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                             363 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Accessories increase leak detector's versatility 1989
39 10 p. 1012-
1 p.
artikel
2 A comparative study of silicon deposition from SiCl4 in cold plasma using argon, H2 or Ar+H2 1989
39 10 p. 980-
1 p.
artikel
3 A complete range of turbo control and power supplies 1989
39 10 p. 1013-
1 p.
artikel
4 Activities for the construction of a new Heidelberg proton microprobe 1989
39 10 p. 983-
1 p.
artikel
5 A generalized approach to vacuum system automation 1989
39 10 p. 972-
1 p.
artikel
6 A high ionization efficiency source for partially ionized beam deposition 1989
39 10 p. 983-
1 p.
artikel
7 A high-performance scanning tunneling microscope 1989
39 10 p. 1005-
1 p.
artikel
8 A model for reactive sputtering with magnetrons Larsson, T.
1989
39 10 p. 949-954
6 p.
artikel
9 A Monte Carlo investigation of the runaway of H+ ions in helium 1989
39 10 p. 983-
1 p.
artikel
10 Amorphous phase formation in Ni3B by low-temperature deuterium implantation 1989
39 10 p. 986-
1 p.
artikel
11 Analysis of frequency responses for different rotor configurations of small turbomolecular pumps 1989
39 10 p. 970-
1 p.
artikel
12 Analysis of grain growth due to ion irradiation of thin films 1989
39 10 p. 995-
1 p.
artikel
13 An evaluation of the composition of the residual atmosphere above a commercial dry pump 1989
39 10 p. 970-
1 p.
artikel
14 A new symmetric scanning tunneling microscope design 1989
39 10 p. 1005-
1 p.
artikel
15 A new type of hollow cathode discharge gun used in ion beam coating apparatus and theory analysis Shulin, Zhang
1989
39 10 p. 945-947
3 p.
artikel
16 A new ultrafine groove fabrication method utilizing electron cyclotron resonance plasma deposition and reactive ion etching 1989
39 10 p. 998-
1 p.
artikel
17 An impulsive collision model for the vibrational and rotational excitation of sputtered molecules 1989
39 10 p. 978-
1 p.
artikel
18 An in situ annealing study of lead implanted single crystal calcium titanate 1989
39 10 p. 988-
1 p.
artikel
19 Anisotropy of low-energy ion etching via electron cyclotron resonance plasma 1989
39 10 p. 997-
1 p.
artikel
20 Annealed Czochralski grown silicon crystals : a new material for the monochromatisation of synchrotron radiation and X-rays above 60 keV 1989
39 10 p. 1006-1007
2 p.
artikel
21 Annealing behavior of refractory metal multilayers on Si : the Mo/Ti and W/Ti systems 1989
39 10 p. 996-
1 p.
artikel
22 Annealing behavior of Si implanted InP 1989
39 10 p. 985-
1 p.
artikel
23 Annealing behaviour of extremely low energy beryllium implantation into Ga0.47In0.53As 1989
39 10 p. 986-
1 p.
artikel
24 Annoucements 1989
39 10 p. 1019-1020
2 p.
artikel
25 An 18O study of oxygen exchange phenomena during microwave-discharge plasma oxidation of silicon 1989
39 10 p. 1000-
1 p.
artikel
26 A novel heteroepitaxy method of Ge films on CaF2 by electron beam exposure 1989
39 10 p. 992-
1 p.
artikel
27 A phenomenological model for surface deposition kinetics during plasma and sputter deposition of amorphous hydrogenated silicon 1989
39 10 p. 978-
1 p.
artikel
28 A photoemission study of H2O adsorption on a vicinal Si(100) surface 1989
39 10 p. 971-
1 p.
artikel
29 A physical model for eliminating instabilities in reactive sputtering 1989
39 10 p. 977-
1 p.
artikel
30 Application of reflectance difference spectroscopy to molecular-beam epitaxy growth of GaAs and AlAs 1989
39 10 p. 1003-
1 p.
artikel
31 Application of the scanning tunneling microscope to insulating surfaces 1989
39 10 p. 1004-
1 p.
artikel
32 Applications of a high spatial resolution combined AES/SIMS instrument Bishop, HE
1989
39 10 p. 929-939
11 p.
artikel
33 A rotating substrate holder for the production of uniform thin amorphous films and multilayer structures Taylor, JSG
1989
39 10 p. 967-968
2 p.
