| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Angular dependences of surface composition, sputtering and ripple formation on silicon under N2 + ion bombardment
|
Bachurin, V.I
|
|
2000
|
56 |
4 |
p. 241-245
5 p.
|
artikel
|
| 2 |
Calculation of electronic temperature dynamics in a collision cascade in a solid
|
Usman, E.Yu
|
|
2000
|
56 |
4 |
p. 293-297
5 p.
|
artikel
|
| 3 |
Electronic excitations in solids during impact of atomic particles
|
Šroubek, Zdeněk
|
|
2000
|
56 |
4 |
p. 263-267
5 p.
|
artikel
|
| 4 |
Features of sputtering of nitrides with various component mass ratios
|
Promokhov, A.A
|
|
2000
|
56 |
4 |
p. 247-252
6 p.
|
artikel
|
| 5 |
Formation of 3D islands of metal oxides on silicon covered by native oxide film by multi-step ion sputtering of Ti, Nb and V
|
Sushkova, N.M
|
|
2000
|
56 |
4 |
p. 287-291
5 p.
|
artikel
|
| 6 |
High non-additive sputtering of silicon as large positive cluster ions under polyatomic ion bombardment
|
Belykh, S.F
|
|
2000
|
56 |
4 |
p. 257-262
6 p.
|
artikel
|
| 7 |
Index
|
|
|
2000
|
56 |
4 |
p. IX-
1 p.
|
artikel
|
| 8 |
International Conference on Ion–Surface Interaction
|
Yurasova, V.E.
|
|
2000
|
56 |
4 |
p. 227-231
5 p.
|
artikel
|
| 9 |
On the possibility of the in situ growth control and nondestructive depth profiling of ultrathin multilayer structures using keV hydrogen ions
|
Kurnaev, V.A
|
|
2000
|
56 |
4 |
p. 253-255
3 p.
|
artikel
|
| 10 |
Point defects at low-index surfaces of fcc metals and the anomalous behaviour of surface atoms at elevated temperatures
|
Devyatko, Yu.N.
|
|
2000
|
56 |
4 |
p. 279-285
7 p.
|
artikel
|
| 11 |
Resonant electron transfer in the emission of ion-beam sputtered metal atoms studied by double resonance laser ionization
|
Philipsen, V.
|
|
2000
|
56 |
4 |
p. 269-274
6 p.
|
artikel
|
| 12 |
Sorption of athermal hydrogen atoms
|
Pisarev, A.A.
|
|
2000
|
56 |
4 |
p. 275-278
4 p.
|
artikel
|
| 13 |
Studies on energy distributions of species ejected from solid surfaces by means of multiphoton resonance ionization spectroscopy
|
Morita, Kenji
|
|
2000
|
56 |
4 |
p. 233-240
8 p.
|
artikel
|
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