-1228 5 p. |
artikel |
16 |
Characterization of paint layers by simultaneous self-consistent fitting of RBS/PIXE spectra using simulated annealing
|
Beck, L. |
|
2008 |
|
8 |
p. 1871-1874 4 p. |
artikel |
17 |
Combined grazing incidence RBS and TEM analysis of luminescent nano-SiGe/SiO2 multilayers
|
Kling, A. |
|
2008 |
|
8 |
p. 1397-1401 5 p. |
artikel |
18 |
Complementary use of ion beam elastic backscattering and recoil detection analysis for the precise determination of the composition of thin films made of light elements
|
Climent-Font, A. |
|
2008 |
|
8 |
p. 1498-1501 4 p. |
artikel |
19 |
Compositional analysis of atom beam co-sputtered metal–silica nanocomposites by Rutherford backscattering spectrometry
|
Kumar, Hardeep |
|
2008 |
|
8 |
p. 1511-1516 6 p. |
artikel |
20 |
Conference Sponsors and Exhibitors
|
|
|
2008 |
|
8 |
p. vii- 1 p. |
artikel |
21 |
Contents
|
|
|
2008 |
|
8 |
p. xix-xxv nvt p. |
artikel |
22 |
Controlled reduction of size of Ag nanoparticles embedded in teflon matrix by MeV ion irradiation
|
Mishra, Y.K. |
|
2008 |
|
8 |
p. 1804-1809 6 p. |
artikel |
23 |
Correlation between ion beam parameters and physical characteristics of nanostructures fabricated by focused ion beam
|
Tripathi, Sarvesh K. |
|
2008 |
|
8 |
p. 1468-1474 7 p. |
artikel |
24 |
Creation mechanism of pores by ion beam modification of fluoropolymer film membranes
|
Minamisawa, Renato Amaral |
|
2008 |
|
8 |
p. 1273-1275 3 p. |
artikel |
25 |
Depth dependent lattice disorder and strain in Mn-implanted and post-annealed InAs thin films
|
Gonzalez-Arrabal, R. |
|
2011 |
|
8 |
p. 733-738 6 p. |
artikel |
26 |
Depth profiling of carbon in silicon using the 12C(p,p′γ) reaction
|
Yasuda, K. |
|
2008 |
|
8 |
p. 1416-1420 5 p. |
artikel |
27 |
Detection of trace deuterium in depleted protium by MeV ion beam techniques
|
Döbeli, M. |
|
2008 |
|
8 |
p. 1820-1823 4 p. |
artikel |
28 |
Determination of migration of ion-implanted helium in silica by proton backscattering spectrometry
|
Szakács, G. |
|
2008 |
|
8 |
p. 1382-1385 4 p. |
artikel |
29 |
Determination of non-Rutherford cross-sections from simple RBS spectra using Bayesian inference data analysis
|
Barradas, N.P. |
|
2008 |
|
8 |
p. 1180-1184 5 p. |
artikel |
30 |
Deuterium inventory in plasma facing materials by means of NRA: A microbeam probe approach
|
Khodja, H. |
|
2008 |
|
8 |
p. 1425-1429 5 p. |
artikel |
31 |
Development of a position sensitive detector telescope for ERDA based on-line monitoring of swift heavy ions induced modifications
|
Khan, S.A. |
|
2008 |
|
8 |
p. 1912-1917 6 p. |
artikel |
32 |
Development of a time-of-flight spectrometer at the Ruder Bošković Institute in Zagreb
|
Siketić, Zdravko |
|
2008 |
|
8 |
p. 1328-1332 5 p. |
artikel |
33 |
Dielectric and structural modification of proton beam irradiated polymer composite
|
Shah, Sejal |
|
2008 |
|
8 |
p. 1768-1774 7 p. |
artikel |
34 |