artikel
34 A simple and novel technique for the deposition of conducting tin dioxide films 1989
39 10 p. 977-
1 p.
artikel
35 A solid state oxygen source for uhv 1989
39 10 p. 984-
1 p.
artikel
36 A source replenishment device for vacuum deposition 1989
39 10 p. 973-
1 p.
artikel
37 A study of the adhesion of vacuum-evaporated polyethylene films to aluminium 1989
39 10 p. 973-
1 p.
artikel
38 A time-of-flight quadrupole mass spectrometer system for measurements of thermal decomposition 1989
39 10 p. 971-
1 p.
artikel
39 A time resolved study of velocity distributions in pulsed molecular beams 1989
39 10 p. 983-
1 p.
artikel
40 Atomic beam scattering 1989
39 10 p. 1003-
1 p.
artikel
41 Auger electron spectroscopy : method for the accurate measurement of signal and noise and a figure of merit for the performance of AES instrument sensitivity 1989
39 10 p. 1003-
1 p.
artikel
42 Automatic leak detector and needs no liquid nitrogen 1989
39 10 p. 1014-
1 p.
artikel
43 A vacuum measurement system with Penning gauge for high voltage application 1989
39 10 p. 971-
1 p.
artikel
44 Balzers introduces all-in-one cryo preparation chamber 1989
39 10 p. 1014-
1 p.
artikel
45 Balzers publishes 1988 literature index 1989
39 10 p. 1018-
1 p.
artikel
46 Broad ion beam modeling for extraction optics optimization and etching process simulation 1989
39 10 p. 982-
1 p.
artikel
47 Buried layers of silicon oxy-nitride fabricated using ion beam synthesis 1989
39 10 p. 985-
1 p.
artikel
48 Channeling simulation in Ni3Al 1989
39 10 p. 1001-
1 p.
artikel
49 Characteristics of titanium arc evaporation processes 1989
39 10 p. 973-
1 p.
artikel
50 Characterization and thermal desorption spectroscopy study on a new, low outgassing material surface for improved ultrahigh vacuum uses 1989
39 10 p. 972-
1 p.
artikel
51 Characterization of a saddle field fast atom beam source 1989
39 10 p. 984-
1 p.
artikel
52 Characterization of cosputtered tungsten carbide thin films 1989
39 10 p. 975-
1 p.
artikel
53 Characterization of H+ ion irradiated silicon carbides 1989
39 10 p. 988-
1 p.
artikel
54 Characterization of molecular-beam epitaxially grown CdTe surfaces by high-energy electron diffraction and synchrotron radiation photo-emission spectroscopy 1989
39 10 p. 989-
1 p.
artikel
55 Characterization of PECVD deposited silicon oxynitride thin films 1989
39 10 p. 981-
1 p.
artikel
56 Characterization of SrF2 thin films and of SrF2/InP structures 1989
39 10 p. 1002-
1 p.
artikel
57 Characterization of the silicon-on-insulator material formed by high-dose oxygen implantation using spectroscopic ellipsometry 1989
39 10 p. 1000-
1 p.
artikel
58 Charge transfer adsorption in silicon vapor-phase epitaxial growth 1989
39 10 p. 991-
1 p.
artikel
59 Charge-transfer dipole moments at the Si-SiO2 interface 1989
39 10 p. 996-
1 p.
artikel
60 Chemically enhanced ion etching on refractory metal silicides 1989
39 10 p. 997-
1 p.
artikel
61 Chemical reactions at the Si/GaAs(110) and Si/InP(110) interfaces : effects on valence-band discontinuity measurements 1989
39 10 p. 993-
1 p.
artikel
62 Coherent meson production relativistic heavy-ion collision 1989
39 10 p. 1000-
1 p.
artikel
63 Concentric tube scanning tunneling microscope 1989
39 10 p. 1004-
1 p.
artikel
64 Controlled etching of silicate glasses by pulsed ultraviolet laser radiation 1989
39 10 p. 998-
1 p.
artikel
65 Control of microstructure and properties of copper films using ion-assited deposition 1989
39 10 p. 980-
1 p.
artikel
66 Cosputtered W75C25 thin film diffusion barriers 1989
39 10 p. 977-
1 p.
artikel
67 Cross-sectional transmission electron microscope study of intrinsic solid-phase epitaxial growth in self-ion-implanted (001) Si 1989
39 10 p. 986-
1 p.
artikel
68 Cryo-Torr product folder 1989
39 10 p. 1012-
1 p.
