nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Angle-resolved UV-photoelectron spectroscopy
|
SteinrĂĽck, Hans-Peter |
|
1994 |
45 |
6-7 |
p. 715-731 17 p. |
artikel |
2 |
Atom probe field ion microscopy
|
Miller, MK |
|
1994 |
45 |
6-7 |
p. 819-831 13 p. |
artikel |
3 |
Auger electron spectroscopy
|
Linsmeier, Ch. |
|
1994 |
45 |
6-7 |
p. 673-690 18 p. |
artikel |
4 |
Ballistic simulation in surface science
|
Smith, Roger |
|
1994 |
45 |
6-7 |
p. 733-752 20 p. |
artikel |
5 |
Conferences on related topics
|
|
|
1994 |
45 |
6-7 |
p. 833-834 2 p. |
artikel |
6 |
Foreword—surface science techniques
|
Walls, J.Michael |
|
1994 |
45 |
6-7 |
p. 647- 1 p. |
artikel |
7 |
Ion scattering spectroscopy
|
Murrell, M.P. |
|
1994 |
45 |
6-7 |
p. 773-781 9 p. |
artikel |
8 |
Rutherford backscattering and nuclear reaction analysis
|
Earwaker, L.G. |
|
1994 |
45 |
6-7 |
p. 783-803 21 p. |
artikel |
9 |
Scanning tunnelling microscopy
|
Wilson, Ian H |
|
1994 |
45 |
6-7 |
p. 805-817 13 p. |
artikel |
10 |
Secondary ion mass spectrometry
|
Zalm, PC |
|
1994 |
45 |
6-7 |
p. 753-772 20 p. |
artikel |
11 |
Surface infrared spectroscopy
|
Hollins, Peter |
|
1994 |
45 |
6-7 |
p. 705-714 10 p. |
artikel |
12 |
Surface science techniques
|
|
|
1994 |
45 |
6-7 |
p. i- 1 p. |
artikel |
13 |
Surface science techniques
|
Walls, J.M. |
|
1994 |
45 |
6-7 |
p. 649-652 4 p. |
artikel |
14 |
X-ray absorption fine structure for surface studies
|
Crapper, M.D. |
|
1994 |
45 |
6-7 |
p. 691-704 14 p. |
artikel |
15 |
X-ray photoelectron spectroscopy
|
Watts, John F. |
|
1994 |
45 |
6-7 |
p. 653-671 19 p. |
artikel |