| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
AlTi reactive interdiffusion studied by STIMS and RBS
|
Maugis, P
|
|
1994
|
45 |
4 |
p. 413-417
5 p.
|
artikel
|
| 2 |
Analysis of hydrogen isotopes in materials by secondary ion mass spectrometry and nuclear microanalysis
|
Ross, GG
|
|
1994
|
45 |
4 |
p. 375-387
13 p.
|
artikel
|
| 3 |
A study of the thermally induced carbonization of phenolformaldehyde by combined ion beam and surface specific analyses
|
Ila, D
|
|
1994
|
45 |
4 |
p. 451-454
4 p.
|
artikel
|
| 4 |
Author index of articles
|
|
|
1994
|
45 |
4 |
p. 455-
1 p.
|
artikel
|
| 5 |
Calculation of the relocation function's moments during low energy ion beam mixing
|
Kornich, GV
|
|
1994
|
45 |
4 |
p. 487-488
2 p.
|
artikel
|
| 6 |
Characterization of IrO2SnO2 thin layers by electron and ion spectroscopies
|
Rubel, M
|
|
1994
|
45 |
4 |
p. 423-427
5 p.
|
artikel
|
| 7 |
Characterization of titanium-aluminum nitride thin films by ion beam techniques and X-ray diffraction
|
Stedile, FC
|
|
1994
|
45 |
4 |
p. 441-446
6 p.
|
artikel
|
| 8 |
Conference report
|
Yurasova, VE
|
|
1994
|
45 |
4 |
p. 489-
1 p.
|
artikel
|
| 9 |
Conferences on related topics
|
|
|
1994
|
45 |
4 |
p. 491-494
4 p.
|
artikel
|
| 10 |
Deuterium interaction with silicon-graphite materials exposed to the tokamak plasma
|
Rubel, M
|
|
1994
|
45 |
4 |
p. 429-434
6 p.
|
artikel
|
| 11 |
Energetic ion scattering analysis and glow discharge optical spectrometry characterization of amorphous hydrogenated carbon films elaborated by PACVD
|
Petit, T
|
|
1994
|
45 |
4 |
p. 403-407
5 p.
|
artikel
|
| 12 |
Formation of CrSi2 studied by Rutherford backscattering spectrometry
|
Tobbeche, S
|
|
1994
|
45 |
4 |
p. 421-422
2 p.
|
artikel
|
| 13 |
Inhomogeneity in semiconductor films: an analysis from optical studies
|
Maity, AB
|
|
1994
|
45 |
4 |
p. 483-486
4 p.
|
artikel
|
| 14 |
Introduction—analysis by a combination of ion-beam (accelerator based) and surface specific techniques (IB-SA93)
|
Paul Coad, J
|
|
1994
|
45 |
4 |
p. 373-
1 p.
|
artikel
|
| 15 |
IUVSTA Welch scholarship
|
|
|
1994
|
45 |
4 |
p. 495-496
2 p.
|
artikel
|
| 16 |
Machining influence on the surface of some roughness samples
|
Popa-Simil, L
|
|
1994
|
45 |
4 |
p. 419-
1 p.
|
artikel
|
| 17 |
Memory switching phenomena in thin films of chalcogenide semiconductors
|
Hegab, NA
|
|
1994
|
45 |
4 |
p. 459-462
4 p.
|
artikel
|
| 18 |
Nucleation and growth of Ta oxide in nonstationary thermal field—III. Self-organized structures controlled by convection
|
Lugomer, S
|
|
1994
|
45 |
4 |
p. 463-472
10 p.
|
artikel
|
| 19 |
Publisher's note
|
|
|
1994
|
45 |
4 |
p. 371-
1 p.
|
artikel
|
| 20 |
RBS, AES and XPS analysis of ion beam induced nitridation of Si and SiGe alloys
|
De Coster, W
|
|
1994
|
45 |
4 |
p. 389-395
7 p.
|
artikel
|
| 21 |
Redeposition effects on the target plates of the JET tokamak
|
Coad, JP
|
|
1994
|
45 |
4 |
p. 435-439
5 p.
|
artikel
|
| 22 |
Resolution enhancement of secondary ion microprobe images using Fourier deconvolution
|
Wang, H
|
|
1994
|
45 |
4 |
p. 447-450
4 p.
|
artikel
|
| 23 |
Simulation of reactive sputtering from a concentric dual-source magnetron in roll-to-roll coating processes
|
Tsiogas, CD
|
|
1994
|
45 |
4 |
p. 473-481
9 p.
|
artikel
|
| 24 |
Surface structure analysis by time-of-flight ISS: influence of primary ion nature and energy for scattering on Cu(110)
|
Houssiau, L
|
|
1994
|
45 |
4 |
p. 409-412
4 p.
|
artikel
|
| 25 |
The nature of the state of hydrogen on the surface and in the bulk of natural and synthetic diamond (using ion beam techniques)
|
Sellschop, JPF
|
|
1994
|
45 |
4 |
p. 397-402
6 p.
|
artikel
|
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