| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Book review
|
|
|
2000
|
57 |
1 |
p. 105-
1 p.
|
artikel
|
| 2 |
Chemical analysis of the plasma-polymerized diphenyl thin films
|
Chowdhury, F.-U.-Z
|
|
2000
|
57 |
1 |
p. 43-50
8 p.
|
artikel
|
| 3 |
Erratum
|
|
|
2000
|
57 |
1 |
p. 107-
1 p.
|
artikel
|
| 4 |
Flicker noise of the channel electron multiplier
|
Grzeszczak, A
|
|
2000
|
57 |
1 |
p. 99-104
6 p.
|
artikel
|
| 5 |
Homologous micro-clusters of carbon disulphide
|
Michalak, Leszek
|
|
2000
|
57 |
1 |
p. 61-70
10 p.
|
artikel
|
| 6 |
Investigations on the effect of alpha particle irradiation-induced defects near Pd/n-GaAs interface
|
Jayavel, P
|
|
2000
|
57 |
1 |
p. 51-59
9 p.
|
artikel
|
| 7 |
LEED study of Ni (100) and (111) surface damage caused by Ar+ ion bombardment with low energy and small doses
|
Vasylyev, M.A
|
|
2000
|
57 |
1 |
p. 71-80
10 p.
|
artikel
|
| 8 |
Phosphorus concentration profile in silicon produced by means of the nuclear reaction 30 Si(p,γ)31 P
|
Garcia-Molina, Rafael
|
|
2000
|
57 |
1 |
p. 81-85
5 p.
|
artikel
|
| 9 |
Structural and electrical properties of HgTe thin films
|
Seyam, M.A.M
|
|
2000
|
57 |
1 |
p. 31-41
11 p.
|
artikel
|
| 10 |
The influence of the incidence energy of deposited particles on the growth morphology of thin films
|
Wei, Helin
|
|
2000
|
57 |
1 |
p. 87-97
11 p.
|
artikel
|
| 11 |
Thermal stability of nitride thin films
|
Hultman, L
|
|
2000
|
57 |
1 |
p. 1-30
30 p.
|
artikel
|
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