nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Accessories increase leak detector's versatility
|
|
|
1989 |
39 |
10 |
p. 1012- 1 p. |
artikel |
2 |
A comparative study of silicon deposition from SiCl4 in cold plasma using argon, H2 or Ar+H2
|
|
|
1989 |
39 |
10 |
p. 980- 1 p. |
artikel |
3 |
A complete range of turbo control and power supplies
|
|
|
1989 |
39 |
10 |
p. 1013- 1 p. |
artikel |
4 |
Activities for the construction of a new Heidelberg proton microprobe
|
|
|
1989 |
39 |
10 |
p. 983- 1 p. |
artikel |
5 |
A generalized approach to vacuum system automation
|
|
|
1989 |
39 |
10 |
p. 972- 1 p. |
artikel |
6 |
A high ionization efficiency source for partially ionized beam deposition
|
|
|
1989 |
39 |
10 |
p. 983- 1 p. |
artikel |
7 |
A high-performance scanning tunneling microscope
|
|
|
1989 |
39 |
10 |
p. 1005- 1 p. |
artikel |
8 |
A model for reactive sputtering with magnetrons
|
Larsson, T. |
|
1989 |
39 |
10 |
p. 949-954 6 p. |
artikel |
9 |
A Monte Carlo investigation of the runaway of H+ ions in helium
|
|
|
1989 |
39 |
10 |
p. 983- 1 p. |
artikel |
10 |
Amorphous phase formation in Ni3B by low-temperature deuterium implantation
|
|
|
1989 |
39 |
10 |
p. 986- 1 p. |
artikel |
11 |
Analysis of frequency responses for different rotor configurations of small turbomolecular pumps
|
|
|
1989 |
39 |
10 |
p. 970- 1 p. |
artikel |
12 |
Analysis of grain growth due to ion irradiation of thin films
|
|
|
1989 |
39 |
10 |
p. 995- 1 p. |
artikel |
13 |
An evaluation of the composition of the residual atmosphere above a commercial dry pump
|
|
|
1989 |
39 |
10 |
p. 970- 1 p. |
artikel |
14 |
A new symmetric scanning tunneling microscope design
|
|
|
1989 |
39 |
10 |
p. 1005- 1 p. |
artikel |
15 |
A new type of hollow cathode discharge gun used in ion beam coating apparatus and theory analysis
|
Shulin, Zhang |
|
1989 |
39 |
10 |
p. 945-947 3 p. |
artikel |
16 |
A new ultrafine groove fabrication method utilizing electron cyclotron resonance plasma deposition and reactive ion etching
|
|
|
1989 |
39 |
10 |
p. 998- 1 p. |
artikel |
17 |
An impulsive collision model for the vibrational and rotational excitation of sputtered molecules
|
|
|
1989 |
39 |
10 |
p. 978- 1 p. |
artikel |
18 |
An in situ annealing study of lead implanted single crystal calcium titanate
|
|
|
1989 |
39 |
10 |
p. 988- 1 p. |
artikel |
19 |
Anisotropy of low-energy ion etching via electron cyclotron resonance plasma
|
|
|
1989 |
39 |
10 |
p. 997- 1 p. |
artikel |
20 |
Annealed Czochralski grown silicon crystals : a new material for the monochromatisation of synchrotron radiation and X-rays above 60 keV
|
|
|
1989 |
39 |
10 |
p. 1006-1007 2 p. |
artikel |
21 |
Annealing behavior of refractory metal multilayers on Si : the Mo/Ti and W/Ti systems
|
|
|
1989 |
39 |
10 |
p. 996- 1 p. |
artikel |
22 |
Annealing behavior of Si implanted InP
|
|
|
1989 |
39 |
10 |
p. 985- 1 p. |
artikel |
23 |
Annealing behaviour of extremely low energy beryllium implantation into Ga0.47In0.53As
|
|
|
1989 |
39 |
10 |
p. 986- 1 p. |
artikel |
24 |
Annoucements
|
|
|
1989 |
39 |
10 |
p. 1019-1020 2 p. |
artikel |
25 |
An 18O study of oxygen exchange phenomena during microwave-discharge plasma oxidation of silicon
|
|
|
1989 |
39 |
10 |
p. 1000- 1 p. |
artikel |
26 |
A novel heteroepitaxy method of Ge films on CaF2 by electron beam exposure
|
|
|
1989 |
39 |
10 |
p. 992- 1 p. |
artikel |
27 |
A phenomenological model for surface deposition kinetics during plasma and sputter deposition of amorphous hydrogenated silicon
|
|
|
1989 |
39 |
10 |
p. 978- 1 p. |
artikel |
28 |
A photoemission study of H2O adsorption on a vicinal Si(100) surface
|
|
|
1989 |
39 |
10 |
p. 971- 1 p. |
artikel |
29 |
A physical model for eliminating instabilities in reactive sputtering
|
|
|
1989 |
39 |
10 |
p. 977- 1 p. |
artikel |
30 |
Application of reflectance difference spectroscopy to molecular-beam epitaxy growth of GaAs and AlAs
|
|
|
1989 |
39 |
10 |
p. 1003- 1 p. |
artikel |
31 |
Application of the scanning tunneling microscope to insulating surfaces
|
|
|
1989 |
39 |
10 |
p. 1004- 1 p. |
artikel |
32 |
Applications of a high spatial resolution combined AES/SIMS instrument
|
Bishop, HE |
|
1989 |
39 |
10 |
p. 929-939 11 p. |
artikel |
33 |
A rotating substrate holder for the production of uniform thin amorphous films and multilayer structures
|
Taylor, JSG |
|
1989 |
39 |
10 |
p. 967-968 2 p. |
artikel |
34 |
A simple and novel technique for the deposition of conducting tin dioxide films
|
|
|
1989 |
39 |
10 |
p. 977- 1 p. |
artikel |
35 |
A solid state oxygen source for uhv
|
|
|
1989 |
39 |
10 |
p. 984- 1 p. |
artikel |
36 |
A source replenishment device for vacuum deposition
|
|
|
1989 |
39 |
10 |
p. 973- 1 p. |
artikel |
37 |
A study of the adhesion of vacuum-evaporated polyethylene films to aluminium
|
|
|
1989 |
39 |
10 |
p. 973- 1 p. |
artikel |
38 |
A time-of-flight quadrupole mass spectrometer system for measurements of thermal decomposition
|
|
|
1989 |
39 |
10 |
p. 971- 1 p. |
artikel |
39 |
A time resolved study of velocity distributions in pulsed molecular beams
|
|
|
1989 |
39 |
10 |
p. 983- 1 p. |
artikel |
40 |
Atomic beam scattering
|
|
|
1989 |
39 |
10 |
p. 1003- 1 p. |
artikel |
41 |
Auger electron spectroscopy : method for the accurate measurement of signal and noise and a figure of merit for the performance of AES instrument sensitivity
|
|
|
1989 |
39 |
10 |
p. 1003- 1 p. |
artikel |
42 |
Automatic leak detector and needs no liquid nitrogen
|
|
|
1989 |
39 |
10 |
p. 1014- 1 p. |
artikel |
43 |
A vacuum measurement system with Penning gauge for high voltage application
|
|
|
1989 |
39 |
10 |
p. 971- 1 p. |
artikel |
44 |
Balzers introduces all-in-one cryo preparation chamber
|
|
|
1989 |
39 |
10 |
p. 1014- 1 p. |
artikel |
45 |
Balzers publishes 1988 literature index
|
|
|
1989 |
39 |
10 |
p. 1018- 1 p. |
artikel |
46 |
Broad ion beam modeling for extraction optics optimization and etching process simulation
|
|
|
1989 |
39 |
10 |
p. 982- 1 p. |
artikel |
47 |
Buried layers of silicon oxy-nitride fabricated using ion beam synthesis
|
|
|
1989 |
39 |
10 |
p. 985- 1 p. |
artikel |
48 |
Channeling simulation in Ni3Al
|
|
|
1989 |
39 |
10 |
p. 1001- 1 p. |
artikel |
49 |
Characteristics of titanium arc evaporation processes
|
|
|
1989 |
39 |
10 |
p. 973- 1 p. |
artikel |
50 |
Characterization and thermal desorption spectroscopy study on a new, low outgassing material surface for improved ultrahigh vacuum uses
|
|
|
1989 |
39 |
10 |
p. 972- 1 p. |
artikel |
51 |
Characterization of a saddle field fast atom beam source
|
|
|
1989 |
39 |
10 |
p. 984- 1 p. |
artikel |
52 |
Characterization of cosputtered tungsten carbide thin films
|
|
|
1989 |
39 |
10 |
p. 975- 1 p. |
artikel |
53 |
Characterization of H+ ion irradiated silicon carbides
|
|
|
1989 |
39 |
10 |
p. 988- 1 p. |
artikel |
54 |
Characterization of molecular-beam epitaxially grown CdTe surfaces by high-energy electron diffraction and synchrotron radiation photo-emission spectroscopy
|
|
|
1989 |
39 |
10 |
p. 989- 1 p. |
artikel |
55 |
Characterization of PECVD deposited silicon oxynitride thin films
|
|
|
1989 |
39 |
10 |
p. 981- 1 p. |
artikel |
56 |
Characterization of SrF2 thin films and of SrF2/InP structures