Differential cross section calculations of positron and electron impact ionization of Ar (3p)
|
Purohit, G. |
|
2011 |
|
8 |
p. 745-751 7 p. |
artikel |
35 |
Editorial
|
Pathak, Anand P. |
|
2008 |
|
8 |
p. v-vi nvt p. |
artikel |
36 |
Editorial board
|
|
|
2008 |
|
8 |
p. IFC- 1 p. |
artikel |
37 |
Editorial board
|
|
|
2011 |
|
8 |
p. IFC- 1 p. |
artikel |
38 |
Effect of ion beam irradiation on magnetic and structural properties of Pt/Cr/Co multilayers
|
Tripathi, J.K. |
|
2008 |
|
8 |
p. 1247-1251 5 p. |
artikel |
39 |
Effect of 200MeV Ag15+ ion irradiation on structural and electrical transport properties of Fe3O4 thin films
|
Prakash, Ram |
|
2008 |
|
8 |
p. 1242-1246 5 p. |
artikel |
40 |
Effect of 50MeV Li3+ ion irradiation on electrical characteristics of high speed NPN power transistor
|
Dinesh, C.M. |
|
2008 |
|
8 |
p. 1713-1718 6 p. |
artikel |
41 |
Effects of 60MeV C5+ ion irradiation on PmT–PVC and p-TSA doped PoT–PVC blends
|
Lakshmi, G.B.V.S. |
|
2008 |
|
8 |
p. 1685-1691 7 p. |
artikel |
42 |
Elastic recoil detection (ERD) analysis of GeO x thin films
|
Batra, Y. |
|
2008 |
|
8 |
p. 1697-1700 4 p. |
artikel |
43 |
Electron ionization cross-section calculations for liquid water at high impact energies
|
Bousis, C. |
|
2008 |
|
8 |
p. 1185-1192 8 p. |
artikel |
44 |
Energy dependence of proton-induced L X-ray production cross-section for W
|
Mohan, Harsh |
|
2008 |
|
8 |
p. 1203-1205 3 p. |
artikel |
45 |
Energy loss and straggling of 7Li ions in the polymer foils
|
Yu, Y.C. |
|
2008 |
|
8 |
p. 1166-1169 4 p. |
artikel |
46 |
Energy loss straggling in carbon foils by 1–2MeV/atom lithium and carbon cluster-ions
|
Hsu, J.Y. |
|
2008 |
|
8 |
p. 1170-1172 3 p. |
artikel |
47 |
μ-Erda developments in order to improve the water content determination in hydrous and nominally anhydrous mantle phases
|
Raepsaet, C. |
|
2008 |
|
8 |
p. 1333-1337 5 p. |
artikel |
48 |
Estimation of essential and trace elements in some medicinal plants by PIXE and PIGE techniques
|
Devi, K. Nomita |
|
2008 |
|
8 |
p. 1605-1610 6 p. |
artikel |
49 |
Evaluation of dielectric relaxation parameters from TSDC analysis of pristine and ion irradiated kapton-H polyimide
|
Sharma, Anu |
|
2011 |
|
8 |
p. 759-763 5 p. |
artikel |
50 |
Evaluation of non-Rutherford proton elastic scattering cross section for nitrogen
|
Gurbich, A. |
|
2008 |
|
8 |
p. 1193-1197 5 p. |
artikel |
51 |
Evaluation of specimen preparation techniques for micro-PIXE localisation of elements in hyperaccumulating plants
|
Kachenko, Anthony G. |
|
2008 |
|
8 |
p. 1598-1604 7 p. |
artikel |
52 |
Evolution of magnetic pillars using 200MeV Ag15+ ion irradiation
|
Kumar, Shalendra |
|
2008 |
|
8 |
p. 1741-1748 8 p. |
artikel |
53 |
Evolution of nano-crystalline phases with post-annealing of nitrogen irradiated Fe/Co bilayers
|
Gupta, Ratnesh |
|
2008 |
|
8 |
p. 1705-1708 4 p. |
artikel |
54 |
Experimental bremsstrahlung yields for MeV proton bombardment of beryllium and carbon
