| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Chemical deposition of Cu2O thin films
|
Ristov, M.
|
|
1985
|
123 |
1 |
p. 63-67
5 p.
|
artikel
|
| 2 |
Cinétique de cristallisation de couches minces de sélénium amorphe: influence du traitement du substrat
|
Hamou, A.
|
|
1985
|
123 |
1 |
p. 87-92
6 p.
|
artikel
|
| 3 |
Contrast enhancement of thin film A.C. electroluminescent displays by using a contiguous dark dielectric
|
Panicker, M.P.R.
|
|
1985
|
123 |
1 |
p. 19-25
7 p.
|
artikel
|
| 4 |
Degradations in the electrical and structural characteristics of Schottky diodes and ohmic contacts to GaAs due to thermal aging
|
Kulkarni, A.K.
|
|
1985
|
123 |
1 |
p. 1-8
8 p.
|
artikel
|
| 5 |
Editorial Board
|
|
|
1985
|
123 |
1 |
p. iii-
1 p.
|
artikel
|
| 6 |
Langmuir-Blodgett multilayers of polypeptides
|
Winter, C.S.
|
|
1985
|
123 |
1 |
p. L1-L3
nvt p.
|
artikel
|
| 7 |
Microstructure and growth kinetics of CrSi2 on Si{100} studied using cross-sectional transmission electron microscopy
|
Natan, Menachem
|
|
1985
|
123 |
1 |
p. 69-85
17 p.
|
artikel
|
| 8 |
Optical scattering and absorption losses at interfaces and in thin films
|
Bennett, J.M.
|
|
1985
|
123 |
1 |
p. 27-44
18 p.
|
artikel
|
| 9 |
Properties of evaporated Ni-Cr films with an aluminum content of about 50%
|
Schippel, E.
|
|
1985
|
123 |
1 |
p. 57-62
6 p.
|
artikel
|
| 10 |
The oxidation of tantalum-based thin films
|
Kolonits, V.P.
|
|
1985
|
123 |
1 |
p. 45-55
11 p.
|
artikel
|
| 11 |
Transmission interference spectrometric determination of the thickness and refractive index of barrier films formed anodically on aluminum
|
Pastore, G.F.
|
|
1985
|
123 |
1 |
p. 9-17
9 p.
|
artikel
|
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