artikel
69 Crystallization of SiO by HE+ bombardment 1989
39 10 p. 992-
1 p.
artikel
70 Current-voltage relations in magnetrons 1989
39 10 p. 976-
1 p.
artikel
71 Defects in SiO2 in buried-oxide structures formed by O+ implantation 1989
39 10 p. 985-
1 p.
artikel
72 Density of ZnS thin films grown by atomic layer epitaxy 1989
39 10 p. 992-
1 p.
artikel
73 Dependence of microstructure of TiN coatings on their thickness 1989
39 10 p. 1006-
1 p.
artikel
74 Deposition of device quality silicon dioxide thin films by remote plasma enhanced chemical vapor deposition 1989
39 10 p. 981-
1 p.
artikel
75 Deposition of hard carbon films by the r.f. glow discharge method 1989
39 10 p. 982-
1 p.
artikel
76 Deposition of TiB2 films by a co-sputtering method 1989
39 10 p. 974-
1 p.
artikel
77 Deposition of vanadium oxide films by direct-current magnetron reactive sputtering 1989
39 10 p. 977-
1 p.
artikel
78 Deposition techniques for the preparation of thin film nuclear targets 1989
39 10 p. 973-
1 p.
artikel
79 Depth of origin of sputtered atoms: experimental and theoretical study of Cu/Ru(0001) 1989
39 10 p. 975-
1 p.
artikel
80 Design and performance of an UHV beamline to produce low and hyperthermal energy ion beams 1989
39 10 p. 983-
1 p.
artikel
81 Diamond crystal growth by plasma chemical vapor deposition 1989
39 10 p. 980-
1 p.
artikel
82 Diamond films by ion-assisted deposition at room temperature 1989
39 10 p. 980-
1 p.
artikel
83 Diffusion model for Ohmic contacts to GaAs 1989
39 10 p. 993-
1 p.
artikel
84 Diffusion of boron, phosphorus and arsenic implanted in thin films of cobalt disilicide 1989
39 10 p. 995-
1 p.
artikel
85 Diffusion of Cu into rf-sputtered iron oxide films 1989
39 10 p. 976-
1 p.
artikel
86 Displacement damage in LiNbO3 1989
39 10 p. 986-
1 p.
artikel
87 Distribution of energy in polymers due to incident electrons and protons 1989
39 10 p. 1001-
1 p.
artikel
88 Editorial: Software survey section 1989
39 10 p. ix-x
nvt p.
artikel
89 Edwards news no 17 1989
39 10 p. 1019-
1 p.
artikel
90 Effect of grain size on the oxidation kinetics of sputtered titanium nitride films 1989
39 10 p. 977-
1 p.
artikel
91 Effect of mixing ions on the formation process of β-SiC fabricated by ion beam mixing 1989
39 10 p. 994-
1 p.
artikel
92 Effect of resputtering on composition of WSix films deposited by multilayer sputtering 1989
39 10 p. 976-
1 p.
artikel
93 Effects of dry etching on the electrical properties of silicon 1989
39 10 p. 998-
1 p.
artikel
94 Effects of energy straggling on surface analysis with fast ion beams 1989
39 10 p. 1001-
1 p.
artikel
95 Effects of ion implantation on poly(dimethylsilylene-co-methyl-phenylsyilylene 1989
39 10 p. 986-
1 p.
artikel
96 Effects of plasma stripping on the oxidation states of aluminum-silicon and tungsten surfaces 1989
39 10 p. 997-
1 p.
artikel
97 Electrical and optical properties of indium tin oxide thin films prepared on low-temperature substrates by rf magnetron sputtering under an applied external magnetic field 1989
39 10 p. 978-
1 p.
artikel
98 Electrical damage induced by ion beam etching of GaAs 1989
39 10 p. 997-
1 p.
artikel
99 Electric-field-assisted deposition of optical coatings 1989
39 10 p. 981-
1 p.
artikel
100 Electron-beam lithography system using a quadrupole triplet 1989
39 10 p. 998-
1 p.
artikel
101 Electron emission from electroformed carbon films 1989
39 10 p. 1002-
1 p.
artikel
102 Electron energy distributions in oxygen microwave plasmas 1989
39 10 p. 999-
1 p.
artikel
103 Electronic transitions in surface and near-surface radiation effects 1989
39 10 p. 984-
1 p.
