| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A model for the thermal conductivity of plasma-sprayed ceramic coatings
|
McPherson, R.
|
|
1984
|
112 |
1 |
p. 89-95
7 p.
|
artikel
|
| 2 |
An optical study of thermal effects in copper films
|
Vijayakumar, K.P.
|
|
1984
|
112 |
1 |
p. 71-74
4 p.
|
artikel
|
| 3 |
A secondary ion mass spectrometry study of two-layer systems based on tellurium
|
Labunov, V.
|
|
1984
|
112 |
1 |
p. 81-88
8 p.
|
artikel
|
| 4 |
CdS thin film transistor with Pr6O11 as the gate oxide
|
Deka, P.K.
|
|
1984
|
112 |
1 |
p. L5-L8
nvt p.
|
artikel
|
| 5 |
Editorial Board
|
|
|
1984
|
112 |
1 |
p. iii-
1 p.
|
artikel
|
| 6 |
Electrical measurements on ice thin films near the cubic → hexagonal phase transformation
|
Chrzanowski, Janusz
|
|
1984
|
112 |
1 |
p. 17-28
12 p.
|
artikel
|
| 7 |
Electroless thin film Ni-P resistors with low temperature coefficients
|
Fernández, M.
|
|
1984
|
112 |
1 |
p. L9-L12
nvt p.
|
artikel
|
| 8 |
Ion beam nitriding of high purity iron surfaces
|
Ebersbach, U.
|
|
1984
|
112 |
1 |
p. 29-40
12 p.
|
artikel
|
| 9 |
Refractive index of thin films of ZnSe in the IR
|
Ahmed, S.
|
|
1984
|
112 |
1 |
p. L1-L4
nvt p.
|
artikel
|
| 10 |
Seebeck and piezoresistance effects in amorphous-microcrystalline mixed-phase silicon films and applications to power sensors and strain gauges
|
Nishida, S.
|
|
1984
|
112 |
1 |
p. 7-16
10 p.
|
artikel
|
| 11 |
Stress relief forms of diamond-like carbon thin films under internal compressive stress
|
Nir, D.
|
|
1984
|
112 |
1 |
p. 41-50
10 p.
|
artikel
|
| 12 |
Structural transformations in thin amorphous semiconductor films induced by electrical nanosecond switching
|
Balevičius, S.
|
|
1984
|
112 |
1 |
p. 75-80
6 p.
|
artikel
|
| 13 |
Strukturveränderungen dünner glimmpolymerisierter fluorkohlenstoffschichten beim altern und tempern
|
Friedrich, Marion
|
|
1984
|
112 |
1 |
p. 61-70
10 p.
|
artikel
|
| 14 |
The influence of deposition parameters on the properties of amorphous silicon thin films produced by the magnetron sputtering method
|
Batabyal, A.K.
|
|
1984
|
112 |
1 |
p. 51-60
10 p.
|
artikel
|
| 15 |
Thin film Al/Al2O3/Te metal/insulator/semiconductor capacitors
|
Szaro, L.
|
|
1984
|
112 |
1 |
p. 1-5
5 p.
|
artikel
|
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