| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Application of nondestructive testing methods to electronic industry using computer-aided optical metrology
|
Jin, Guanchang
|
|
1996
|
25 |
2-3 |
p. 81-91
11 p.
|
artikel
|
| 2 |
Automatic analysis technique of spatial carrier-fringe patterns
|
Chen, Wenyi
|
|
1996
|
25 |
2-3 |
p. 111-120
10 p.
|
artikel
|
| 3 |
Experimental investigation of micromechanical behavior of advanced materials by moiré interferometry
|
Qing, Xinlin
|
|
1996
|
25 |
2-3 |
p. 179-189
11 p.
|
artikel
|
| 4 |
Holographic assessment of surface crack depths in rectangular bars
|
Qin, S.
|
|
1996
|
25 |
2-3 |
p. 145-161
17 p.
|
artikel
|
| 5 |
Infrared thermography and its application in the NDT of sandwich structures
|
Qin, Y.-W.
|
|
1996
|
25 |
2-3 |
p. 205-211
7 p.
|
artikel
|
| 6 |
Nondestructive image detection of surface and sub-surface defects of solid materials by OBD
|
Shi, Baixuan
|
|
1996
|
25 |
2-3 |
p. 121-131
11 p.
|
artikel
|
| 7 |
Nondestructive testing by ESPI and quasi phase shift gradient technique
|
Pang, Linyong
|
|
1996
|
25 |
2-3 |
p. 93-101
9 p.
|
artikel
|
| 8 |
Optical nondestructive examination of glass-fibre reinforced plastic honeycomb structures
|
Zhu, Jiantang
|
|
1996
|
25 |
2-3 |
p. 133-143
11 p.
|
artikel
|
| 9 |
Singlemode optical fiber electronic speckle pattern interferometry
|
Liu, W.
|
|
1996
|
25 |
2-3 |
p. 103-109
7 p.
|
artikel
|
| 10 |
Some new optical measurement techniques for the study of crystal growth and electrode processes
|
Yu, Xiling
|
|
1996
|
25 |
2-3 |
p. 191-204
14 p.
|
artikel
|
| 11 |
Special issue on optical NDE methods in the People's Republic of China (PRC)
|
Y.S. Tan, Professor
|
|
1996
|
25 |
2-3 |
p. 79-80
2 p.
|
artikel
|
| 12 |
Talbot and fourier moiré deflectometry and its applications in engineering evaluation
|
Yu, Wanming
|
|
1996
|
25 |
2-3 |
p. 163-177
15 p.
|
artikel
|
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