| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A microscopic view of particle bombardment of organic films
|
Taylor, Ramona S.
|
|
1995
|
143 |
C |
p. 225-233
9 p.
|
artikel
|
| 2 |
Author index
|
|
|
1995
|
143 |
C |
p. 283-
1 p.
|
artikel
|
| 3 |
Biomedical accelerator mass spectrometry
|
Freeman, Stewart P.H.T.
|
|
1995
|
143 |
C |
p. 247-256
10 p.
|
artikel
|
| 4 |
Editorial Board
|
|
|
1995
|
143 |
C |
p. ii-iii
nvt p.
|
artikel
|
| 5 |
Foreword
|
Bentz, Bryan L.
|
|
1995
|
143 |
C |
p. ix-
1 p.
|
artikel
|
| 6 |
High-resolution chemical imaging with scanning ion probe SIMS
|
Chabala, J.M.
|
|
1995
|
143 |
C |
p. 191-212
22 p.
|
artikel
|
| 7 |
Imaging ion and molecular transport at subcellular resolution by secondary ion mass spectrometry
|
Chandra, Subhash
|
|
1995
|
143 |
C |
p. 161-176
16 p.
|
artikel
|
| 8 |
In situ analysis of organic monolayers and their reactivity on single micrometer-sized particles by time-of-flight secondary ion mass spectrometry
|
Fister, Thomas F.
|
|
1995
|
143 |
C |
p. 87-111
25 p.
|
artikel
|
| 9 |
Ion beam induced desorption with postionization using high repetition femtosecond lasers
|
Brummel, C.L.
|
|
1995
|
143 |
C |
p. 257-270
14 p.
|
artikel
|
| 10 |
Ion microscope and ion microprobe analysis under oxygen, cesium and gallium bombardment
|
Migeon, H.-N.
|
|
1995
|
143 |
C |
p. 51-63
13 p.
|
artikel
|
| 11 |
Isotope ratio and trace element imaging of pyrite grains in gold ores
|
Fleming, Ronald H.
|
|
1995
|
143 |
C |
p. 213-224
12 p.
|
artikel
|
| 12 |
On the SIMS depth profiling analysis: reduction of matrix effect
|
Gao, Y.
|
|
1995
|
143 |
C |
p. 11-18
8 p.
|
artikel
|
| 13 |
Radiocarbon analysis by accelerator mass spectrometry
|
Donahue, Douglas J.
|
|
1995
|
143 |
C |
p. 235-245
11 p.
|
artikel
|
| 14 |
Recent successes in the use of secondary ion mass spectrometry in microelectronics materials and processing
|
Magee, Charles W.
|
|
1995
|
143 |
C |
p. 29-41
13 p.
|
artikel
|
| 15 |
Scanning ion images; analysis of pharmaceutical drugs at organelle levels
|
Larras-Regard, E.
|
|
1995
|
143 |
C |
p. 147-160
14 p.
|
artikel
|
| 16 |
Secondary ion emission and images from a biologic matrix
|
Todd, Peter J.
|
|
1995
|
143 |
C |
p. 131-145
15 p.
|
artikel
|
| 17 |
Secondary neutral mass spectrometry (SNMS)-recent methodical progress and applications to fundamental studies in particle/surface interaction
|
Oechsner, Hans
|
|
1995
|
143 |
C |
p. 271-282
12 p.
|
artikel
|
| 18 |
SIMS imaging of paper surfaces. Part 4. The detection of desizing agents on hard-to-size paper surfaces
|
Brinen, J.S.
|
|
1995
|
143 |
C |
p. 177-190
14 p.
|
artikel
|
| 19 |
SIMS quantification in Si, GaAs, and diamond - an update
|
Wilson, R.G.
|
|
1995
|
143 |
C |
p. 43-49
7 p.
|
artikel
|
| 20 |
Small-area depth profiling in a quadrupole based SIMS instrument
|
Wittmaack, K.
|
|
1995
|
143 |
C |
p. 19-27
9 p.
|
artikel
|
| 21 |
Stone-age mass spectrometry: the beginnings of “SIMS” at RCA Laboratories, Princeton
|
Honig, Richard E.
|
|
1995
|
143 |
C |
p. 1-10
10 p.
|
artikel
|
| 22 |
Structural measurements on several alamethicin peptides by the time-of-flight correlation technique
|
Poppe-Schriemer, N.
|
|
1995
|
143 |
C |
p. 65-85
21 p.
|
artikel
|
| 23 |
Studies of polyisobutylene using time-of-flight secondary ion mass spectrometry (TOF-SIMS)
|
Xu, Keyang
|
|
1995
|
143 |
C |
p. 113-129
17 p.
|
artikel
|
| 24 |
Subject index
|
|
|
1995
|
143 |
C |
p. 285-288
4 p.
|
artikel
|
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