Digital Library
Close Browse articles from a journal
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
                                       All articles of the corresponding issues
 
                             11 results found
no title author magazine year volume issue page(s) type
1 A review of RAM testing methodologies Corsi, A.

14 2 p. 55-71
article
2 Assessments of micropackaged integrated circuits in high reliability applications Sinnadurai, N.

14 2 p. 5-25
article
3 DIANA.SC — a versatile top-down analysis tool for switched-capacitor circuits Claesen, L.

14 2 p. 37-53
article
4 Editorial Butcher, John

14 2 p. 3
article
5 I2L speed improvement by an ion implantation modification to a standard bipolar process Pieters, J.P.

14 2 p. 27-35
article
6 New equal-valued grounded-RC realisation of third-order lowpass Butterworth characteristic using DVCCS Nandi, R.

14 2 p. 75-76
article
7 New insensitive active ideal inductance with single resistor control using current conveyors Nandi, R.

14 2 p. 73-74
article
8 Notes for contributors
14 2 p. iii
article
9 [No title] Brazier, T.

14 2 p. 77
article
10 [No title] Krejcik, Milos

14 2 p. 77
article
11 World abstracts
14 2 p. 79-80
article
                             11 results found
 
 Koninklijke Bibliotheek - National Library of the Netherlands