|
Cohen, David D. |
|
2008 |
|
8 |
p. 1149-1153 5 p. |
artikel |
55 |
Exposure parameters in proton beam writing for hydrogen silsesquioxane
|
van Kan, J.A. |
|
2008 |
|
8 |
p. 1676-1679 4 p. |
artikel |
56 |
Fast Monte Carlo for ion beam analysis simulations
|
Schiettekatte, François |
|
2008 |
|
8 |
p. 1880-1885 6 p. |
artikel |
57 |
Flux dependent MeV ion induced modification of nano-Ag/Si system
|
Ghatak, J. |
|
2008 |
|
8 |
p. 1282-1286 5 p. |
artikel |
58 |
1/f noise studies of swift heavy ion irradiated magnetite thin films
|
Wasi Khan, M. |
|
2008 |
|
8 |
p. 1719-1722 4 p. |
artikel |
59 |
Focused ion beam implantation of Ga in nanocrystalline diamond: Fluence-dependent retention and sputtering
|
Gnaser, Hubert |
|
2008 |
|
8 |
p. 1666-1670 5 p. |
artikel |
60 |
Formation of Au nanoparticles in silica by post-irradiation and thermal annealing
|
Budak, S. |
|
2008 |
|
8 |
p. 1574-1577 4 p. |
artikel |
61 |
FTIR and RBS study of ion-beam synthesized buried silicon oxide layers
|
Patel, A.P. |
|
2008 |
|
8 |
p. 1443-1446 4 p. |
artikel |
62 |
Group Photo
|
|
|
2008 |
|
8 |
p. viii- 1 p. |
artikel |
63 |
Growth and surface morphology of ion-beam sputtered Ti–Ni thin films
|
Rao, Ambati Pulla |
|
2008 |
|
8 |
p. 1517-1521 5 p. |
artikel |
64 |
Growth of nanoscale cobalt clusters formed during implantation of 2MeV Co2+ ions in a silica matrix
|
Gangopadhyay, P. |
|
2008 |
|
8 |
p. 1647-1652 6 p. |
artikel |
65 |
Heavy ion ToF analysis of oxygen incorporation in MgB2 thin films
|
Ionescu, M. |
|
2008 |
|
8 |
p. 1701-1704 4 p. |
artikel |
66 |
HRBS/channeling studies of ultra-thin ITO films on Si
|
Malar, P. |
|
2008 |
|
8 |
p. 1464-1467 4 p. |
artikel |
67 |
Hydrogen diffusion in high temperature proton conducting ceramics
|
Sorieul, S. |
|
2008 |
|
8 |
p. 1430-1433 4 p. |
artikel |
68 |
IBA characterisation of glasses from the archaeological site of “La Alcazaba”, Almería (Spain)
|
Respaldiza, M.A. |
|
2008 |
|
8 |
p. 1587-1590 4 p. |
artikel |
69 |
Incident-angle dependence of ion-induced electron emission from Al & Co films using swift heavy ion
|
Chauhan, R.S. |
|
2008 |
|
8 |
p. 1780-1782 3 p. |
artikel |
70 |
Influence of Cr-ions on the magnetic behaviour of FeCo film
|
Gupta, Ratnesh |
|
2008 |
|
8 |
p. 1407-1410 4 p. |
artikel |
71 |
Influence of post-annealing time on blistering evolution in Si ‹100› implanted with high-fluence H ions
|
Liang, J.H. |
|
2008 |
|
8 |
p. 1562-1568 7 p. |
artikel |
72 |
In situ ERDA measurements of hydrogen isotope concentrations in palladium at atmospheric pressure
|
Ishigami, Ryoya |
|
2008 |
|
8 |
p. 1319-1323 5 p. |
artikel |
73 |
Interface strain study of thin Lu2O3/Si using HRBS
|
Chan, T.K. |
|
2008 |
|
8 |
p. 1486-1489 4 p. |
artikel |
74 |
Introducing routine pulse height defect corrections in IBA
|
Pascual-Izarra, C. |
|
2008 |
|
8 |
p. 1866-1870 5 p. |
artikel |
75 |
Investigations on 40MeV Li3+ ions irradiated GaN epilayers