|
|
|
1989 |
39 |
10 |
p. 1002- 1 p. |
artikel |
57 |
Characterization of the silicon-on-insulator material formed by high-dose oxygen implantation using spectroscopic ellipsometry
|
|
|
1989 |
39 |
10 |
p. 1000- 1 p. |
artikel |
58 |
Charge transfer adsorption in silicon vapor-phase epitaxial growth
|
|
|
1989 |
39 |
10 |
p. 991- 1 p. |
artikel |
59 |
Charge-transfer dipole moments at the Si-SiO2 interface
|
|
|
1989 |
39 |
10 |
p. 996- 1 p. |
artikel |
60 |
Chemically enhanced ion etching on refractory metal silicides
|
|
|
1989 |
39 |
10 |
p. 997- 1 p. |
artikel |
61 |
Chemical reactions at the Si/GaAs(110) and Si/InP(110) interfaces : effects on valence-band discontinuity measurements
|
|
|
1989 |
39 |
10 |
p. 993- 1 p. |
artikel |
62 |
Coherent meson production relativistic heavy-ion collision
|
|
|
1989 |
39 |
10 |
p. 1000- 1 p. |
artikel |
63 |
Concentric tube scanning tunneling microscope
|
|
|
1989 |
39 |
10 |
p. 1004- 1 p. |
artikel |
64 |
Controlled etching of silicate glasses by pulsed ultraviolet laser radiation
|
|
|
1989 |
39 |
10 |
p. 998- 1 p. |
artikel |
65 |
Control of microstructure and properties of copper films using ion-assited deposition
|
|
|
1989 |
39 |
10 |
p. 980- 1 p. |
artikel |
66 |
Cosputtered W75C25 thin film diffusion barriers
|
|
|
1989 |
39 |
10 |
p. 977- 1 p. |
artikel |
67 |
Cross-sectional transmission electron microscope study of intrinsic solid-phase epitaxial growth in self-ion-implanted (001) Si
|
|
|
1989 |
39 |
10 |
p. 986- 1 p. |
artikel |
68 |
Cryo-Torr product folder
|
|
|
1989 |
39 |
10 |
p. 1012- 1 p. |
artikel |
69 |
Crystallization of SiO by HE+ bombardment
|
|
|
1989 |
39 |
10 |
p. 992- 1 p. |
artikel |
70 |
Current-voltage relations in magnetrons
|
|
|
1989 |
39 |
10 |
p. 976- 1 p. |
artikel |
71 |
Defects in SiO2 in buried-oxide structures formed by O+ implantation
|
|
|
1989 |
39 |
10 |
p. 985- 1 p. |
artikel |
72 |
Density of ZnS thin films grown by atomic layer epitaxy
|
|
|
1989 |
39 |
10 |
p. 992- 1 p. |
artikel |
73 |
Dependence of microstructure of TiN coatings on their thickness
|
|
|
1989 |
39 |
10 |
p. 1006- 1 p. |
artikel |
74 |
Deposition of device quality silicon dioxide thin films by remote plasma enhanced chemical vapor deposition
|
|
|
1989 |
39 |
10 |
p. 981- 1 p. |
artikel |
75 |
Deposition of hard carbon films by the r.f. glow discharge method
|
|
|
1989 |
39 |
10 |
p. 982- 1 p. |
artikel |
76 |
Deposition of TiB2 films by a co-sputtering method
|
|
|
1989 |
39 |
10 |
p. 974- 1 p. |
artikel |
77 |
Deposition of vanadium oxide films by direct-current magnetron reactive sputtering
|
|
|
1989 |
39 |
10 |
p. 977- 1 p. |
artikel |
78 |
Deposition techniques for the preparation of thin film nuclear targets
|
|
|
1989 |
39 |
10 |
p. 973- 1 p. |
artikel |
79 |
Depth of origin of sputtered atoms: experimental and theoretical study of Cu/Ru(0001)
|
|
|
1989 |
39 |
10 |
p. 975- 1 p. |
artikel |
80 |
Design and performance of an UHV beamline to produce low and hyperthermal energy ion beams
|
|
|
1989 |
39 |
10 |
p. 983- 1 p. |
artikel |
81 |
Diamond crystal growth by plasma chemical vapor deposition
|
|
|
1989 |
39 |
10 |
p. 980- 1 p. |
artikel |
82 |
Diamond films by ion-assisted deposition at room temperature
|
|
|
1989 |
39 |
10 |
p. 980- 1 p. |
artikel |
83 |
Diffusion model for Ohmic contacts to GaAs
|
|
|
1989 |
39 |
10 |
p. 993- 1 p. |
artikel |
84 |
Diffusion of boron, phosphorus and arsenic implanted in thin films of cobalt disilicide
|
|
|
1989 |
39 |
10 |
p. 995- 1 p. |
artikel |
85 |
Diffusion of Cu into rf-sputtered iron oxide films
|
|
|
1989 |
39 |
10 |
p. 976- 1 p. |
artikel |
86 |
Displacement damage in LiNbO3
|
|
|
1989 |
39 |
10 |
p. 986- 1 p. |
artikel |
87 |
Distribution of energy in polymers due to incident electrons and protons
|
|
|
1989 |
39 |
10 |
p. 1001- 1 p. |
artikel |
88 |
Editorial: Software survey section
|
|
|
1989 |
39 |
10 |
p. ix-x nvt p. |
artikel |
89 |
Edwards news no 17
|
|
|
1989 |
39 |
10 |
p. 1019- 1 p. |
artikel |
90 |
Effect of grain size on the oxidation kinetics of sputtered titanium nitride films
|
|
|
1989 |
39 |
10 |
p. 977- 1 p. |
artikel |
91 |
Effect of mixing ions on the formation process of β-SiC fabricated by ion beam mixing
|
|
|
1989 |
39 |
10 |
p. 994- 1 p. |
artikel |
92 |
Effect of resputtering on composition of WSix films deposited by multilayer sputtering
|
|
|
1989 |
39 |
10 |
p. 976- 1 p. |
artikel |
93 |
Effects of dry etching on the electrical properties of silicon
|
|
|
1989 |
39 |
10 |
p. 998- 1 p. |
artikel |
94 |
Effects of energy straggling on surface analysis with fast ion beams
|
|
|
1989 |
39 |
10 |
p. 1001- 1 p. |
artikel |
95 |
Effects of ion implantation on poly(dimethylsilylene-co-methyl-phenylsyilylene
|
|
|
1989 |
39 |
10 |
p. 986- 1 p. |
artikel |
96 |
Effects of plasma stripping on the oxidation states of aluminum-silicon and tungsten surfaces
|
|
|
1989 |
39 |
10 |
p. 997- 1 p. |
artikel |
97 |
Electrical and optical properties of indium tin oxide thin films prepared on low-temperature substrates by rf magnetron sputtering under an applied external magnetic field
|
|
|
1989 |
39 |
10 |
p. 978- 1 p. |
artikel |
98 |
Electrical damage induced by ion beam etching of GaAs
|
|
|
1989 |
39 |
10 |
p. 997- 1 p. |
artikel |
99 |
Electric-field-assisted deposition of optical coatings
|
|
|
1989 |
39 |
10 |
p. 981- 1 p. |
artikel |
100 |
Electron-beam lithography system using a quadrupole triplet
|
|
|
1989 |
39 |
10 |
p. 998- 1 p. |
artikel |
101 |
Electron emission from electroformed carbon films
|
|
|
1989 |
39 |
10 |
p. 1002- 1 p. |
artikel |
102 |
Electron energy distributions in oxygen microwave plasmas
|
|
|
1989 |
39 |
10 |
p. 999- 1 p. |
artikel |
103 |
Electronic transitions in surface and near-surface radiation effects
|
|
|
1989 |
39 |
10 |
p. 984- 1 p. |
artikel |
104 |
Energy dependence of concentration of implants and its chemical consequences
|
|
|
1989 |
39 |
10 |
p. 984- 1 p. |
artikel |
105 |
Energy distributions of molecular gas ions generated in a special glow-discharge source
|
Wroński, Z |
|
1989 |
39 |
10 |
p. 941-944 4 p. |
artikel |
106 |
Epitaxial growth and X-ray structural characterization of Zn1−x
Fe
x
Se films on GaAs(001)
|
|
|
1989 |
39 |
10 |
p. 991- 1 p. |
artikel |
107 |
Epitaxial silicon reactor technology—a review
|
|
|
1989 |
39 |
10 |
p. 989- 1 p. |
artikel |
108 |
Etching on polar (111) surfaces of CdTe crystals studied with Auger electron spectroscopy
|
|
|
1989 |
39 |
10 |
p. 1004- 1 p. |
artikel |
109 |
Evidence of implantation doping in polyacetylene
|
|
|
1989 |
39 |
10 |
p. 985- 1 p. |
artikel |
110 |
Extension of thermocouple gauge sensitivity to atmospheric pressure
|
|
|
1989 |
39 |
10 |
p. 971- 1 p. |
artikel |
111 |
Fluctuations during JET discharges with H-mode
|
|
|
1989 |
39 |
10 |
p. 999- 1 p. |
artikel |
112 |
Focusing protons and light ions to micron and submicron dimensions
|
|
|
1989 |
39 |
10 |
p. 984- 1 p. |
artikel |
113 |
Formation and thermal stability of amorphous CuZr thin films deposited by coevaporation
|
|
|
1989 |
39 |
10 |
p. 974- 1 p. |
artikel |
114 |
Formation of buried nitride layers by ion implantation
|
|
|
1989 |
39 |
10 |
p. 984- 1 p. |
artikel |
115 |
Formation of paramagnetic defects in high-purity silica by high-energy ions
