| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A high-level VLSI design for ultra-dense instruction set computer architectures
|
Schoepke, Olaf S.
|
|
|
24 |
5 |
p. 497-503
|
artikel
|
| 2 |
Analogue-digital ASICs: Circuit techniques, design tools and applications
|
Hurst, S.L.
|
|
|
24 |
5 |
p. 592
|
artikel
|
| 3 |
Analysis of microelectronic materials and devices
|
Gorham, D.A.
|
|
|
24 |
5 |
p. 594
|
artikel
|
| 4 |
An empirical timing characterization method and its application to CMOS logic circuits
|
Shum, Roger S.
|
|
|
24 |
5 |
p. 477-484
|
artikel
|
| 5 |
An introduction to power electronics
|
Robinson, F.V.P.
|
|
|
24 |
5 |
p. 586-587
|
artikel
|
| 6 |
A wide-range tunable BiCMOS transconductor
|
Shoval, Ayal
|
|
|
24 |
5 |
p. 555-564
|
artikel
|
| 7 |
Canadian microelectronics
|
Hurst, Stanley L.
|
|
|
24 |
5 |
p. 461
|
artikel
|
| 8 |
CMOS photodetector with built-in light adaptation mechanism
|
Ward, Vivian
|
|
|
24 |
5 |
p. 547-553
|
artikel
|
| 9 |
Delay and current estimation in CMOS gates using collapsing
|
Nabavi-Lishi, A.
|
|
|
24 |
5 |
p. 485-495
|
artikel
|
| 10 |
Design automation for timing-driven layout synthesis
|
Hurst, S.L.
|
|
|
24 |
5 |
p. 587
|
artikel
|
| 11 |
Design of logic systems
|
Bennetts, R.G.
|
|
|
24 |
5 |
p. 586
|
artikel
|
| 12 |
Economics of design and test for electronic circuits and systems
|
Hurst, S.L.
|
|
|
24 |
5 |
p. 593-594
|
artikel
|
| 13 |
Electronic design: Circuits and systems
|
Harris, M.S.
|
|
|
24 |
5 |
p. 590-591
|
artikel
|
| 14 |
Fine pitch surface mount technology —quality, design and manufacturing techniques
|
Griffiths, G.W.
|
|
|
24 |
5 |
p. 585
|
artikel
|
| 15 |
Global optimization of multipleiers and buses in interconnect synthesis
|
Wilson, T.C.
|
|
|
24 |
5 |
p. 513-532
|
artikel
|
| 16 |
Introduction to semiconductor device yield modeling
|
Hurst, S.L.
|
|
|
24 |
5 |
p. 589
|
artikel
|
| 17 |
Microelectronic reliability, volume II: Integrity assessment and assurance
|
Haskard, M.R.
|
|
|
24 |
5 |
p. 588-589
|
artikel
|
| 18 |
Organizational learning across critical linkages: The case of captive ASIC design and man manufacturing
|
Callahan, John
|
|
|
24 |
5 |
p. 463-476
|
artikel
|
| 19 |
Performance analysis and design of optimized static random access memory (SRAM)
|
Dewan, Jahangir
|
|
|
24 |
5 |
p. 505-512
|
artikel
|
| 20 |
Physical design automation of VLSI systems
|
Bell, I.M.
|
|
|
24 |
5 |
p. 592-593
|
artikel
|
| 21 |
Rapid reliability assessment of VLSICs
|
Taylor, D.
|
|
|
24 |
5 |
p. 589
|
artikel
|
| 22 |
Reliability of gallium arsenide MMICs
|
Hurst, S.L.
|
|
|
24 |
5 |
p. 587-588
|
artikel
|
| 23 |
Semiconductor memories: a handbook of design, manufacture and application
|
Gorham, D.A.
|
|
|
24 |
5 |
p. 585
|
artikel
|
| 24 |
The art of electronics
|
Hurst, S.L.
|
|
|
24 |
5 |
p. 591
|
artikel
|
| 25 |
The board designer's guide to testable logic circuits
|
Hurst, S.L.
|
|
|
24 |
5 |
p. 590
|
artikel
|
| 26 |
The Canadian microelectronics corporation, Queen's University, Kingston, Ontario, Canada, K7L 3N6
|
|
|
|
24 |
5 |
p. 577-579
|
artikel
|
| 27 |
The microelectronics and computer systems laboratory, McGill University, 3480 University Street, Montreal, Quebec, Canada H3A 2A7
|
|
|
|
24 |
5 |
p. 580-584
|
artikel
|
| 28 |
The partitioning of linear registers for testing applications
|
Kontopidi, E.
|
|
|
24 |
5 |
p. 533-546
|
artikel
|
| 29 |
Update
|
|
|
|
24 |
5 |
p. 584
|
artikel
|
| 30 |
VLSI design of an M-path decoder IC suitable for bidirectional decoding of convolutional codes
|
Chalifoux, M.
|
|
|
24 |
5 |
p. 565-576
|
artikel
|
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