|
Suresh Kumar, V. |
|
2008 |
|
8 |
p. 1799-1803 5 p. |
artikel |
76 |
Ion beam analysis
|
Pathak, Anand P. |
|
2008 |
|
8 |
p. iii- 1 p. |
artikel |
77 |
Ion beam analysis of materials in the PBMR reactor
|
Malherbe, Johan B. |
|
2008 |
|
8 |
p. 1373-1377 5 p. |
artikel |
78 |
Ion beam analysis of rare earth nitride thin films
|
Kennedy, J. |
|
2008 |
|
8 |
p. 1558-1561 4 p. |
artikel |
79 |
Ion beam cancer therapy: Fundamental aspects of the problem
|
Obolensky, O.I. |
|
2008 |
|
8 |
p. 1623-1628 6 p. |
artikel |
80 |
Ion beam characterization of rf-sputter deposited AlN films on Si(111)
|
Matsunami, N. |
|
2008 |
|
8 |
p. 1522-1526 5 p. |
artikel |
81 |
Ion beam induced charge imaging of charge transport in CdTe and CdZnTe
|
Sellin, P.J. |
|
2008 |
|
8 |
p. 1300-1306 7 p. |
artikel |
82 |
Ion beam induced modifications in electron beam evaporated aluminum oxide thin films
|
Nagabhushana, K.R. |
|
2008 |
|
8 |
p. 1475-1479 5 p. |
artikel |
83 |
Ion beam modification studies of InP based multi quantum wells
|
Dhamodaran, S. |
|
2008 |
|
8 |
p. 1810-1815 6 p. |
artikel |
84 |
Ion beam sputtered ultra-thin and nanostructured Ag films for surface plasmon applications
|
Brahma, Rajeeb |
|
2008 |
|
8 |
p. 1493-1497 5 p. |
artikel |
85 |
Ion beam studies of InAs/GaAs quantum dots after annealing
|
Niu, H. |
|
2008 |
|
8 |
p. 1235-1237 3 p. |
artikel |
86 |
Ion beam studies of InAs/GaAs self assembled quantum dots
|
Alves, E. |
|
2008 |
|
8 |
p. 1439-1442 4 p. |
artikel |
87 |
Ion beam studies on reactive DC sputtered manganese doped indium tin oxide thin films
|
Sarath Kumar, S.R. |
|
2008 |
|
8 |
p. 1421-1424 4 p. |
artikel |
88 |
Ion beam synthesis and doping of photonic nanostructures
|
Elliman, R.G. |
|
2008 |
|
8 |
p. 1362-1366 5 p. |
artikel |
89 |
Ion implantation in 4H–SiC
|
Wong-Leung, J. |
|
2008 |
|
8 |
p. 1367-1372 6 p. |
artikel |
90 |
Ion-luminescence properties of GaN films being developed for IPEM
|
Rossi, P. |
|
2008 |
|
8 |
p. 1294-1299 6 p. |
artikel |
91 |
Ion track enabled multiple wire microvia interconnects in printed circuit boards
|
Yousef, H. |
|
2008 |
|
8 |
p. 1659-1665 7 p. |
artikel |
92 |
Irradiation effects on sodium sulphanilate dihydrate single crystals
|
Mythili, P. |
|
2008 |
|
8 |
p. 1754-1758 5 p. |
artikel |
93 |
Light ion induced L X-ray production cross-sections in Au and Pb
|
Ouziane, S. |
|
2008 |
|
8 |
p. 1209-1211 3 p. |
artikel |
94 |
Low energy ion and atom scattering spectroscopy for surface structural analysis of single metal and insulator crystals
|
Umezawa, K. |
|
2008 |
|
8 |
p. 1892-1896 5 p. |
artikel |
95 |
Mass transport in ion–nanostructure interactions
|
Ghatak, J. |
|
2008 |
|
8 |
p. 1671-1675 5 p. |
artikel |
96 |
Measurement of (d,p) and (d,α) differential cross-sections for 14N
|
Gurbich, A. |
|
2008 |
|
8 |
p. 1206-1208 3 p. |
artikel |
97 |