artikel
104 Energy dependence of concentration of implants and its chemical consequences 1989
39 10 p. 984-
1 p.
artikel
105 Energy distributions of molecular gas ions generated in a special glow-discharge source Wroński, Z
1989
39 10 p. 941-944
4 p.
artikel
106 Epitaxial growth and X-ray structural characterization of Zn1−x Fe x Se films on GaAs(001) 1989
39 10 p. 991-
1 p.
artikel
107 Epitaxial silicon reactor technology—a review 1989
39 10 p. 989-
1 p.
artikel
108 Etching on polar (111) surfaces of CdTe crystals studied with Auger electron spectroscopy 1989
39 10 p. 1004-
1 p.
artikel
109 Evidence of implantation doping in polyacetylene 1989
39 10 p. 985-
1 p.
artikel
110 Extension of thermocouple gauge sensitivity to atmospheric pressure 1989
39 10 p. 971-
1 p.
artikel
111 Fluctuations during JET discharges with H-mode 1989
39 10 p. 999-
1 p.
artikel
112 Focusing protons and light ions to micron and submicron dimensions 1989
39 10 p. 984-
1 p.
artikel
113 Formation and thermal stability of amorphous CuZr thin films deposited by coevaporation 1989
39 10 p. 974-
1 p.
artikel
114 Formation of buried nitride layers by ion implantation 1989
39 10 p. 984-
1 p.
artikel
115 Formation of paramagnetic defects in high-purity silica by high-energy ions 1989
39 10 p. 988-
1 p.
artikel
116 Formation of some hierarchy in amorphous structure during the crystallization of vacuum-deposited amorphous semiconductor films 1989
39 10 p. 974-
1 p.
artikel
117 Fundamental irradiation processes relevant to plasma-surface technology 1989
39 10 p. 979-
1 p.
artikel
118 GaAs surface cleaning by thermal oxidation and sublimation in molecular-beam epitaxy 1989
39 10 p. 991-
1 p.
artikel
119 Ga0.5In0.5P/GaAs interfaces by organometallic vapor-phase epitaxy 1989
39 10 p. 992-
1 p.
artikel
120 GaP/Si heteroepitaxy by complex ion beam sputtering 1989
39 10 p. 993-
1 p.
artikel
121 Geometrical and surface effects in the sputtering process 1989
39 10 p. 975-
1 p.
artikel
122 Graham Kinney pumps for Saudi 1989
39 10 p. 1015-
1 p.
artikel
123 Grazing X-ray reflectometry and Rutherford backscattering : two complementary techniques for the study of thin film mixing 1989
39 10 p. 1002-
1 p.
artikel
124 Growth and characterization of AlGaInAs lattice matched to InP grown by molecular-beam epitaxy 1989
39 10 p. 991-
1 p.
artikel
125 Growth and characterization of Si1−x Ge x and Ge epilayers on (100) Si 1989
39 10 p. 991-
1 p.
artikel
126 Growth and properties of doped CdTe films grown by photoassisted molecular-beam epitaxy 1989
39 10 p. 989-
1 p.
artikel
127 Growth and structure of chemical vapor deposited silicon carbide from methyltrichlorosilane and hydrogen in the temperature range of 1100 to 1400°C 1989
39 10 p. 991-
1 p.
artikel
128 Growth, atomic structure, and oxidation of chromium overlayers on W(110) 1989
39 10 p. 974-
1 p.
artikel
129 Growth dynamics of aluminum nitride and aluminum oxide thin films synthesized by ion-assisted deposition 1989
39 10 p. 980-
1 p.
artikel
130 Growth kinetics and step density in reflection high-energy electron diffraction during molecular-beam epitaxy 1989
39 10 p. 993-
1 p.
artikel
131 Growth of Al and Al nitride films in N2−Ne and N2−(Ne+Ar) discharges: construction of a ternary gas phase diagram 1989
39 10 p. 982-
1 p.
artikel
132 Growth of epitaxial CaSi2 films on Si(111) 1989
39 10 p. 989-
1 p.
artikel
133 Growth processes in amorphous metallic films: a computer simulation 1989
39 10 p. 974-
1 p.
artikel
134 Hard coatings Bunshah, RF
1989
39 10 p. 955-965
11 p.
artikel
135 Helium diffraction from (2 x n) structures on Si(001) 1989
39 10 p. 1003-
1 p.
artikel
136 High dose uranium ion implantation into silicon 1989
39 10 p. 987-
1 p.
