| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Analysis of stored charge volatility in an MAOS memory element
|
Anand, K.V.
|
|
1978
|
48 |
3 |
p. 361-366
6 p.
|
artikel
|
| 2 |
A review of the theory, technology and applications of metal-semiconductor rectifiers
|
Rideout, V.L.
|
|
1978
|
48 |
3 |
p. 261-291
31 p.
|
artikel
|
| 3 |
Author index
|
|
|
1978
|
48 |
3 |
p. 395-
1 p.
|
artikel
|
| 4 |
Concentration and mobility of charge carriers in thin polycrystalline films of bismuth
|
Kochowski, S.
|
|
1978
|
48 |
3 |
p. 345-351
7 p.
|
artikel
|
| 5 |
Conduction and charge storage in a double-dielectric Maos structure for memory applications
|
Sampuran-Singh,
|
|
1978
|
48 |
3 |
p. 353-360
8 p.
|
artikel
|
| 6 |
D.c. sputtered Al x In1-x Sb films
|
Jachimowski, M.
|
|
1978
|
48 |
3 |
p. L15-L17
nvt p.
|
artikel
|
| 7 |
Dielectric properties of plasma-polymerized ferrocene films
|
Phadke, Shireesh D.
|
|
1978
|
48 |
3 |
p. 319-324
6 p.
|
artikel
|
| 8 |
Diffusion of aluminum into silicon nitride films
|
Ogata, H.
|
|
1978
|
48 |
3 |
p. 333-338
6 p.
|
artikel
|
| 9 |
Dislocation wall formation during interdiffusion in thin bimetallic films
|
Beers, A.M.
|
|
1978
|
48 |
3 |
p. 367-376
10 p.
|
artikel
|
| 10 |
Electrical and optical properties of germanium-aluminium films
|
Makhija, I.J.
|
|
1978
|
48 |
3 |
p. L3-L7
nvt p.
|
artikel
|
| 11 |
Electron diffraction from periodic arrays of misfit dislocations formed during epitaxial growth
|
Cherns, D.
|
|
1978
|
48 |
3 |
p. 385-393
9 p.
|
artikel
|
| 12 |
General Fuchs-Sondheimer expressions for the strain coefficients of resistivity of thin metallic films
|
Tellier, C.R.
|
|
1978
|
48 |
3 |
p. L9-L13
nvt p.
|
artikel
|
| 13 |
Infrared transparent and amorphous carbon grown under ion impact in a butane plasma
|
Holland, L.
|
|
1978
|
48 |
3 |
p. L21-L23
nvt p.
|
artikel
|
| 14 |
Initial growth behaviour of indium phosphide on molybdenum substrates
|
Saitoh, T.
|
|
1978
|
48 |
3 |
p. 339-344
6 p.
|
artikel
|
| 15 |
Properties of stannic oxide thin films produced from the SnCl4-H2O and SnCl4-H2O2 reaction systems
|
Muranoi, Tetsuo
|
|
1978
|
48 |
3 |
p. 309-318
10 p.
|
artikel
|
| 16 |
Stress in transparent conductive Sn-doped indium oxide thin films
|
Just, M.
|
|
1978
|
48 |
3 |
p. L19-L20
nvt p.
|
artikel
|
| 17 |
Subject index
|
|
|
1978
|
48 |
3 |
p. 396-399
4 p.
|
artikel
|
| 18 |
Thermoelectric power in thin metal films
|
Thompson, J.B.
|
|
1978
|
48 |
3 |
p. L25-L26
nvt p.
|
artikel
|
| 19 |
Ultra-microhardness of vacuum-deposited films I: Ultra-microhardness tester
|
Nishibori, Mineo
|
|
1978
|
48 |
3 |
p. 325-331
7 p.
|
artikel
|
| 20 |
Use of ultraviolet spectroscopy for studying interdiffusion reactions of PbO on vitreous surfaces
|
Duffy, J.A.
|
|
1978
|
48 |
3 |
p. 377-383
7 p.
|
artikel
|
| 21 |
Varying mode of disorder of the MnAl6 alloy phase in the recovery process of vacuum codeposited films
|
Yoshida, Kentaro
|
|
1978
|
48 |
3 |
p. 293-308
16 p.
|
artikel
|
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