|
|
|
1989 |
39 |
10 |
p. 988- 1 p. |
artikel |
116 |
Formation of some hierarchy in amorphous structure during the crystallization of vacuum-deposited amorphous semiconductor films
|
|
|
1989 |
39 |
10 |
p. 974- 1 p. |
artikel |
117 |
Fundamental irradiation processes relevant to plasma-surface technology
|
|
|
1989 |
39 |
10 |
p. 979- 1 p. |
artikel |
118 |
GaAs surface cleaning by thermal oxidation and sublimation in molecular-beam epitaxy
|
|
|
1989 |
39 |
10 |
p. 991- 1 p. |
artikel |
119 |
Ga0.5In0.5P/GaAs interfaces by organometallic vapor-phase epitaxy
|
|
|
1989 |
39 |
10 |
p. 992- 1 p. |
artikel |
120 |
GaP/Si heteroepitaxy by complex ion beam sputtering
|
|
|
1989 |
39 |
10 |
p. 993- 1 p. |
artikel |
121 |
Geometrical and surface effects in the sputtering process
|
|
|
1989 |
39 |
10 |
p. 975- 1 p. |
artikel |
122 |
Graham Kinney pumps for Saudi
|
|
|
1989 |
39 |
10 |
p. 1015- 1 p. |
artikel |
123 |
Grazing X-ray reflectometry and Rutherford backscattering : two complementary techniques for the study of thin film mixing
|
|
|
1989 |
39 |
10 |
p. 1002- 1 p. |
artikel |
124 |
Growth and characterization of AlGaInAs lattice matched to InP grown by molecular-beam epitaxy
|
|
|
1989 |
39 |
10 |
p. 991- 1 p. |
artikel |
125 |
Growth and characterization of Si1−x
Ge
x
and Ge epilayers on (100) Si
|
|
|
1989 |
39 |
10 |
p. 991- 1 p. |
artikel |
126 |
Growth and properties of doped CdTe films grown by photoassisted molecular-beam epitaxy
|
|
|
1989 |
39 |
10 |
p. 989- 1 p. |
artikel |
127 |
Growth and structure of chemical vapor deposited silicon carbide from methyltrichlorosilane and hydrogen in the temperature range of 1100 to 1400°C
|
|
|
1989 |
39 |
10 |
p. 991- 1 p. |
artikel |
128 |
Growth, atomic structure, and oxidation of chromium overlayers on W(110)
|
|
|
1989 |
39 |
10 |
p. 974- 1 p. |
artikel |
129 |
Growth dynamics of aluminum nitride and aluminum oxide thin films synthesized by ion-assisted deposition
|
|
|
1989 |
39 |
10 |
p. 980- 1 p. |
artikel |
130 |
Growth kinetics and step density in reflection high-energy electron diffraction during molecular-beam epitaxy
|
|
|
1989 |
39 |
10 |
p. 993- 1 p. |
artikel |
131 |
Growth of Al and Al nitride films in N2−Ne and N2−(Ne+Ar) discharges: construction of a ternary gas phase diagram
|
|
|
1989 |
39 |
10 |
p. 982- 1 p. |
artikel |
132 |
Growth of epitaxial CaSi2 films on Si(111)
|
|
|
1989 |
39 |
10 |
p. 989- 1 p. |
artikel |
133 |
Growth processes in amorphous metallic films: a computer simulation
|
|
|
1989 |
39 |
10 |
p. 974- 1 p. |
artikel |
134 |
Hard coatings
|
Bunshah, RF |
|
1989 |
39 |
10 |
p. 955-965 11 p. |
artikel |
135 |
Helium diffraction from (2 x n) structures on Si(001)
|
|
|
1989 |
39 |
10 |
p. 1003- 1 p. |
artikel |
136 |
High dose uranium ion implantation into silicon
|
|
|
1989 |
39 |
10 |
p. 987- 1 p. |
artikel |
137 |
High performance hoses and ‘O’-rings from safelab
|
|
|
1989 |
39 |
10 |
p. 1010- 1 p. |
artikel |
138 |
High performance SIMS
|
|
|
1989 |
39 |
10 |
p. 1011- 1 p. |
artikel |
139 |
High-precision reticle making by electron-beam lithography
|
|
|
1989 |
39 |
10 |
p. 998- 1 p. |
artikel |
140 |
High temperatures stability of plasma-enhanced chemically vapour deposited titanium silicide due to two-step rapid thermal annealing
|
|
|
1989 |
39 |
10 |
p. 981- 1 p. |
artikel |
141 |
Hollow-anode discharge with axial-magnetic field as an electron beam source
|
|
|
1989 |
39 |
10 |
p. 984- 1 p. |
artikel |
142 |
Image charge focusing of relativistic electron beams
|
|
|
1989 |
39 |
10 |
p. 1004- 1 p. |
artikel |
143 |
Improved adhesion of solid lubricating films with ion-beam mixing
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1989 |
39 |
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p. 979- 1 p. |
artikel |
144 |
Improvements to and characterization of GaInAs/AlInAs hetero-interfaces grown by molecular-beam epitaxy
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1989 |
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p. 990- 1 p. |
artikel |
145 |
Inert gas entrapment in films produced by ion-assisted physical vapour deposition processes
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1989 |
39 |
10 |
p. 981- 1 p. |
artikel |
146 |
Influence of boron related defects on activation of silicon implanted into undoped semi-insulating GaAs
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1989 |
39 |
10 |
p. 987- 1 p. |
artikel |
147 |
Influence of deposition parameters on the properties of boron-doped amorphous silicon-carbide films
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1989 |
39 |
10 |
p. 980- 1 p. |
artikel |
148 |
Influence of deposition rate on properties of reactively sputtered TiNx films
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1989 |
39 |
10 |
p. 976- 1 p. |
artikel |
149 |
Influence of substrate misorientation on defect and impurity incorporation in GaAs/AlGaAs heterostructures grown by molecular-beam epitaxy
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1989 |
39 |
10 |
p. 990- 1 p. |
artikel |
150 |
In situ investigation of TiN formation on top of TiSi2
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1989 |
39 |
10 |
p. 977- 1 p. |
artikel |
151 |
Integrated thermal vacuum sensor with extended range
|
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1989 |
39 |
10 |
p. 969- 1 p. |
artikel |
152 |
Interactions between interstitial atoms in silicon : arsenic-argon-boron and boron-argon-phosphorus
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1989 |
39 |
10 |
p. 995- 1 p. |
artikel |
153 |
Interdiffusion and structural relaxation in Mo/Si multilayer films
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1989 |
39 |
10 |
p. 995- 1 p. |
artikel |
154 |
Interfacial reactions in the Ti/GaAs system
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1989 |
39 |
10 |
p. 993- 1 p. |
artikel |
155 |
Intermixing of Co/Gd
x
O
y
thin films on Kapton polyimide
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1989 |
39 |
10 |
p. 994- 1 p. |
artikel |
156 |
Investigation of cosputtered W-C thin films as diffusion barriers
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1989 |
39 |
10 |
p. 976- 1 p. |
artikel |
157 |
Investigation of the void structure in amorphous germanium thin films as a function of low-energy ion bombardment
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1989 |
39 |
10 |
p. 980- 1 p. |
artikel |
158 |
Ion beam bombardment effects during film deposition
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1989 |
39 |
10 |
p. 979- 1 p. |
artikel |
159 |
Ion beam mixing of GaAs with films of Al, Si and their nitrides
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1989 |
39 |
10 |
p. 996- 1 p. |
artikel |
160 |
Ion beam self-sputtering using a cathodic arc ion source
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1989 |
39 |
10 |
p. 975- 1 p. |
artikel |
161 |
Ion emission from plasma-focus facilities
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1989 |
39 |
10 |
p. 999- 1 p. |
artikel |
162 |
Ion implantation, a method for fabricating light guides in polymers
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1989 |
39 |
10 |
p. 987- 1 p. |
artikel |
163 |