artikel
137 High performance hoses and ‘O’-rings from safelab 1989
39 10 p. 1010-
1 p.
artikel
138 High performance SIMS 1989
39 10 p. 1011-
1 p.
artikel
139 High-precision reticle making by electron-beam lithography 1989
39 10 p. 998-
1 p.
artikel
140 High temperatures stability of plasma-enhanced chemically vapour deposited titanium silicide due to two-step rapid thermal annealing 1989
39 10 p. 981-
1 p.
artikel
141 Hollow-anode discharge with axial-magnetic field as an electron beam source 1989
39 10 p. 984-
1 p.
artikel
142 Image charge focusing of relativistic electron beams 1989
39 10 p. 1004-
1 p.
artikel
143 Improved adhesion of solid lubricating films with ion-beam mixing 1989
39 10 p. 979-
1 p.
artikel
144 Improvements to and characterization of GaInAs/AlInAs hetero-interfaces grown by molecular-beam epitaxy 1989
39 10 p. 990-
1 p.
artikel
145 Inert gas entrapment in films produced by ion-assisted physical vapour deposition processes 1989
39 10 p. 981-
1 p.
artikel
146 Influence of boron related defects on activation of silicon implanted into undoped semi-insulating GaAs 1989
39 10 p. 987-
1 p.
artikel
147 Influence of deposition parameters on the properties of boron-doped amorphous silicon-carbide films 1989
39 10 p. 980-
1 p.
artikel
148 Influence of deposition rate on properties of reactively sputtered TiNx films 1989
39 10 p. 976-
1 p.
artikel
149 Influence of substrate misorientation on defect and impurity incorporation in GaAs/AlGaAs heterostructures grown by molecular-beam epitaxy 1989
39 10 p. 990-
1 p.
artikel
150 In situ investigation of TiN formation on top of TiSi2 1989
39 10 p. 977-
1 p.
artikel
151 Integrated thermal vacuum sensor with extended range 1989
39 10 p. 969-
1 p.
artikel
152 Interactions between interstitial atoms in silicon : arsenic-argon-boron and boron-argon-phosphorus 1989
39 10 p. 995-
1 p.
artikel
153 Interdiffusion and structural relaxation in Mo/Si multilayer films 1989
39 10 p. 995-
1 p.
artikel
154 Interfacial reactions in the Ti/GaAs system 1989
39 10 p. 993-
1 p.
artikel
155 Intermixing of Co/Gd x O y thin films on Kapton polyimide 1989
39 10 p. 994-
1 p.
artikel
156 Investigation of cosputtered W-C thin films as diffusion barriers 1989
39 10 p. 976-
1 p.
artikel
157 Investigation of the void structure in amorphous germanium thin films as a function of low-energy ion bombardment 1989
39 10 p. 980-
1 p.
artikel
158 Ion beam bombardment effects during film deposition 1989
39 10 p. 979-
1 p.
artikel
159 Ion beam mixing of GaAs with films of Al, Si and their nitrides 1989
39 10 p. 996-
1 p.
artikel
160 Ion beam self-sputtering using a cathodic arc ion source 1989
39 10 p. 975-
1 p.
artikel
161 Ion emission from plasma-focus facilities 1989
39 10 p. 999-
1 p.
artikel
162 Ion implantation, a method for fabricating light guides in polymers 1989
39 10 p. 987-
1 p.
artikel
163 Ion implantation and annealing of crystalline oxides and ceramic materials 1989
39 10 p. 988-
1 p.
artikel
164 Ion implanters: chemical and radiation safety 1989
39 10 p. 982-
1 p.
artikel
165 Ion-induced mixing at Nb/Fe2O3 interface studied by CEMS technique 1989
39 10 p. 995-
1 p.
artikel
166 Ionizing beam-induced adhesion enhancement and interface chemistry for AuGaAs 1989
39 10 p. 979-
1 p.
artikel
167 Ion microscopy using magnifying ion transport systems and position sensitive detectors 1989
39 10 p. 1002-
1 p.
artikel
168 Ion mixing and thermochemical properties of tracers in Ag 1989
39 10 p. 996-
1 p.
artikel
169 Ion mixing of Al2O3 and Al films on SiO2 1989
39 10 p. 994-
1 p.
artikel
170 Ion sputtering yield measurements for submicrometer thin films 1989
39 10 p. 975-
1 p.
