| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Accurate prediction of internal leaks in stationary dry Roots vacuum pumps
|
Valdès, Laurent-Charles
|
|
1999
|
52 |
4 |
p. 451-459
9 p.
|
artikel
|
| 2 |
A theoretical investigation of the correlation between the arbitrarily defined optical gap energy and the chemical bond in Te46-x As32+x Ge10Si12 system
|
Fouad, S.S.
|
|
1999
|
52 |
4 |
p. 505-508
4 p.
|
artikel
|
| 3 |
Book review
|
|
|
1999
|
52 |
4 |
p. 516-
1 p.
|
artikel
|
| 4 |
Book review
|
|
|
1999
|
52 |
4 |
p. 515-
1 p.
|
artikel
|
| 5 |
Book review
|
|
|
1999
|
52 |
4 |
p. 516-
1 p.
|
artikel
|
| 6 |
Carbon nitride films synthesized by electron beam evaporation of carbon and nitrogen ion bombardment
|
Petrov, P.
|
|
1999
|
52 |
4 |
p. 501-504
4 p.
|
artikel
|
| 7 |
Characterisation of r.f. sputtered Fe–Cr-oxide films
|
Stenberg, T.
|
|
1999
|
52 |
4 |
p. 477-483
7 p.
|
artikel
|
| 8 |
Characterization of an unbalanced magnetron for composite film (metal/C:H) deposition
|
Biederman, H.
|
|
1999
|
52 |
4 |
p. 415-420
6 p.
|
artikel
|
| 9 |
Characterization of (Cr,Ta)N hard coatings reactively sputtered at low temperature
|
Čekada, M.
|
|
1999
|
52 |
4 |
p. 461-467
7 p.
|
artikel
|
| 10 |
Computer simulation of transition from h-BN TO c-BN during ion beam assisted deposition
|
Kharlamov, V.S.
|
|
1999
|
52 |
4 |
p. 407-410
4 p.
|
artikel
|
| 11 |
Directional detection of secondary electrons for electron beam profilography
|
Slówko, W.
|
|
1999
|
52 |
4 |
p. 441-449
9 p.
|
artikel
|
| 12 |
Effects of HF attack on the surface and interface microchemistry of W tips for use in the STM microscope: a scanning Auger microscopy (SAM) study
|
Paparazzo, E.
|
|
1999
|
52 |
4 |
p. 421-426
6 p.
|
artikel
|
| 13 |
Electrical properties of SnSe2 thin films
|
Abdel Hady, D.
|
|
1999
|
52 |
4 |
p. 375-381
7 p.
|
artikel
|
| 14 |
Electron transport process in discontinuous silver film
|
Mandal, S.K.
|
|
1999
|
52 |
4 |
p. 485-490
6 p.
|
artikel
|
| 15 |
GENAP—the code for a pressure distribution calculation
|
El-Shazly, M.N.
|
|
1999
|
52 |
4 |
p. 401-405
5 p.
|
artikel
|
| 16 |
Harmonic characterisation of a plasma-tool using a diplexer
|
Batty, I.
|
|
1999
|
52 |
4 |
p. 509-514
6 p.
|
artikel
|
| 17 |
Ion energy distribution in an ECR plasma chamber
|
Junfang, Chen
|
|
1999
|
52 |
4 |
p. 411-414
4 p.
|
artikel
|
| 18 |
Monte Carlo simulation of thin-film growth on a surface with a triangular lattice
|
Helin, Wei
|
|
1999
|
52 |
4 |
p. 435-440
6 p.
|
artikel
|
| 19 |
Plasma enhanced CVD silicon oxide films for integrated optic applications
|
Domı́nguez, Carlos
|
|
1999
|
52 |
4 |
p. 395-400
6 p.
|
artikel
|
| 20 |
Resist debris formation in electron beam lithography
|
Deshmukh, P.R.
|
|
1999
|
52 |
4 |
p. 469-476
8 p.
|
artikel
|
| 21 |
The effect of illumination with intense light on the conduction current of metal/n-silicon diodes
|
Hamdi, W.I.
|
|
1999
|
52 |
4 |
p. 387-393
7 p.
|
artikel
|
| 22 |
Three-dimensional Monte Carlo simulation of sputtered atom transport in the process of ion-plasma sputter deposition of multicomponent thin films
|
Petrov, P.K.
|
|
1999
|
52 |
4 |
p. 427-434
8 p.
|
artikel
|
| 23 |
Volume ratio determination in static expansion systems by means of a spinning rotor gauge
|
Jousten, K.
|
|
1999
|
52 |
4 |
p. 491-499
9 p.
|
artikel
|
| 24 |
XPS analysis of the oxidation of Ag–MgF2 cermet film
|
Da-Ming, Sun
|
|
1999
|
52 |
4 |
p. 383-386
4 p.
|
artikel
|
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