Ion implantation and annealing of crystalline oxides and ceramic materials
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1989 |
39 |
10 |
p. 988- 1 p. |
artikel |
164 |
Ion implanters: chemical and radiation safety
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1989 |
39 |
10 |
p. 982- 1 p. |
artikel |
165 |
Ion-induced mixing at Nb/Fe2O3 interface studied by CEMS technique
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1989 |
39 |
10 |
p. 995- 1 p. |
artikel |
166 |
Ionizing beam-induced adhesion enhancement and interface chemistry for AuGaAs
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1989 |
39 |
10 |
p. 979- 1 p. |
artikel |
167 |
Ion microscopy using magnifying ion transport systems and position sensitive detectors
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1989 |
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10 |
p. 1002- 1 p. |
artikel |
168 |
Ion mixing and thermochemical properties of tracers in Ag
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1989 |
39 |
10 |
p. 996- 1 p. |
artikel |
169 |
Ion mixing of Al2O3 and Al films on SiO2
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1989 |
39 |
10 |
p. 994- 1 p. |
artikel |
170 |
Ion sputtering yield measurements for submicrometer thin films
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1989 |
39 |
10 |
p. 975- 1 p. |
artikel |
171 |
Issues in molecular-beam epitaxy kinetics of compound semiconductor based heterostructures
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1989 |
39 |
10 |
p. 991- 1 p. |
artikel |
172 |
Jacques Friedel to receive 1988 Von Hippel award of Materials Research Society
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1989 |
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10 |
p. 1019- 1 p. |
artikel |
173 |
Kinetics and mechanism of reaction at room temperature in thin Au/metal couples
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1989 |
39 |
10 |
p. 994- 1 p. |
artikel |
174 |
Kinetics of growth coalescence of In/GaAs
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1989 |
39 |
10 |
p. 973- 1 p. |
artikel |
175 |
Large grain polycrystalline silicon by low-temperature annealing of low-pressure chemical vapor deposited amorphous silicon films
|
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1989 |
39 |
10 |
p. 992- 1 p. |
artikel |
176 |
Lattice site occupation of compound forming elements implanted into aluminium
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1989 |
39 |
10 |
p. 989- 1 p. |
artikel |
177 |
Light-enhanced molecular-beam epitaxial growth in II–VI and III–V compound semiconductors
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1989 |
39 |
10 |
p. 989- 1 p. |
artikel |
178 |
Localized epitaxial growth of IrSi3 on (111) and (001) silicon
|
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1989 |
39 |
10 |
p. 992- 1 p. |
artikel |
179 |
Low-energy electronic stopping for boron in beryllium
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1989 |
39 |
10 |
p. 1001- 1 p. |
artikel |
180 |
Low-energy neutral/ion backscattering at As/Si(001)
|
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1989 |
39 |
10 |
p. 1006- 1 p. |
artikel |
181 |
Low power, 3.2-cm, efficient microwave electron cyclotron resonant ion source
|
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1989 |
39 |
10 |
p. 984- 1 p. |
artikel |
182 |
Low-temperature annealing of As-implanted Ge
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1989 |
39 |
10 |
p. 991- 1 p. |
artikel |
183 |
Low-temperature atomic force microscopy
|
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1989 |
39 |
10 |
p. 1004- 1 p. |
artikel |
184 |
Low temperature growth of AIN and Al2O3 films by the simultaneous use of a microwave ion source and an ionized cluster beam system Hiroshi Takaoka et al,
Thin Solid Films,
157, 1988, 143–158
|
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1989 |
39 |
10 |
p. 981- 1 p. |
artikel |
185 |
Lubricating of mechanisms for vacuum service
|
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1989 |
39 |
10 |
p. 972- 1 p. |
artikel |
186 |
Magnetic field gradient effects on ion energy for electron cyclotron resonance microwave plasma stream
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1989 |
39 |
10 |
p. 1000- 1 p. |
artikel |
187 |
Magnetron plasma diagnostics and processing implications
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1989 |
39 |
10 |
p. 1000- 1 p. |
artikel |
188 |
Magnetron-plasma ion beam etching : a new dry etching technique
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1989 |
39 |
10 |
p. 997- 1 p. |
artikel |
189 |
Measurement of the electronic stopping power of gold for protons in a large solid angle transmission geometry
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1989 |
39 |
10 |
p. 1001- 1 p. |
artikel |
190 |
Mechanisms of contaminant particle production, migration, and adhesion
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1989 |
39 |
10 |
p. 979- 1 p. |
artikel |
191 |
Medium-energy ion scattering studies of relaxation at metal surfaces
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1989 |
39 |
10 |
p. 1003- 1 p. |
artikel |
192 |
Medium resolution atmospheric pressure ionization mass spectrometer
|
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1989 |
39 |
10 |
p. 971- 1 p. |
artikel |
193 |
Metal/semiconductor interfaces on SnO2(110)
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1989 |
39 |
10 |
p. 993- 1 p. |
artikel |
194 |
Metastable bismuth-iron alloy films synthesized with ion mixing and magnetron copsuttering
|
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1989 |
39 |
10 |
p. 996- 1 p. |
artikel |
195 |
Methods of surface analysis (techniques and applications)
|
Steckelmacher, W. |
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1989 |
39 |
10 |
p. 1021- 1 p. |
artikel |
196 |
Microbeam line with 1.5 MeV helium ions and protons at Osaka
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1989 |
39 |
10 |
p. 982- 1 p. |
artikel |
197 |
Microstructural characterization of nitrogen implanted 440C steel
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1989 |
39 |
10 |
p. 988- 1 p. |
artikel |
198 |
Mixing of Pt-René N4 alloy under Pt+ bombardment
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1989 |
39 |
10 |
p. 995- 1 p. |
artikel |
199 |
Model calculation for the tunnel current from a tungsten tip to a Ni(100) surface with a chemisorbed oxygen atom
|
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1989 |
39 |
10 |
p. 971- 1 p. |
artikel |
200 |
Molecular-beam epitaxial growth and characterization of pseudomorphic InAs/In0.52Al0.48As quantum wells
|
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1989 |
39 |
10 |
p. 990- 1 p. |
artikel |
201 |
Molecular-beam epitaxy growth of GaAs/InAs structures on (001)InP by alternating III/V fluxes
|
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1989 |
39 |
10 |
p. 990- 1 p. |
artikel |
202 |
Molecular flow in complex vacuum systems
|
Steckelmacher, W. |
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1989 |
39 |
10 |
p. 1022- 1 p. |
artikel |
203 |
Molecular stream epitaxy and the role of the boundary layer in chemical vapor deposition
|
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1989 |