artikel
171 Issues in molecular-beam epitaxy kinetics of compound semiconductor based heterostructures 1989
39 10 p. 991-
1 p.
artikel
172 Jacques Friedel to receive 1988 Von Hippel award of Materials Research Society 1989
39 10 p. 1019-
1 p.
artikel
173 Kinetics and mechanism of reaction at room temperature in thin Au/metal couples 1989
39 10 p. 994-
1 p.
artikel
174 Kinetics of growth coalescence of In/GaAs 1989
39 10 p. 973-
1 p.
artikel
175 Large grain polycrystalline silicon by low-temperature annealing of low-pressure chemical vapor deposited amorphous silicon films 1989
39 10 p. 992-
1 p.
artikel
176 Lattice site occupation of compound forming elements implanted into aluminium 1989
39 10 p. 989-
1 p.
artikel
177 Light-enhanced molecular-beam epitaxial growth in II–VI and III–V compound semiconductors 1989
39 10 p. 989-
1 p.
artikel
178 Localized epitaxial growth of IrSi3 on (111) and (001) silicon 1989
39 10 p. 992-
1 p.
artikel
179 Low-energy electronic stopping for boron in beryllium 1989
39 10 p. 1001-
1 p.
artikel
180 Low-energy neutral/ion backscattering at As/Si(001) 1989
39 10 p. 1006-
1 p.
artikel
181 Low power, 3.2-cm, efficient microwave electron cyclotron resonant ion source 1989
39 10 p. 984-
1 p.
artikel
182 Low-temperature annealing of As-implanted Ge 1989
39 10 p. 991-
1 p.
artikel
183 Low-temperature atomic force microscopy 1989
39 10 p. 1004-
1 p.
artikel
184 Low temperature growth of AIN and Al2O3 films by the simultaneous use of a microwave ion source and an ionized cluster beam system Hiroshi Takaoka et al, Thin Solid Films, 157, 1988, 143–158 1989
39 10 p. 981-
1 p.
artikel
185 Lubricating of mechanisms for vacuum service 1989
39 10 p. 972-
1 p.
artikel
186 Magnetic field gradient effects on ion energy for electron cyclotron resonance microwave plasma stream 1989
39 10 p. 1000-
1 p.
artikel
187 Magnetron plasma diagnostics and processing implications 1989
39 10 p. 1000-
1 p.
artikel
188 Magnetron-plasma ion beam etching : a new dry etching technique 1989
39 10 p. 997-
1 p.
artikel
189 Measurement of the electronic stopping power of gold for protons in a large solid angle transmission geometry 1989
39 10 p. 1001-
1 p.
artikel
190 Mechanisms of contaminant particle production, migration, and adhesion 1989
39 10 p. 979-
1 p.
artikel
191 Medium-energy ion scattering studies of relaxation at metal surfaces 1989
39 10 p. 1003-
1 p.
artikel
192 Medium resolution atmospheric pressure ionization mass spectrometer 1989
39 10 p. 971-
1 p.
artikel
193 Metal/semiconductor interfaces on SnO2(110) 1989
39 10 p. 993-
1 p.
artikel
194 Metastable bismuth-iron alloy films synthesized with ion mixing and magnetron copsuttering 1989
39 10 p. 996-
1 p.
artikel
195 Methods of surface analysis (techniques and applications) Steckelmacher, W.
1989
39 10 p. 1021-
1 p.
artikel
196 Microbeam line with 1.5 MeV helium ions and protons at Osaka 1989
39 10 p. 982-
1 p.
artikel
197 Microstructural characterization of nitrogen implanted 440C steel 1989
39 10 p. 988-
1 p.
artikel
198 Mixing of Pt-René N4 alloy under Pt+ bombardment 1989
39 10 p. 995-
1 p.
artikel
199 Model calculation for the tunnel current from a tungsten tip to a Ni(100) surface with a chemisorbed oxygen atom 1989
39 10 p. 971-
1 p.
artikel
200 Molecular-beam epitaxial growth and characterization of pseudomorphic InAs/In0.52Al0.48As quantum wells 1989
39 10 p. 990-
1 p.
artikel
201 Molecular-beam epitaxy growth of GaAs/InAs structures on (001)InP by alternating III/V fluxes 1989
39 10 p. 990-
1 p.
artikel
202 Molecular flow in complex vacuum systems Steckelmacher, W.
1989
39 10 p. 1022-
1 p.