Measurement of natural radioactivity and radon exhalation rate from rock samples of Jaduguda uranium mines and its radiological implications
|
Mahur, A.K. |
|
2008 |
|
8 |
p. 1591-1597 7 p. |
artikel |
98 |
Measurement of nitrogen depth profile in steel
|
Curado, J.F. |
|
2008 |
|
8 |
p. 1455-1459 5 p. |
artikel |
99 |
Measurements of Sr/Ca in bones to evaluate differences in temperature
|
Santos, P.R. |
|
2008 |
|
8 |
p. 1616-1618 3 p. |
artikel |
100 |
Mercury and gold concentrations of highly polluted environmental samples determined using prompt gamma-ray analysis and instrument neutron activation analysis
|
Osawa, Takahito |
|
2011 |
|
8 |
p. 717-720 4 p. |
artikel |
101 |
100MeV Ag7+ ion induced physicochemical changes in isotactic polypropylene
|
Mathakari, N.L. |
|
2008 |
|
8 |
p. 1793-1798 6 p. |
artikel |
102 |
Microbeam analysis of lateral inhomogeneity in depth penetration of Pd in porous silicon
|
Torkiha, M. |
|
2008 |
|
8 |
p. 1507-1510 4 p. |
artikel |
103 |
Modification of polymer composite films using 120MeV Ni10+ ions
|
Qureshi, Anjum |
|
2008 |
|
8 |
p. 1775-1779 5 p. |
artikel |
104 |
Modification of the etching properties of x-cut Lithium Niobate by ion implantation
|
Bianconi, M. |
|
2008 |
|
8 |
p. 1238-1241 4 p. |
artikel |
105 |
Modifications of the structural, electrical and magnetic properties of LaFe0.5Ni0.5O3 thin films by 190MeV Ag ion irradiation
|
Choudhary, R.J. |
|
2008 |
|
8 |
p. 1611-1615 5 p. |
artikel |
106 |
Molecular dynamics for ion beam analysis
|
Nordlund, K. |
|
2008 |
|
8 |
p. 1886-1891 6 p. |
artikel |
107 |
Multianalytical characterization of a blue pigment used in art-crafts from Central Mexico
|
Solís, C. |
|
2008 |
|
8 |
p. 1411-1415 5 p. |
artikel |
108 |
Multi-step mechanism of damage accumulation in irradiated crystals
|
Jagielski, J. |
|
2008 |
|
8 |
p. 1212-1215 4 p. |
artikel |
109 |
Nanoindentation on single-crystal Si modified by 100keV Cr+ implantation
|
Mishra, P. |
|
2008 |
|
8 |
p. 1629-1634 6 p. |
artikel |
110 |
New features of the Monte-Carlo code MOCADI
|
Iwasa, N. |
|
2011 |
|
8 |
p. 752-758 7 p. |
artikel |
111 |
Nitrogen sublattice analysis in GaN by non-Rutherford He-ion scattering
|
Turos, A. |
|
2008 |
|
8 |
p. 1897-1902 6 p. |
artikel |
112 |
Nuclear reaction analysis of 1H and 2H in hafnium silicate films on Si
|
Driemeier, C. |
|
2008 |
|
8 |
p. 1824-1827 4 p. |
artikel |
113 |
On the emission of MoCs+ molecular ions from Cs+ irradiated molybdenum surface
|
Saha, Biswajit |
|
2008 |
|
8 |
p. 1386-1391 6 p. |
artikel |
114 |
On the ion irradiation stability of Al/Ti versus AlN/TiN multilayers
|
Peruško, D. |
|
2008 |
|
8 |
p. 1749-1753 5 p. |
artikel |
115 |
Oxygen intake in ion irradiated fullerene films
|
Kumar, Amit |
|
2008 |
|
8 |
p. 1709-1712 4 p. |
artikel |
116 |
Pd/Pt(111) surface structure and metal epitaxy by time-of-flight impact-collision ion scattering spectroscopy and scanning tunneling microscopy: Does lattice mismatch really determine the growth mode?
