| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Characterization of high-dose implants of Co and Cr in Si by RBS
|
Climent-Font, A
|
|
1991
|
42 |
13 |
p. 795-799
5 p.
|
artikel
|
| 2 |
Combined use of electron microprobe analysis and nuclear microanalysis for Mg, Al and Si determination in minerals and glasses
|
Courel, P
|
|
1991
|
42 |
13 |
p. 819-820
2 p.
|
artikel
|
| 3 |
Comparison of PIXE and SXRF analysis for kinetic studies in cell pharmacology of platinum and gold compounds
|
Sommer, F
|
|
1991
|
42 |
13 |
p. 801-805
5 p.
|
artikel
|
| 4 |
Diamond growth and films
|
Steckelmacher, W
|
|
1991
|
42 |
13 |
p. 863-
1 p.
|
artikel
|
| 5 |
Editorial: Software survey section
|
|
|
1991
|
42 |
13 |
p. i-iv
nvt p.
|
artikel
|
| 6 |
Fast atom and ion surface studies leading to the development of a time of flight fast atom scattering spectrometer
|
Sullivan, JL
|
|
1991
|
42 |
13 |
p. 849-862
14 p.
|
artikel
|
| 7 |
In-beam nuclear polarization by ion beam-surface interaction
|
Vanderpoorten, W
|
|
1991
|
42 |
13 |
p. 789-793
5 p.
|
artikel
|
| 8 |
Introduction
|
Coad, J.P
|
|
1991
|
42 |
13 |
p. 783-
1 p.
|
artikel
|
| 9 |
Light emission from sputtered atoms following ion bombardment of polycrystalline Al and Cu targets
|
Reinke, Stefan
|
|
1991
|
42 |
13 |
p. 807-810
4 p.
|
artikel
|
| 10 |
Lithium distribution in minerals by nuclear microanalysis
|
Courel, P
|
|
1991
|
42 |
13 |
p. 821-822
2 p.
|
artikel
|
| 11 |
Multitechnique approach of the surface analysis of fluorinated polyethylene terephthalate
|
De Puydt, Y
|
|
1991
|
42 |
13 |
p. 811-817
7 p.
|
artikel
|
| 12 |
New patents
|
|
|
1991
|
42 |
13 |
p. 865-869
5 p.
|
artikel
|
| 13 |
Oxidation of clean and Pt covered Ni(111)
|
Deckers, S
|
|
1991
|
42 |
13 |
p. 827-829
3 p.
|
artikel
|
| 14 |
Oxygen depth profiling in thin films using the 16O(3He, α)15O nuclear reaction
|
Dworschak, RG
|
|
1991
|
42 |
13 |
p. 785-788
4 p.
|
artikel
|
| 15 |
SIMS and NRA studies of surface contaminants in gold-rich alloys
|
Decroupet, D
|
|
1991
|
42 |
13 |
p. 831-834
4 p.
|
artikel
|
| 16 |
Surface analysis with slow positrons
|
Paridaens, J
|
|
1991
|
42 |
13 |
p. 823-825
3 p.
|
artikel
|
| 17 |
The characteristics of reactive ion etching of polysilicon using SF6/O2 and their interdependence
|
Tandon, US
|
|
1991
|
42 |
13 |
p. 837-843
7 p.
|
artikel
|
| 18 |
The effect of ion exchange on adsorption properties of a 13X molecular sieve
|
Da-Ming, Sun
|
|
1991
|
42 |
13 |
p. 845-848
4 p.
|
artikel
|
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