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                             66 results found
no title author magazine year volume issue page(s) type
1 A comprehensive analytical study of an undoped symmetrical double-gate MOSFET after considering quantum confinement parameter Wen, Tiw Pei
2010
2-3 p. 162-170
9 p.
article
2 Advanced materials welcomed at IEDM McDonald, Jo Ann
1995
2-3 p. xv-xviii
nvt p.
article
3 Alcohol sensors based on SWNT as chemical sensors: Monte Carlo and Langevin dynamics simulation Mahdavian, L.
2010
2-3 p. 142-149
8 p.
article
4 Algebraic microscopic approach to drift-diffusion Orlowski, Marius
1995
2-3 p. 243-248
6 p.
article
5 A low-power 2.45GHz WPAN modulator/demodulator Wang, Chua-Chin
2010
2-3 p. 150-154
5 p.
article
6 An analytical approach to dynamic crosstalk in coupled interconnects Kaushik, Brajesh Kumar
2010
2-3 p. 85-92
8 p.
article
7 A novel spread-spectrum clock generator for suppressing conducted EMI in switching power supply Guo, Haiyan
2010
2-3 p. 93-98
6 p.
article
8 Application of genetic algorithm in computing the tradeoffs between power consumption versus delay in digital integrated circuit design Sosa, J.
2010
2-3 p. 135-141
7 p.
article
9 A step-up transformer impedance transformation technique for efficient power harvesting of passive transponders Soltani, Nima
2010
2-3 p. 75-84
10 p.
article
10 Atomistic evaluation of diffusion theories for the diffusion of dopants in vacancy gradients List, S.
1995
2-3 p. 261-264
4 p.
article
11 BMFET versus BJT in reverse bias safe operations Busatto, G.
1996
2-3 p. 243-250
8 p.
article
12 CAESAR: The virtual IC factory as an integrated TCAD user environment Axelrad, V.
1995
2-3 p. 191-202
12 p.
article
13 Calculation of the blocking capability of SOI power devices under the influence of interconnections Falck, Elmar
1996
2-3 p. 201-207
7 p.
article
14 Consistent treatment of carrier emission and capture kinetics in electrothermal and energy transport models Wachutka, Gerhard
1995
2-3 p. 307-315
9 p.
article
15 Defect detection of IC wafer based on two-dimension wavelet transform Liu, Hongxia
2010
2-3 p. 171-177
7 p.
article
16 Device modelling for the 1990s Kosina, H.
1995
2-3 p. 217-233
17 p.
article
17 Didactical concepts and tools for explaining power electronics applications Kern, Ansgar
1996
2-3 p. 139-147
9 p.
article
18 Editorial board 2010
2-3 p. IFC-
1 p.
article
19 Educational issues for power semiconductor devices Spirito, Paolo
1996
2-3 p. 109-120
12 p.
article
20 Educational software for power VDMOS transistors Prijić, Z.
1996
2-3 p. 131-138
8 p.
article
21 Electro-elastic simulation of a piezoresistive pressure sensor Ciampolini, P.
1995
2-3 p. 265-272
8 p.
article
22 Experimental and numerical analysis of GTO's snubberless turn-off operations Khatir, Z.
1996
2-3 p. 231-241
11 p.
article
23 First international workshop on growth, characterization and exploitation of epitaxial III–V compound semiconductors on novel index surfaces, Trento (Italy), 4–7 December 1994 Henini, M.
1995
2-3 p. xix-xxiii
nvt p.
article
24 Guest editorial Stojadinović, Ninoslav D.
1995
2-3 p. 77-78
2 p.
article
25 High speed semiconductor devices: Circuit aspects and fundamental behaviour Henini, M.
1995
2-3 p. xxviii-
1 p.
article
26 High-speed VLSI interconnections: Modeling analysis and simulation Harris, M.S.
1995
2-3 p. xxx-
1 p.
article
27 High voltage wiring using biased polysilicon field plates Murray, A.F.J.
1996
2-3 p. 209-215
7 p.
article
28 InP HBTs: Growth, processing and applications Henini, M.
1995
2-3 p. xxviii-xxix
nvt p.
article
29 Introduction to neural networks Hurst, S.L.
1995
2-3 p. xxx-
1 p.
article
30 Lifetime calculations of MOSFETs using depth-dependent non-local impact ionization van Dort, M.J.
1995
2-3 p. 301-305
5 p.
article
31 List of reviewer 1996
2-3 p. 251-
1 p.
article
32 Mechanical stress simulation during gate formation of MOS devices considering crystallization-induced stress of phosphorus-doped silicon thin films Miura, Hideo
1995
2-3 p. 249-253
5 p.