39 |
10 |
p. 990- 1 p. |
artikel |
204 |
Molecular structure evolution under krypton ion irradiation of an electropolymerised polyacrylonitrile film
|
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1989 |
39 |
10 |
p. 985- 1 p. |
artikel |
205 |
Monte Carlo simulation of ion transport through rf glow-discharge sheaths
|
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1989 |
39 |
10 |
p. 999- 1 p. |
artikel |
206 |
Morphology and structure of gold silver and copper layers obtained by sputtering during ion bombardment of targets from these metals
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1989 |
39 |
10 |
p. 981- 1 p. |
artikel |
207 |
Multipole lenses and their application in nuclear microprobe lens systems
|
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1989 |
39 |
10 |
p. 984- 1 p. |
artikel |
208 |
Narrowband filters for precision monochromatic light sources
|
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1989 |
39 |
10 |
p. 1009- 1 p. |
artikel |
209 |
New Cambridge headquarters for Torvac and Wentgate
|
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1989 |
39 |
10 |
p. 1015- 1 p. |
artikel |
210 |
New Graham Kinney technical brochure
|
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1989 |
39 |
10 |
p. 1015- 1 p. |
artikel |
211 |
New microwave ion source for multiply charged ion beam production
|
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1989 |
39 |
10 |
p. 982- 1 p. |
artikel |
212 |
New MKS flowmeter calibration system
|
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1989 |
39 |
10 |
p. 1009- 1 p. |
artikel |
213 |
New patent
|
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1989 |
39 |
10 |
p. i-vi nvt p. |
artikel |
214 |
New Pirani gauge from MKS
|
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1989 |
39 |
10 |
p. 1009- 1 p. |
artikel |
215 |
New Pirani vacuum sensor has integral transmitter
|
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1989 |
39 |
10 |
p. 1013-1014 2 p. |
artikel |
216 |
News for users of high vacuum systems—vacuum leadthoughs now on ISO standard flanges
|
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1989 |
39 |
10 |
p. 1012-1013 2 p. |
artikel |
217 |
Nondiffusive velocity broadening in ion energy analyzer operation
|
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1989 |
39 |
10 |
p. 1000- 1 p. |
artikel |
218 |
Novel approach for particle velocity and size measurement under plasma conditions
|
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1989 |
39 |
10 |
p. 1000- 1 p. |
artikel |
219 |
Novel microstructures for the in situ measurement of mechanical properties of thin films
|
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1989 |
39 |
10 |
p. 979- 1 p. |
artikel |
220 |
Observation of microfabricated patterns by scanning tunneling microscopy
|
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1989 |
39 |
10 |
p. 1005- 1 p. |
artikel |
221 |
On-line measurement of the spatial dose uniformity in ion implantation processes
|
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1989 |
39 |
10 |
p. 987- 1 p. |
artikel |
222 |
On the calculation of the overall transmission probability of a variable blade length multiple-stage turbomolecular pump
|
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1989 |
39 |
10 |
p. 969- 1 p. |
artikel |
223 |
On the energy distribution of doubly charged atomic ions emitted from liquid metal ion sources
|
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1989 |
39 |
10 |
p. 983- 1 p. |
artikel |
224 |
On the properties of physically vapour-deposited TiAlVN coatings
|
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|
1989 |
39 |
10 |
p. 973- 1 p. |
artikel |
225 |
O+, O+
2, O+
3 and O+
4 ions in Ar-O2 sputtering discharges : comments on “Oxidation mechanism in rf CO2 plasma”, Vacuum, 36, 85 (1986)
|
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|
1989 |
39 |
10 |
p. 999- 1 p. |
artikel |
226 |
Optical and structural characteristics of Al2O3 films deposited by the reactive ionized cluster beam method
|
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1989 |
39 |
10 |
p. 991- 1 p. |
artikel |
227 |
Optical investigations of ion implant damage in silicon
|
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1989 |
39 |
10 |
p. 987- 1 p. |
artikel |
228 |
Optically absorbing layers on ion beam modified polymers: a study of their evolution and properties
|
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1989 |
39 |
10 |
p. 984- 1 p. |
artikel |
229 |
Optical properties of molecular beam epitaxially grown GaAs1−x
Sb
x
(0 < x < 0.5) on GaAs and InP substrates
|
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1989 |
39 |
10 |
p. 990- 1 p. |
artikel |
230 |
Optimisation of the properties of a microfocused ion beam system
|
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1989 |
39 |
10 |
p. 982- 1 p. |
artikel |
231 |
Organometallic chemical vapor phase deposition of “Mn2Si”
|
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1989 |
39 |
10 |
p. 1002- 1 p. |
artikel |
232 |
Oscillating vane for measuring speed of gas flow
|
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1989 |
39 |
10 |
p. 970- 1 p. |
artikel |
233 |
Oxford applied research ‘new review’ winter
|
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1989 |
39 |
10 |
p. 1019- 1 p. |
artikel |
234 |
Phenomena produced by ion bombardment in plasma-assisted etching environments
|
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|
1989 |
39 |
10 |
p. 999- 1 p. |
artikel |
235 |
Photoluminescence spectra of highly doped Al
x
Ga1−x
As grown by molecular-beam epitaxy
|
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|
1989 |
39 |
10 |
p. 992- 1 p. |
artikel |
236 |
Photoreflectance study of boron ion-implanted {100} CdTe
|
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1989 |
39 |
10 |
p. 986- 1 p. |
artikel |
237 |
Physics at surfaces
|
Steckelmacher, W. |
|
1989 |
39 |
10 |
p. 1021-1022 2 p. |
artikel |
238 |
Plasma-assisted etching of tungsten films : a quartz-crystal micro-balance study
|
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1989 |
39 |
10 |
p. 998- 1 p. |
artikel |
239 |
Plasma deposition of amorphous hydrogenated carbon films on III–V semiconductors
|
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1989 |
39 |
10 |
p. 981- 1 p. |
artikel |
240 |
Plasma enhanced chemical vapor deposition of polycrystalline diamond and diamondlike films
|
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1989 |
39 |
10 |
p. 979- 1 p. |
artikel |
241 |
Plasma etching with a microwave cavity plasma disk source
|
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1989 |
39 |
10 |
p. 997- 1 p. |
artikel |
242 |
Plasma oscillation modes in a low-pressure plane positive column
|
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1989 |
39 |
10 |
p. 999- 1 p. |
artikel |
243 |
Plasma polymerized thin films containing small silver particles
|
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1989 |
39 |
10 |
p. 979- 1 p. |
artikel |
244 |
Platinum silicide contact to arsenic-doped polycrystalline silicon
|
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1989 |
39 |
10 |
p. 995- 1 p. |
artikel |
245 |
