nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Characterisation of molecular beam epitaxy-grown InGaAs multilayer structures using photoluminescence
|
Srinivasan, T. |
|
2001 |
60 |
4 |
p. 425-429 5 p. |
artikel |
2 |
DC magnetization studies in Nb/Fe superconducting multilayers
|
Chaudhari, S.M. |
|
2001 |
60 |
4 |
p. 407-410 4 p. |
artikel |
3 |
Effect of interface structure correlation on magnetoresistance of Fe/Cr multilayers
|
Paul, Amitesh |
|
2001 |
60 |
4 |
p. 401-405 5 p. |
artikel |
4 |
Microstructural study of iron nitride thin films deposited by ion beam sputtering
|
Gupta, Mukul |
|
2001 |
60 |
4 |
p. 395-399 5 p. |
artikel |
5 |
Multilayer growth facilities and studies at IUC-DAEF: a review
|
Dasannacharya, B.A. |
|
2001 |
60 |
4 |
p. 377-383 7 p. |
artikel |
6 |
Multilayer inverse synthesis techniques for the analysis of mixed-mode inhomogeneities in composite and co-deposited dielectric coatings
|
Sahoo, N.K. |
|
2001 |
60 |
4 |
p. 411-417 7 p. |
artikel |
7 |
Ni50Nb50/C amorphous multilayers for “water window” soft X-rays – structure and stability
|
Vitta, Satish |
|
2001 |
60 |
4 |
p. 389-394 6 p. |
artikel |
8 |
Preface
|
Avasthi, Dr.D.K. |
|
2001 |
60 |
4 |
p. vii- 1 p. |
artikel |
9 |
Preparation of layered semiconductor (MoSe2) by electrosynthesis
|
Joseph Sahaya Anand, T. |
|
2001 |
60 |
4 |
p. 431-435 5 p. |
artikel |
10 |
Spectroscopic ellipsometry of multilayer dielectric coatings
|
Bhattacharyya, D. |
|
2001 |
60 |
4 |
p. 419-424 6 p. |
artikel |
11 |
Study of thin film multilayers using X-ray reflectivity and scanning probe microscopy
|
Banerjee, S. |
|
2001 |
60 |
4 |
p. 371-376 6 p. |
artikel |
12 |
Volume 60 Author Index
|
|
|
2001 |
60 |
4 |
p. VII-VIII nvt p. |
artikel |
13 |
Volume 60 Contents
|
|
|
2001 |
60 |
4 |
p. III-VI nvt p. |
artikel |
14 |
X-ray multilayer optics: growth and characterization
|
Lodha, G.S. |
|
2001 |
60 |
4 |
p. 385-388 4 p. |
artikel |