article
33 Modelling and improving the on-resistance of LDMOS RESURF devices Charitat, G.
1996
2-3 p. 181-190
10 p.
article
34 Modelling high concentration boron diffusion with dynamic clustering: influence of the initial conditions Baccus, Bruno
1995
2-3 p. 235-242
8 p.
article
35 MOSFET models for VLSI circuit simulation Arora, N.
1995
2-3 p. xxvi-xxvii
nvt p.
article
36 Multigrid methods for process simulation Joppich, W.
1995
2-3 p. xxvii-xxviii
nvt p.
article
37 New lossless inductance simulators realization using a minimum active and passive components Kaçar, Fırat
2010
2-3 p. 109-113
5 p.
article
38 News and updates in device application, process, and materials, being applied in today's microelectronics industry 1996
2-3 p. i-xxiv
nvt p.
article
39 News update 1995
2-3 p. i-vii
nvt p.
article
40 NTT develops prototype nanostructure silicon single-electron transistor operating near room temperature 1995
2-3 p. viii-x
nvt p.
article
41 Numerical simulation of the insulated base MOS-controlled thyristor Flores, D.
1996
2-3 p. 177-180
4 p.
article
42 Optimal placement of heat generating components at various levels of electronics packaging Suwa, Tohru
2010
2-3 p. 129-134
6 p.
article
43 Physical modelling of the enhanced diffusion of boron due to ion implantation in thin-base npn bipolar transistors Mouis, M.
1995
2-3 p. 255-259
5 p.
article
44 Power semiconductor devices — continuous development Grant, Duncan
1996
2-3 p. 161-176
16 p.
article
45 Power semiconductor devices — continuous development Stojadinović, N.
1996
2-3 p. 105-107
3 p.
article
46 Process design and optimization of the channel doping profile in power VDMOSFETs Pantić, D.
1996
2-3 p. 191-200
10 p.
article
47 Process simulation for the 1990s Stippel, H.
1995
2-3 p. 203-215
13 p.
article
48 Process variation-aware performance analysis of asynchronous circuits Raji, Mohsen
2010
2-3 p. 99-108
10 p.
article
49 Properties of Group III nitrides Henini, M.
1995
2-3 p. xxix-xxx
nvt p.
article
50 Resistorless realization of current-mode first-order allpass filter using current differencing transconductance amplifiers Tangsrirat, Worapong
2010
2-3 p. 178-183
6 p.
article
51 SEMDEM — educational software for bipolar semiconductor devices Turowski, Marek
1996
2-3 p. 121-129
9 p.
article
52 Simplified model for ballistic current–voltage characteristic in cylindrical nanowires Kurniawan, Oka
2010
2-3 p. 155-161
7 p.
article
53 Simulation of power semiconductor systems as an educational tool Žáček, Jaroslav
1996
2-3 p. 149-159
11 p.
article
54 Simulation of transient thermal effects during GTO turn off Mawby, P.A.
1996
2-3 p. 217-229
13 p.
article
55 Spurious signals due to amplitude quantization in direct digital frequency synthesizers Tian, Xinguang
2010
2-3 p. 114-120
7 p.
article
56 Technology CAD at AT&T Lloyd, Peter
1995
2-3 p. 79-97
19 p.
article
57 Technology CAD at OKI Ueda, J.
1995
2-3 p. 159-175
17 p.
article
58 Technology CAD at Stanford University: physics, algorithms, software and applications Dutton, Robert W.
1995
2-3 p. 99-111
13 p.
article
59 The design and optimization methodology of a low-distortion sub- μ W sample-and-hold stage for weak bio-currents Yuan, Jie
2010
2-3 p. 121-128
8 p.
article
60 The 1994 international conference on electronic materials (ICEM 94) Tu, Charles W.
1995
2-3 p. xi-xiii
nvt p.
article
61 The MASTER Framework Hopper, Peter J.
1995
2-3 p. 177-190
14 p.
article
62 The stationary semiconductor device equations Markowich, P.A.
1995
2-3 p. xxv-xxvi
nvt p.
article
63 The STORM technology CAD system Lorenz, J.
1995
2-3 p. 113-135
23 p.
article
64 The Viennese integrated system for technology CAD applications Halama, S.
1995
2-3 p. 137-158
22 p.
article
65 Three-dimensional implementation of a unified transport model Pierantoni, A.
1995
2-3 p. 287-300
14 p.
article
66 Two-dimensional numerical simulations of high-efficiency silicon solar cells Heiser, G.
1995
2-3 p. 273-286
14 p.
article
                             66 results found
 
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