Preparation and characteristics of ZnS thin films by intense pulsed ion beam
|
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1989 |
39 |
10 |
p. 989- 1 p. |
artikel |
246 |
Preparation properties and applications of boron nitride thin films
|
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1989 |
39 |
10 |
p. 975- 1 p. |
artikel |
247 |
Pressure stability in reactive magnetron sputtering
|
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1989 |
39 |
10 |
p. 974- 1 p. |
artikel |
248 |
Primary vacuum pumps for the fusion reactor fuel cycle
|
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1989 |
39 |
10 |
p. 969- 1 p. |
artikel |
249 |
Properties of AIN films deposited on N-implanted Al
|
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|
1989 |
39 |
10 |
p. 988- 1 p. |
artikel |
250 |
Properties of hard tungsten films prepared by sputtering
|
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1989 |
39 |
10 |
p. 977- 1 p. |
artikel |
251 |
Properties of ion-beam-sputtered Ni/Fe artificial lattice film
|
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1989 |
39 |
10 |
p. 977- 1 p. |
artikel |
252 |
Properties of polycrystalline silicon grown on insulating subtrates by electron beam gun evaporation
|
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1989 |
39 |
10 |
p. 972- 1 p. |
artikel |
253 |
Proposal for a sensitive leak test telescope
|
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1989 |
39 |
10 |
p. 970- 1 p. |
artikel |
254 |
Pumping mechanism for N2 gas in a triode ion pump with A1100 aluminum cathode
|
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1989 |
39 |
10 |
p. 969- 1 p. |
artikel |
255 |
Quantitative analysis and depth profiling of rare gases in solids by secondary-ion mass spectrometry : detection of (CsR)+ molecular ions (R = rare gas)
|
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1989 |
39 |
10 |
p. 1002- 1 p. |
artikel |
256 |
Quantitative analysis of channeling data for the determination of the amorphous fraction in ion bombarded single crystals
|
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1989 |
39 |
10 |
p. 1001- 1 p. |
artikel |
257 |
Quantitative measurements with quadrupole mass spectrometers: important specifications for reliable measurements
|
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1989 |
39 |
10 |
p. 971- 1 p. |
artikel |
258 |
Radiation effects in thin films of high T
c superconductors
|
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1989 |
39 |
10 |
p. 988- 1 p. |
artikel |
259 |
Radiation effects on metal-insulator-semiconductor diode energetic ion detectors
|
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1989 |
39 |
10 |
p. 988- 1 p. |
artikel |
260 |
(111) random and 〈110〉 channeled implantation profiles and range parameters in Hg1−x
Cd
x
Te
|
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|
1989 |
39 |
10 |
p. 1001- 1 p. |
artikel |
261 |
Range distribution of implanted cesium ions in silicon dioxide films
|
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1989 |
39 |
10 |
p. 986- 1 p. |
artikel |
262 |
Range measurements and thermal stability study of AZ111 photoresist implanted with Bi ions
|
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1989 |
39 |
10 |
p. 987- 1 p. |
artikel |
263 |
Range profiles of Ar implanted into C films
|
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1989 |
39 |
10 |
p. 989- 1 p. |
artikel |
264 |
Range profiles of helium in solids
|
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1989 |
39 |
10 |
p. 1001- 1 p. |
artikel |
265 |
Reaction of atomic and molecular bromine with aluminum
|
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1989 |
39 |
10 |
p. 971- 1 p. |
artikel |
266 |
Reactive and chemically assisted ion beam etching of Si and SiO2
|
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1989 |
39 |
10 |
p. 997- 1 p. |
artikel |
267 |
Reactive and nonreactive ion mixing of Ti films on carbon substrates
|
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1989 |
39 |
10 |
p. 994- 1 p. |
artikel |
268 |
Reconsidering the mechanisms of laser sputtering with Knudsen-layer formation taken into account
|
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1989 |
39 |
10 |
p. 976- 1 p. |
artikel |
269 |
Reflection electron microscopy observation of the Si-SiO2 interface
|
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1989 |
39 |
10 |
p. 996- 1 p. |
artikel |
270 |
Reflection high-energy electron diffraction observations during growth of ZnS
x
Se1−x
(0 ⩽ x ⩽ 1) by molecular-beam epitaxy
|
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|
1989 |
39 |
10 |
p. 990- 1 p. |
artikel |
271 |
Reflection high-energy electron diffraction studies of principal streak intensity profiles and adatom coverage of (100) GaAs grown by molecular-beam epitaxy
|
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1989 |
39 |
10 |
p. 1003- 1 p. |
artikel |
272 |
Reordering of polycrystalline Pd2Si on epitaxial Pd2Si
|
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1989 |
39 |
10 |
p. 996- 1 p. |
artikel |
273 |
Role of the modifications induced by ion beam irradiation in the optical and conducting properties of polyimide
|
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1989 |
39 |
10 |
p. 985- 1 p. |
artikel |
274 |
Rotary pump backstreaming: an analytical appraisal of practical results and the factors affecting them
|
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1989 |
39 |
10 |
p. 969- 1 p. |
artikel |
275 |
Scanning differential polarization microscope : its use to image linear and circular differential scattering
|
|
|
1989 |
39 |
10 |
p. 1003- 1 p. |
artikel |
276 |
Scanning electron microscopy study of seeded recrystallization of silicon-on-insulator layers with either polycrystalline or epitaxially deposited silicon in the seed windows
|
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1989 |
39 |
10 |
p. 1004- 1 p. |
artikel |
277 |
Scanning positron microbeam
|
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1989 |
39 |
10 |
p. 983- 1 p. |
artikel |
278 |
Scanning tunneling microscopy imaging of microbridges under scanning electron microscopy control
|
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1989 |
39 |
10 |
p. 1005- 1 p. |
artikel |
279 |
Scanning tunneling microscopy of graphite adsorbed metal species and sliding charge-density wave systems
|
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1989 |
39 |
10 |
p. 1005- 1 p. |
artikel |
280 |
Scanning tunneling microscopy topography of electron-beam evaporated niobium thin films in Nb-NbO
x
-Pb tunnel junctions on quartz substrates
|
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1989 |
39 |
10 |
p. 1005- 1 p. |
artikel |
281 |
Secondary ion beam profile calculations in a 252Cf plasma desorption time-of-light mass spectrometer
|
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|
1989 |
39 |
10 |
p. 1000- 1 p. |
artikel |
282 |
Secondary ion mass spectrometry sensitivity factors versus ionization potential and electron affinity for many elements in HgCdTe and CdTe using oxygen and cesium ion beams
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1989 |
39 |
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p. 1002- 1 p. |
