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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
11 results found
no
title
author
magazine
year
volume
issue
page(s)
type
1
A review of RAM testing methodologies
Corsi, A.
14
2
p. 55-71
article
2
Assessments of micropackaged integrated circuits in high reliability applications
Sinnadurai, N.
14
2
p. 5-25
article
3
DIANA.SC — a versatile top-down analysis tool for switched-capacitor circuits
Claesen, L.
14
2
p. 37-53
article
4
Editorial
Butcher, John
14
2
p. 3
article
5
I2L speed improvement by an ion implantation modification to a standard bipolar process
Pieters, J.P.
14
2
p. 27-35
article
6
New equal-valued grounded-RC realisation of third-order lowpass Butterworth characteristic using DVCCS
Nandi, R.
14
2
p. 75-76
article
7
New insensitive active ideal inductance with single resistor control using current conveyors
Nandi, R.
14
2
p. 73-74
article
8
Notes for contributors
14
2
p. iii
article
9
[No title]
Brazier, T.
14
2
p. 77
article
10
[No title]
Krejcik, Milos
14
2
p. 77
article
11
World abstracts
14
2
p. 79-80
article
11 results found
Koninklijke Bibliotheek -
National Library of the Netherlands