|
Umezawa, K. |
|
2008 |
|
8 |
p. 1903-1907 5 p. |
artikel |
117 |
Performance of the HVE 5MV AMS system at CEREGE using an absorber foil for isobar suppression
|
Klein, M.G. |
|
2008 |
|
8 |
p. 1828-1832 5 p. |
artikel |
118 |
Photoacoustic spectroscopy of Ni+-implanted quartz
|
Ghosh, Binita |
|
2008 |
|
8 |
p. 1229-1234 6 p. |
artikel |
119 |
Photocollage
|
|
|
2008 |
|
8 |
p. ix-xviii nvt p. |
artikel |
120 |
Photon emission in crystalline undulators
|
Korol, A.V. |
|
2008 |
|
8 |
p. 1173-1176 4 p. |
artikel |
121 |
PIGE analysis and profiling of aluminium
|
Mateus, R. |
|
2008 |
|
8 |
p. 1490-1492 3 p. |
artikel |
122 |
Positron lifetime studies of the dose dependence of nanohole free volumes in ion-irradiated conducting poly-(ethylene-oxide)–salt polymers
|
Kumar, Rajesh |
|
2008 |
|
8 |
p. 1783-1787 5 p. |
artikel |
123 |
Post-annealing temperature dependence of blistering in high-fluence ion-implanted H in Si ‹100›
|
Liang, J.H. |
|
2008 |
|
8 |
p. 1349-1355 7 p. |
artikel |
124 |
Post deposition annealing of Hf aluminate films on Si investigated by ion backscattering and nuclear reaction analyses
|
Miotti, L. |
|
2008 |
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p. 1162-1165 4 p. |
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125 |
Precipitates and defects in silicon co-implanted with helium and oxygen
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Li, B.S. |
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2011 |
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8 |
p. 739-744 6 p. |
artikel |
126 |
Proton elastic scattering and proton induced γ-ray emission cross-sections on Na from 2 to 5MeV
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Caciolli, A. |
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2008 |
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8 |
p. 1392-1396 5 p. |
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127 |
Radiocarbon AMS at IOP: System improvements and dating of groundwater from Bhadrak district, Orissa
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Prasad, G.V. Ravi |
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2008 |
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8 |
p. 1833-1836 4 p. |
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128 |
RBS analysis of InGaN/GaN quantum wells for hybrid structures with efficient Förster coupling
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Barradas, N.P. |
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2008 |
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8 |
p. 1402-1406 5 p. |
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129 |
RBS/EBS/PIXE measurement of single-walled carbon nanotube modification by nitric acid purification treatment
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Jeynes, J.C.G. |
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2008 |
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8 |
p. 1569-1573 5 p. |
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130 |
RBS study of Ti/ZnO interface
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Rahman, A.M.A. |
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2008 |
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8 |
p. 1378-1381 4 p. |
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131 |
Recent developments of ion beam induced luminescence at the external scanning microbeam facility of the LABEC laboratory in Florence
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Colombo, E. |
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2008 |
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8 |
p. 1527-1532 6 p. |
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132 |
Re-crystallization of Mn implanted GaAs by He+ ion irradiation
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Chen, C.H. |
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2008 |
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8 |
p. 1734-1736 3 p. |
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133 |
RESOLNRA: A new program for optimizing the achievable depth resolution of ion beam analysis methods
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Mayer, M. |
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2008 |
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8 |
p. 1852-1857 6 p. |
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134 |
Resonant Rutherford backscattering spectrometry for carbon diffusion in silicon
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Saravanan, K. |
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2008 |
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8 |
p. 1502-1506 5 p. |
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135 |
Robust determination of effective atomic numbers for electron interactions with TLD-100 and TLD-100H thermoluminescent dosimeters
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Taylor, M.L. |
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2011 |
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8 |
p. 770-773 4 p. |
artikel |
136 |
Saturable absorption in gold implanted fused silica
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Ghosh, Binita |
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2008 |
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8 |
p. 1356-1361 6 p. |
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137 |
Search for short-time phase effects in the electronic damage evolution – A case study with silicon
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Schiwietz, G. |
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2008 |
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8 |
p. 1287-1293 7 p. |
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138 |
Semiconductor characterization by scanning ion beam induced charge (IBIC) microscopy
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Vittone, E. |
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2008 |
