nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Accurate determination of optical constants of absorbing materials: measurements of transmittance and reflectance of thin films on partially metallized substrates
|
Hjortsberg, A. |
|
1980 |
69 |
2 |
p. L15-L17 nvt p. |
artikel |
2 |
Comment on the activation energy of manganese and Mn-SiO thin films
|
Castro, E.M. |
|
1980 |
69 |
2 |
p. L21-L23 nvt p. |
artikel |
3 |
Conference announcements
|
|
|
1980 |
69 |
2 |
p. L29-L30 nvt p. |
artikel |
4 |
Electrical properties of electrochemically prepared thin polyphenylene oxide films on a platinum surface: The role of ionic impurities in electroforming and conduction
|
Dubois, J.E. |
|
1980 |
69 |
2 |
p. 141-148 8 p. |
artikel |
5 |
Hall coefficient of thin polycrystalline metallic films in a three-dimensional scattering model
|
Pichard, C.R. |
|
1980 |
69 |
2 |
p. 157-164 8 p. |
artikel |
6 |
Image contrast produced by three-dimensional epitaxial crystallites of nickel electrodeposits grown on (001) copper substrates
|
Nakahara, S. |
|
1980 |
69 |
2 |
p. 241-251 11 p. |
artikel |
7 |
Mechanisms of reactive sputtering of indium I: Growth of InN in mixed Ar-N2 discharges
|
Natarajan, B.R. |
|
1980 |
69 |
2 |
p. 201-216 16 p. |
artikel |
8 |
Mechanisms of reactive sputtering of indium II: Growth of indium oxynitride in mixed N2-O2 discharges
|
Natarajan, B.R. |
|
1980 |
69 |
2 |
p. 217-227 11 p. |
artikel |
9 |
Mechanisms of reactive sputtering of indium III: A general phenomenological model for reactive sputtering
|
Eltoukhy, A.H. |
|
1980 |
69 |
2 |
p. 229-235 7 p. |
artikel |
10 |
Memory switching in amorphous Ge-S-Ga thin films
|
Mycielski, W. |
|
1980 |
69 |
2 |
p. L9-L10 nvt p. |
artikel |
11 |
n-CdS/p-ZnIn2Se4 thin film solar cell
|
García, F.J. |
|
1980 |
69 |
2 |
p. 137-139 3 p. |
artikel |
12 |
Prediction of the composition of a multicomponent surface phase by means of adsorption data of singles gases
|
Jaroniec, M. |
|
1980 |
69 |
2 |
p. L25-L27 nvt p. |
artikel |
13 |
Preparation of amorphous CuInSe2 thin films
|
Durný, R. |
|
1980 |
69 |
2 |
p. L11-L13 nvt p. |
artikel |
14 |
Properties of silicon nitride thin films obtained by reactive sputtering
|
Posadowski, Witold |
|
1980 |
69 |
2 |
p. 149-155 7 p. |
artikel |
15 |
Quantitative relations between the orientation axis tilt, the angle of incidence of the vapour and the surface form in vacuum-condensed films
|
Boichot, S.J. |
|
1980 |
69 |
2 |
p. 191-199 9 p. |
artikel |
16 |
Relations between transport phenomena and crystallization of selenium films
|
Larmagnac, J.P. |
|
1980 |
69 |
2 |
p. 237-240 4 p. |
artikel |
17 |
Resistivity and structure of evaporated polycrystalline molybdenum films
|
Vávra, I. |
|
1980 |
69 |
2 |
p. 169-173 5 p. |
artikel |
18 |
Sprayed SnO2 films: Growth mechanism and film structure characterization
|
Sanz Maudes, J. |
|
1980 |
69 |
2 |
p. 183-189 7 p. |
artikel |
19 |
Surface and bulk photoconductivity of CdS(Cu, Cl) thin films
|
Porada, Z. |
|
1980 |
69 |
2 |
p. 165-168 4 p. |
artikel |
20 |
The film thickness dependence of the space charge capacitance in PbS-Si heterojunctions
|
Rahnamai, H. |
|
1980 |
69 |
2 |
p. L19-L20 nvt p. |
artikel |
21 |
Thermal strain in lead thin films VI: Effects of oxygen doping
|
Murakami, Masanori |
|
1980 |
69 |
2 |
p. 253-267 15 p. |
artikel |
22 |
X-ray photoemission studies of cesium antimonide photoemitters
|
Bates Jr., Clayton W. |
|
1980 |
69 |
2 |
p. 175-182 8 p. |
artikel |