Digital Library
Close Browse articles from a journal
 
Search for with title:
ABCDEFGHIJKLMNOPQRSTUVWXYZ

     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
                                       All articles of the corresponding issues
 
                             7 results found
no title author magazine year volume issue page(s) type
1 Analytic solutions for optimized ellipsometric measurements of interfaces and surface layers in thin film structures Alterovitz, Samuel A.
 1985
 123 3 p. 183-196
14 p.
 article
2 A simple method for the determination of film thickness from electron image contrast in a scanning electron microscope Rajora, O.S.
 1985
 123 3 p. 235-238
4 p.
 article
3 Investigation of Al/(Al,Ga)As/GaAs metal/insulator/ semiconductor-type structures and application to buried interface field effect transistors Drummond, T.J.
 1985
 123 3 p. 213-222
10 p.
 article
4 Numerical solutions of the adsorption integral equation utilizing the spline functions Bräuer, P.
 1985
 123 3 p. 245-272
28 p.
 article
5 Optical properties of black molybdenum: Dependence on cermet composition, topology and surface texture Chain, E.E.
 1985
 123 3 p. 197-211
15 p.
 article
6 The abrasion of hot silicon targets by reactive sputtering in Ar-O2 Steenbeck, K.
 1985
 123 3 p. 239-244
6 p.
 article
7 The stress in ion-plated HfN and TiN coatings Chollet, L.
 1985
 123 3 p. 223-234
12 p.
 article
                             7 results found
 
 Koninklijke Bibliotheek - National Library of the Netherlands