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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
9 results found
| no | title | author | magazine | year | volume | issue | page(s) | type |
| 1 | Applications of the scanning electron microscope EBIC mode to semiconductor device evaluation and failure analysis |
Sørensen, R.H. |
|
11 | 1 |
p. 19-25 |
article |
|
| 2 | Book review |
Matthews, R.B. |
|
11 | 1 |
p. 44 |
article |
|
| 3 | Book review |
Matthews, R.B. |
|
11 | 1 |
p. 44 |
article |
|
| 4 | Book review |
Brown, K. |
|
11 | 1 |
p. 44 |
article |
|
| 5 | Editorial |
Butcher, John B. |
|
11 | 1 |
p. 3 |
article |
|
| 6 | Microcrack detection in silicon crystals with an ultrasonic sonoprobe |
Guidici, D.C. |
|
11 | 1 |
p. 37-40 |
article |
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| 7 | Some problems and possible solutions for hybrid microcircuit reliability |
Sinnadurai, F.N. |
|
11 | 1 |
p. 26-36 |
article |
|
| 8 | The new microelectronic processing technology: a review of the state-of-the-art |
Maddox, R.L. |
|
11 | 1 |
p. 4-18 |
article |
|
| 9 | World abstracts |
|
11 | 1 |
p. 41-43 |
article |
9 results found