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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
7 results found
| no | title | author | magazine | year | volume | issue | page(s) | type |
| 1 | A review of analysis methods for sub-micron indentation testing |
Fischer-Cripps, A.C |
2000 |
58 | 4 |
p. 569-585 17 p. |
article |
|
| 2 | Auger electron spectroscopy study of SiC thin films deposited on silicon |
Lei, Y.M |
2000 |
58 | 4 |
p. 602-608 7 p. |
article |
|
| 3 | Characterisation of a saddle field fast atom beam source and its application to the growth of diamond-like carbon films |
Sarangi, D |
2000 |
58 | 4 |
p. 609-627 19 p. |
article |
|
| 4 | CuInSe2 thin films obtained by a novel electrodeposition and sputtering combined method |
Guillén, C |
2000 |
58 | 4 |
p. 594-601 8 p. |
article |
|
| 5 | Index |
2000 |
58 | 4 |
p. xiii-xiv nvt p. |
article |
||
| 6 | Semiconducting Silicides |
Steckelmacher, W |
2000 |
58 | 4 |
p. 628-629 2 p. |
article |
|
| 7 | The effect of temperature on electrochemical behavior for Cu–Al–O coatings prepared by CVD |
Yizhong, Huang |
2000 |
58 | 4 |
p. 586-593 8 p. |
article |
7 results found