| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A controller for automated and normalized data recording—Applied to measurement of line shape of spectral emission during ion beam sputteringfn2 fn2 Dedicated to Prof. Hans o Lutz on the occasion of his 60th birthday.
|
Saha, SK
|
|
1998
|
51 |
3 |
p. 457-461
5 p.
|
artikel
|
| 2 |
Amorphous carbon film deposition using a DC-biased screen-grid in an electron cyclotron resonance plasma
|
Yoon, SF
|
|
1998
|
51 |
3 |
p. 445-451
7 p.
|
artikel
|
| 3 |
A study of the complete dynamic balance of the rotor inertial forces in the rotary piston vacuum pump
|
Li, Zhiyuan
|
|
1998
|
51 |
3 |
p. 427-431
5 p.
|
artikel
|
| 4 |
A study of the interface of CeO2⧹Si heterostructure grown by ion beam deposition
|
Wu, Zhenglong
|
|
1998
|
51 |
3 |
p. 397-401
5 p.
|
artikel
|
| 5 |
Book review
|
|
|
1998
|
51 |
3 |
p. 473-474
2 p.
|
artikel
|
| 6 |
Calculation of sputtering yields under high-fluence bombardment of a CuxNi1-x alloy
|
Zheng, Li-Ping
|
|
1998
|
51 |
3 |
p. 413-416
4 p.
|
artikel
|
| 7 |
Characterisation of DC unbalanced magnetron deposition of Ni⧹C : H composite films
|
Zeuner, Michael
|
|
1998
|
51 |
3 |
p. 417-426
10 p.
|
artikel
|
| 8 |
Characterization of TiN films prepared by rf sputtering using metal and compound targets
|
Kawamura, Midori
|
|
1998
|
51 |
3 |
p. 377-380
4 p.
|
artikel
|
| 9 |
Charge state of alkali atoms scattered by Mo and W surfaces
|
Aliev, AA
|
|
1998
|
51 |
3 |
p. 393-396
4 p.
|
artikel
|
| 10 |
Effect of deposition conditions and substrate position on the properties of superconducting YBa2Cu3Oδ thin films prepared in a facing-target sputtering system
|
Zeng, XT
|
|
1998
|
51 |
3 |
p. 323-327
5 p.
|
artikel
|
| 11 |
Effect of oxygen content on the electrochromic properties of sputtered tungsten oxide films with Li+ insertion
|
Hutchins, MG
|
|
1998
|
51 |
3 |
p. 433-439
7 p.
|
artikel
|
| 12 |
Experimental investigation of weld pool formation in electron beam welding
|
Petrov, Peter
|
|
1998
|
51 |
3 |
p. 339-343
5 p.
|
artikel
|
| 13 |
High crystalline quality titanium disilicides formed by sputter deposition of Ti⧹Si multilayers and annealing
|
Revva, P
|
|
1998
|
51 |
3 |
p. 335-337
3 p.
|
artikel
|
| 14 |
Influence of microwave plasma parameters on the nitriding of T-304 stainless steel
|
Camps, Enrique
|
|
1998
|
51 |
3 |
p. 385-392
8 p.
|
artikel
|
| 15 |
Influence of preparation technique on the structural, optical and electrical properties of polycrystalline CdS films
|
Kuhaimi, S A Al
|
|
1998
|
51 |
3 |
p. 349-355
7 p.
|
artikel
|
| 16 |
Ionization of clusters produced in a hollow-cathode source
|
Xenoulis, AC
|
|
1998
|
51 |
3 |
p. 357-362
6 p.
|
artikel
|
| 17 |
Microwave near-field plasma probe
|
Law, V.J.
|
|
1998
|
51 |
3 |
p. 463-468
6 p.
|
artikel
|
| 18 |
Photodarkening in amorphous GeSnSe4Cu0.5 films
|
Sedeek, K.
|
|
1998
|
51 |
3 |
p. 453-455
3 p.
|
artikel
|
| 19 |
RF plasma cleaning of the oxide surface as a possibility for contamination control in mos structures
|
Alexandrova, S
|
|
1998
|
51 |
3 |
p. 469-472
4 p.
|
artikel
|
| 20 |
Roughness and deposition mechanism of DLC films prepared by r.f. plasma glow discharge
|
Ali, Alanazi
|
|
1998
|
51 |
3 |
p. 363-368
6 p.
|
artikel
|
| 21 |
Tests and analysis of the source of shock-cell noise from a rotary piston vacuum pump
|
Li, Zhiyuan
|
|
1998
|
51 |
3 |
p. 345-348
4 p.
|
artikel
|
| 22 |
The dependence of the pumping speed of N2 and He for a vapour stream (Diffstak) pump on heater power and backing pressure
|
Sharma, DR
|
|
1998
|
51 |
3 |
p. 403-412
10 p.
|
artikel
|
| 23 |
The effect of Te isoelectronic substitution on the electrical and optical properties of the Ge—S—Se amorphous chalcogenide system studied in thin films
|
Sedeek, K
|
|
1998
|
51 |
3 |
p. 329-333
5 p.
|
artikel
|
| 24 |
The influence of the tribological properties of the crystallographic match of TiC⧹Ti(CxN1-x)⧹TiN multi-layers
|
Smolik, Jerzy
|
|
1998
|
51 |
3 |
p. 441-444
4 p.
|
artikel
|
| 25 |
The surface segregation of Ti–Nb composite film and its application to a smart getter material
|
Yoshitake, Michiko
|
|
1998
|
51 |
3 |
p. 369-376
8 p.
|
artikel
|
| 26 |
X-ray profile analysis on dislocations and hardness of Copper films
|
Shan, FL
|
|
1998
|
51 |
3 |
p. 381-383
3 p.
|
artikel
|
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