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8 |
p. 1312-1318 7 p. |
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139 |
Semi-empirical dielectric descriptions of the Bethe surface of the valence bands of condensed water
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Emfietzoglou, D. |
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2008 |
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8 |
p. 1154-1161 8 p. |
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140 |
SIMS study of effect of Cr adhesion layer on the thermal stability of silver selenide thin films on Si
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Mohanty, Bhaskar Chandra |
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2008 |
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8 |
p. 1480-1485 6 p. |
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141 |
Status of the problem of nuclear cross section data for IBA
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Gurbich, A. |
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2008 |
|
8 |
p. 1198-1202 5 p. |
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142 |
Stopping power for high energy molecular H 2 + ions interacting with silicon targets
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Touchrift, Brahim |
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2008 |
|
8 |
p. 1177-1179 3 p. |
artikel |
143 |
Structural analysis of DC magnetron sputtered and spin coated thin films using RBS, TEM and X-ray reflectivity methods
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Bhatta, Umananda M. |
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2008 |
|
8 |
p. 1548-1552 5 p. |
artikel |
144 |
Structural and compositional analysis of strain relaxed InGaAs/InP multi quantum wells
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Dhamodaran, S. |
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2008 |
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8 |
p. 1908-1911 4 p. |
artikel |
145 |
Structural and surface characteristics of room temperature and low temperature swift heavy ion implanted InAs and InSb wafers
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Sudhakar, S. |
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2008 |
|
8 |
p. 1723-1728 6 p. |
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146 |
Structural changes in helium implanted Zr0.8Y0.2O1.9 single crystals characterized by atomic force microscopy and EXAFS spectroscopy
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Kuri, G. |
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2008 |
|
8 |
p. 1216-1223 8 p. |
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147 |
Structural characterization of buried nitride layers formed by nitrogen ion implantation in silicon
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Yadav, A.D. |
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2008 |
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8 |
p. 1447-1449 3 p. |
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148 |
Structural studies of silicon oxynitride layers formed by low energy ion implantation
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Chauhan, Alka R. |
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2008 |
|
8 |
p. 1537-1541 5 p. |
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149 |
Studies of effect of deposition parameters on the ZnO films prepared by PLD
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Tripathi, Shuchi |
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2008 |
|
8 |
p. 1533-1536 4 p. |
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150 |
Studies of InP nano dots formation after keV Ar+ irradiation
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Paramanik, Dipak |
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2008 |
|
8 |
p. 1257-1260 4 p. |
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151 |
Study of ion beam mixing in Pt/Co bilayer by ion beam analysis
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Balaji, S. |
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2008 |
|
8 |
p. 1692-1696 5 p. |
artikel |
152 |
Study of optical band gap and carbonaceous clusters in swift heavy ion irradiated polymers with UV–Vis spectroscopy
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Kumar, Rajesh |
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2008 |
|
8 |
p. 1788-1792 5 p. |
artikel |
153 |
Study of swift (100MeV) Fe9+ ion irradiated gallium antimonide
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Jadhav, Vidya |
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2008 |
|
8 |
p. 1764-1767 4 p. |
artikel |
154 |
Study on evolution of gases from fluoropolymer films bombarded with heavy ions
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Minamisawa, Renato Amaral |
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2008 |
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8 |
p. 1269-1272 4 p. |
artikel |
155 |
Sub-surface retention of Pb atoms in silicon after low-energy ion implantation and electron beam annealing
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Markwitz, Andreas |
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2008 |
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8 |
p. 1553-1557 5 p. |
artikel |
156 |
Summary of “IAEA intercomparison of IBA software”
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Barradas, N.P. |
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2008 |
|
8 |
p. 1338-1342 5 p. |
artikel |
157 |
Surface roughness of ion-bombarded Si(100) surfaces: Roughening and smoothing with the same roughness exponent
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Roy, Anupam |
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2008 |
|
8 |
p. 1276-1281 6 p. |
artikel |
158 |
Swift heavy ion induced modification in Fe/Ti system studied using X-ray waveguide structure
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Rajput, Parasmani |