artikel |
283 |
Secondary ion yield changes in Si and GaAs due to topography changes during O+
2 or Cs+ ion bombardment
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1989 |
39 |
10 |
p. 986- 1 p. |
artikel |
284 |
Seed shape dependence of Si solid-phase epitaxy : preferential facet growth
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1989 |
39 |
10 |
p. 990- 1 p. |
artikel |
285 |
Self-similar expansions in ion beam fusion
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1989 |
39 |
10 |
p. 999- 1 p. |
artikel |
286 |
Shattering solids by irradiating supercurrent ion beams
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1989 |
39 |
10 |
p. 989- 1 p. |
artikel |
287 |
Silicon and silicon dioxide thermal bonding for silicon-on-insulator applications
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1989 |
39 |
10 |
p. 996- 1 p. |
artikel |
288 |
Simulation of isotopic mass effects in sputtering, II
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1989 |
39 |
10 |
p. 978- 1 p. |
artikel |
289 |
Solid lubricating fluorine-containing polymer film synthesized by perfluoropolyether sputtering
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1989 |
39 |
10 |
p. 975- 1 p. |
artikel |
290 |
Some characteristics of an inverted magnetron cold cathode ionization gauge with dual feedthroughs
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1989 |
39 |
10 |
p. 971- 1 p. |
artikel |
291 |
Specimen damage by nuclear microbeams and its avoidance
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1989 |
39 |
10 |
p. 986- 1 p. |
artikel |
292 |
Spectron finds leak in Oxford street megastore
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1989 |
39 |
10 |
p. 1015-1016 2 p. |
artikel |
293 |
Spectroscopic studies of fluorescent emission in plasma etching of silicon nitride
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1989 |
39 |
10 |
p. 998- 1 p. |
artikel |
294 |
Sputtered cluster mass distributions, thermodynamic equilibrium and critical phenomena
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1989 |
39 |
10 |
p. 978- 1 p. |
artikel |
295 |
Sputtering of insulators
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1989 |
39 |
10 |
p. 976- 1 p. |
artikel |
296 |
Static and dynamic deformations stimulated by ion implantation
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1989 |
39 |
10 |
p. 986- 1 p. |
artikel |
297 |
Stopping powers of Be, Al, Ti, V, Fe, Co, Ni, Cu, Zn, Mo, Rh, Ag, Sn, Ta, Pt and Au for 6.5 MeV protons
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1989 |
39 |
10 |
p. 1001- 1 p. |
artikel |
298 |
Stress distribution in released vacuum-deposited aluminum films
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1989 |
39 |
10 |
p. 974- 1 p. |
artikel |
299 |
Stress modification of NiFe films by ion bombardment concurrent with film growth by alloy evaporation
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1989 |
39 |
10 |
p. 979- 1 p. |
artikel |
300 |
Striations in a gas discharge
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1989 |
39 |
10 |
p. 999- 1 p. |
artikel |
301 |
Structural and electrical properties of silicon nitride films prepared by multipolar plasma-enhanced deposition
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1989 |
39 |
10 |
p. 980- 1 p. |
artikel |
302 |
Structure of reactively sputtered chromium-carbon films
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1989 |
39 |
10 |
p. 975- 1 p. |
artikel |
303 |
Structure of TiN coatings deposited at relatively high rates and low temperatures by magnetron sputtering
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1989 |
39 |
10 |
p. 974- 1 p. |
artikel |
304 |
Study of metal surfaces by scanning tunneling microscopy with field ion microscopy
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1989 |
39 |
10 |
p. 1005- 1 p. |
artikel |
305 |
Superconducting and transport properties and the mixing process in Al/Si multilayer films
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1989 |
39 |
10 |
p. 995- 1 p. |
artikel |
306 |
Surface analysis of bulk polymers using single- and multiple-photon ionization
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1989 |
39 |
10 |
p. 1006- 1 p. |
artikel |
307 |
Surface chemical analysis of polydiacetylene films exposed to electron beam and ultraviolet irradiation
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1989 |
39 |
10 |
p. 1006- 1 p. |
artikel |
308 |
Surface cracking of vitreous fused silica induced by MeV ion beam bombardment
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1989 |
39 |
10 |
p. 987- 1 p. |
artikel |
309 |
Surface effects on the stability of hot cathode ionization gauges
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1989 |
39 |
10 |
p. 971- 1 p. |
artikel |
310 |
Techniques for testing cryopump capacity
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1989 |
39 |
10 |
p. 972- 1 p. |
artikel |
311 |
The application of dynamic recoil mixing to enhance adhesion of gold films on silica substrates
|
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1989 |
39 |
10 |
p. 978- 1 p. |
artikel |
312 |
The deposition rate dependence of plasma polymerization on the radius of curvature of the substrate
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1989 |
39 |
10 |
p. 982- 1 p. |
artikel |
313 |
The design of a versatile scanning proton microprobe of high resolution and efficiency
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1989 |
39 |
10 |
p. 1006- 1 p. |
artikel |
314 |
The development and use of a time-of-flight system to analyse energy spectra produced by a fast atom beam source
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1989 |
39 |
10 |
p. 982- 1 p. |
artikel |
315 |
The effect of a thin ultraviolet grown oxide on metal-GaAs contacts
|
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1989 |
39 |
10 |
p. 989- 1 p. |
artikel |
316 |
The effect of cooling rate on the surface reconstruction of annealed silicon(111) studied by scanning tunneling microscopy and low-energy electron diffraction
|
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1989 |
39 |
10 |
p. 1004- 1 p. |
artikel |
317 |
The effect of stoichiometry on sputtering deuterium retention and surface damage in titanium carbide films
|
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1989 |
39 |
10 |
p. 974- 1 p. |
artikel |
318 |
The effects of p
+ implant species and dose on black gold formation
|
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1989 |
39 |
10 |
p. 988- 1 p. |
artikel |
319 |
The electron-beam column for a high-dose and high-voltage electronbeam exposure system Ex-7
|
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1989 |
39 |
10 |
p. 983- 1 p. |
artikel |
320 |
The emerging technologies of oil-free vacuum pumps
|
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1989 |
39 |
10 |
p. 970- 1 p. |
artikel |
321 |
The formation of an amorphous silicide by thermal reaction of sputter-deposited Ti and Si layers
|
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1989 |
39 |
10 |
p. 996- 1 p. |
artikel |
322 |
The friction and wear of ion-implanted ceramics: the role of adhesion
|
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1989 |
39 |
10 |
p. 978- 1 p. |
