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                             18 results found
no title author magazine year volume issue page(s) type
1 A study of ESD- induced defects in high-voltage nMOS and pMOS transistors Pavan, Paolo

23 1 p. 45-50
article
2 Comparative study of submicron BiCMOS technologies Gal, Laszlo

23 1 p. 59-74
article
3 Designer's guide to testable ASIC devices Mack, R.J.

23 1 p. 82
article
4 Editorial Ernest-Jones, Terry

23 1 p. 1
article
5 Editorial Board
23 1 p. ii
article
6 FPGAs Hurst, S.L.

23 1 p. 79
article
7 Gallium arsenide cries wolf Szweda, Roy

23 1 p. 5-7
article
8 Japanese news round-up
23 1 p. 2-4
article
9 Mathematical models in electrical circuits: Theory and applications Shepherd, P.R.

23 1 p. 80-81
article
10 MINNIE and HSPICE for analogue circuit simulation, Hurst, S.L.

23 1 p. 79-80
article
11 Noise immunity characteristics of CMOS receivers and effects of skewing/damping CMOS output driver switching waveform on the ‘simultaneous’ switching noise Senthinathan, R.

23 1 p. 29-36
article
12 Patent survey on semiconductors Terpstra, Marten

23 1 p. 11-15
article
13 Polycrystalline silicon thin-film resistors with irreversible resistance transition Petković, D.M.

23 1 p. 51-58
article
14 Programmable quasi-passive algorithmic digital- analogue converter Vital, J.C.

23 1 p. 17-27
article
15 Testing and diagnosis of analog circuits and systems Evans, P.S.A.

23 1 p. 81-82
article
16 The design of second-order bit sliced infinite impulse response digital filter chips using CIRCAD II Othman, Masuri

23 1 p. 37-44
article
17 The impact of the interconnect delays on a high performance ASIC array Wild, Andreas

23 1 p. 75-78
article
18 USA report: Vitesse semiconductor MacDonald, Jo Ann

23 1 p. 8-10
article
                             18 results found
 
 Koninklijke Bibliotheek - National Library of the Netherlands