|
2008 |
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8 |
p. 1680-1684 5 p. |
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159 |
Swift heavy ion induced modification on the optical, mechanical and dielectric behaviour of GLS single crystals
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Mythili, P. |
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2008 |
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8 |
p. 1737-1740 4 p. |
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160 |
Swift heavy ion induced single event upsets in high density UV-EPROM’s
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Dahiwale, S.S. |
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2008 |
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8 |
p. 1729-1733 5 p. |
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161 |
Swift heavy ions induced mixing in metal/semiconductor system
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Kumar, Sarvesh |
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2008 |
|
8 |
p. 1759-1763 5 p. |
artikel |
162 |
Synthesis of nanodimensional TiO2 thin films using energetic ion beam
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Thakurdesai, Madhavi |
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2008 |
|
8 |
p. 1343-1348 6 p. |
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163 |
Taper angle dependence of the focusing effect of high energy heavy ion beams by glass capillaries
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Nebiki, T. |
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2008 |
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8 |
p. 1324-1327 4 p. |
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164 |
Target dependence for low-Z ion charge state fractions
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Schmitt, Chris |
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2011 |
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8 |
p. 721-728 8 p. |
artikel |
165 |
The elastic 3He+d cross section of relevance for knock-on effects in radio frequency heated (3He)D plasmas
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Ognissanto, F. |
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2011 |
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8 |
p. 786-792 7 p. |
artikel |
166 |
The energy dependence of sputtering induced ripple topography in Al film
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Mishra, P. |
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2008 |
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8 |
p. 1635-1641 7 p. |
artikel |
167 |
The new Cyclone 18/9 beam transport line at the CNA (Sevilla) for high energy PIXE applications
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García López, J. |
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2008 |
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8 |
p. 1583-1586 4 p. |
artikel |
168 |
The production of non linear damage under molecular ion implantation
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David, C. |
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2008 |
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8 |
p. 1252-1256 5 p. |
artikel |
169 |
The range of penetration and the backscattering coefficient by using both the analytic and the stochastic theoretical ways of electron slowing down in solid targets: Comparative study
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Bentabet, A. |
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2011 |
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p. 774-777 4 p. |
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170 |
The use of HI-ERDA/RBS and NRA/RBS to depth profile N in GaAs1−x N x thin films
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Smith, R.W. |
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2008 |
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8 |
p. 1450-1454 5 p. |
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171 |
Thickness and MeV Si ions bombardment effects on the thermoelectric properties of Ce3Sb10 thin films
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Güner, S. |
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2008 |
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8 |
p. 1261-1264 4 p. |
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172 |
Tuning magnetic properties of Co/Pt thin films using energetic ions
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Som, T. |
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2008 |
|
8 |
p. 1542-1547 6 p. |
artikel |
173 |
Ultra-high depth resolution SIMS for the interface analysis of complex low-dimensional structures
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Chakraborty, Purushottam |
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2008 |
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p. 1858-1865 8 p. |
artikel |
174 |
Use of a line focus of a quadrupole multiplet for irradiating millimeter length lines
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Xiong, B.Q. |
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2011 |
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8 |
p. 729-732 4 p. |
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175 |
Visible light emission from silicon dioxide with implanted excess silicon
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Gawlik, Grzegorz |
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2008 |
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8 |
p. 1307-1311 5 p. |
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176 |
Wedge etching by anodic oxidation and determination of shallow boron profile by ion beam analysis
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Gyulai, J. |
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2008 |
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p. 1434-1438 5 p. |
artikel |