artikel |
323 |
The influence of heavier gases in pumping helium and hydrogen in an ion pump
|
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1989 |
39 |
10 |
p. 972- 1 p. |
artikel |
324 |
The influence of thermal relaxation on implantation induced disorder accumulation
|
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1989 |
39 |
10 |
p. 987- 1 p. |
artikel |
325 |
The interaction of copper and nickel : nickel monolayers on a Cu{100} single crystal
|
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1989 |
39 |
10 |
p. 994- 1 p. |
artikel |
326 |
The metastable C49 structure in sputtered TiSi2 thin films
|
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1989 |
39 |
10 |
p. 977- 1 p. |
artikel |
327 |
The microbeam facility at the University of Montreal
|
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1989 |
39 |
10 |
p. 983- 1 p. |
artikel |
328 |
The molecular drag pump: principle, characteristics, and applications
|
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1989 |
39 |
10 |
p. 970- 1 p. |
artikel |
329 |
The oxidation of PtSi, Pt2Si and polycrystalline silicon in ultrahigh vacuum residual gas
|
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1989 |
39 |
10 |
p. 994- 1 p. |
artikel |
330 |
The properties of aluminum thin films sputter deposited at elevated temperatures
|
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1989 |
39 |
10 |
p. 976- 1 p. |
artikel |
331 |
Thermal stability and Bi diffusion in the implanted AZ111 photoresist
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1989 |
39 |
10 |
p. 985- 1 p. |
artikel |
332 |
Thermochemical modeling of interfacial reactions and selective deposition at growth from the vapor
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1989 |
39 |
10 |
p. 994- 1 p. |
artikel |
333 |
Thin palladium films prepared by metal-organic plasma-enhanced chemical vapour deposition
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1989 |
39 |
10 |
p. 981- 1 p. |
artikel |
334 |
Thirty years of turbomolecular pumps: a review and recent developments
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1989 |
39 |
10 |
p. 970- 1 p. |
artikel |
335 |
Time of flight measurements of the ratio of radial diffusion coefficient and mobility for electron swarms in helium, argon, neon and krypton at high E/N
|
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1989 |
39 |
10 |
p. 999- 1 p. |
artikel |
336 |
Tip contamination effects in ambient pressure scanning tunneling microscopy imaging of graphite
|
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1989 |
39 |
10 |
p. 1005- 1 p. |
artikel |
337 |
Titanium silicides formed by rapid thermal vacuum processing
|
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1989 |
39 |
10 |
p. 997- 1 p. |
artikel |
338 |
Torvac now offers comprehensive furnace capability
|
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1989 |
39 |
10 |
p. 1016- 1 p. |
artikel |
339 |
Total and partial pressure measurement in vacuum systems
|
Steckelmacher, W. |
|
1989 |
39 |
10 |
p. 1021- 1 p. |
artikel |
340 |
“Tracking” tunneling microscopy
|
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1989 |
39 |
10 |
p. 1004- 1 p. |
artikel |
341 |
Transient annealing of Sn+ implanted GaAs
|
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1989 |
39 |
10 |
p. 995- 1 p. |
artikel |
342 |
Transient boron diffusion in ion-implanted crystalline and amorphous silicon
|
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1989 |
39 |
10 |
p. 987- 1 p. |
artikel |
343 |
Transverse straggling of MeV oxygen ions implanted in silicon
|
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1989 |
39 |
10 |
p. 987- 1 p. |
artikel |
344 |
Tritium removal from noble gas streams
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1989 |
39 |
10 |
p. 972- 1 p. |
artikel |
345 |
Tungsten-rhenium alloys as diffusion barriers between aluminum and silicon
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1989 |
39 |
10 |
p. 993- 1 p. |
artikel |
346 |
Tunneling microscopy of NbSe2 in air
|
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1989 |
39 |
10 |
p. 1004- 1 p. |
artikel |
347 |
Uhv linear actuators for NSLS beam lines
|
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1989 |
39 |
10 |
p. 982- 1 p. |
artikel |
348 |
UHV system aids MIT's research into high temperature superconductors
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1989 |
39 |
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p. 1017-1018 2 p. |
artikel |
349 |
Ultrahigh vacuum in situ transmission electron microscopy observations of molecular-beam epitaxially grown InSb(
111
)
|
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1989 |
39 |
10 |
p. 990- 1 p. |
artikel |
350 |
Unconstrained optimization in LEED : application to Ge(111) (1 x 1)-H
|
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1989 |
39 |
10 |
p. 1003- 1 p. |
artikel |
351 |
Uniform composition TeSe film preparation from alloy sources
|
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1989 |
39 |
10 |
p. 973- 1 p. |
artikel |
352 |
Use of porous plugs in the transition flow range for the calibration of vacuum gauges
|
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1989 |
39 |
10 |
p. 970- 1 p. |
artikel |
353 |
Vacuum furnace for steel powder atomising
|
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1989 |
39 |
10 |
p. 1012- 1 p. |
artikel |
354 |
Vacuum pumping system for the Lanzhou cyclotron
|
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1989 |
39 |
10 |
p. 970- 1 p. |
artikel |
355 |
Vacuum vapor deposited thin films of a perylene dicarboximide derivative: microstructure versus deposition parameters
|
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1989 |
39 |
10 |
p. 973- 1 p. |
artikel |
356 |
Valence-band photoemission and electron-energy-loss studies of reactive ion etched silicon dioxide
|
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1989 |
39 |
10 |
p. 997- 1 p. |
artikel |
357 |
Vapor-deposited superconducting lanthanum sulfide films
|
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1989 |
39 |
10 |
p. 973- 1 p. |
artikel |
358 |
Variation of yield with thickness in SIMS and PDMS : measurements of secondary ion emission from organized molecular films
|
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1989 |
39 |
10 |
p. 1002- 1 p. |
artikel |
359 |
Variations in the reflectance of TiN, ZrN and HfN
|
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1989 |
39 |
10 |
p. 981- 1 p. |
artikel |
360 |
VAT series 14 gate valves
|
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|
1989 |
39 |
10 |
p. 1010- 1 p. |
artikel |
361 |
Veeco instruments appoints new UK sales manager
|
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1989 |
39 |
10 |
p. 1017- 1 p. |
artikel |
362 |
Wet-chemical etching of III–V semiconductors
|
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1989 |
39 |
10 |
p. 998- 1 p. |
artikel |
363 |
X-ray photoemission spectroscopy characterization of silicon surfaces after CF4/H2 magnetron ion etching : comparisons to reactive ion etching
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1989 |
39 |
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p. 1006- 1 p. |
artikel |