artikel
203 Molecular stream epitaxy and the role of the boundary layer in chemical vapor deposition 1989
39 10 p. 990-
1 p.
artikel
204 Molecular structure evolution under krypton ion irradiation of an electropolymerised polyacrylonitrile film 1989
39 10 p. 985-
1 p.
artikel
205 Monte Carlo simulation of ion transport through rf glow-discharge sheaths 1989
39 10 p. 999-
1 p.
artikel
206 Morphology and structure of gold silver and copper layers obtained by sputtering during ion bombardment of targets from these metals 1989
39 10 p. 981-
1 p.
artikel
207 Multipole lenses and their application in nuclear microprobe lens systems 1989
39 10 p. 984-
1 p.
artikel
208 Narrowband filters for precision monochromatic light sources 1989
39 10 p. 1009-
1 p.
artikel
209 New Cambridge headquarters for Torvac and Wentgate 1989
39 10 p. 1015-
1 p.
artikel
210 New Graham Kinney technical brochure 1989
39 10 p. 1015-
1 p.
artikel
211 New microwave ion source for multiply charged ion beam production 1989
39 10 p. 982-
1 p.
artikel
212 New MKS flowmeter calibration system 1989
39 10 p. 1009-
1 p.
artikel
213 New patent 1989
39 10 p. i-vi
nvt p.
artikel
214 New Pirani gauge from MKS 1989
39 10 p. 1009-
1 p.
artikel
215 New Pirani vacuum sensor has integral transmitter 1989
39 10 p. 1013-1014
2 p.
artikel
216 News for users of high vacuum systems—vacuum leadthoughs now on ISO standard flanges 1989
39 10 p. 1012-1013
2 p.
artikel
217 Nondiffusive velocity broadening in ion energy analyzer operation 1989
39 10 p. 1000-
1 p.
artikel
218 Novel approach for particle velocity and size measurement under plasma conditions 1989
39 10 p. 1000-
1 p.
artikel
219 Novel microstructures for the in situ measurement of mechanical properties of thin films 1989
39 10 p. 979-
1 p.
artikel
220 Observation of microfabricated patterns by scanning tunneling microscopy 1989
39 10 p. 1005-
1 p.
artikel
221 On-line measurement of the spatial dose uniformity in ion implantation processes 1989
39 10 p. 987-
1 p.
artikel
222 On the calculation of the overall transmission probability of a variable blade length multiple-stage turbomolecular pump 1989
39 10 p. 969-
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artikel
223 On the energy distribution of doubly charged atomic ions emitted from liquid metal ion sources 1989
39 10 p. 983-
1 p.
artikel
224 On the properties of physically vapour-deposited TiAlVN coatings 1989
39 10 p. 973-
1 p.
artikel
225 O+, O+ 2, O+ 3 and O+ 4 ions in Ar-O2 sputtering discharges : comments on “Oxidation mechanism in rf CO2 plasma”, Vacuum, 36, 85 (1986) 1989
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artikel
226 Optical and structural characteristics of Al2O3 films deposited by the reactive ionized cluster beam method 1989
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1 p.
artikel
227 Optical investigations of ion implant damage in silicon 1989
39 10 p. 987-
1 p.
artikel
228 Optically absorbing layers on ion beam modified polymers: a study of their evolution and properties 1989
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1 p.
artikel
229 Optical properties of molecular beam epitaxially grown GaAs1−x Sb x (0 < x < 0.5) on GaAs and InP substrates 1989
39 10 p. 990-
1 p.
artikel
230 Optimisation of the properties of a microfocused ion beam system 1989
39 10 p. 982-
1 p.
artikel
231 Organometallic chemical vapor phase deposition of “Mn2Si” 1989
39 10 p. 1002-
1 p.
artikel
232 Oscillating vane for measuring speed of gas flow 1989
39 10 p. 970-
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artikel
233 Oxford applied research ‘new review’ winter 1989
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artikel
234 Phenomena produced by ion bombardment in plasma-assisted etching environments 1989
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1 p.
artikel
235 Photoluminescence spectra of highly doped Al x Ga1−x As grown by molecular-beam epitaxy 1989
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1 p.
artikel
236 Photoreflectance study of boron ion-implanted {100} CdTe 1989
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1 p.
artikel
237 Physics at surfaces Steckelmacher, W.
1989
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2 p.
artikel
238 Plasma-assisted etching of tungsten films : a quartz-crystal micro-balance study 1989
39 10 p. 998-
1 p.
artikel
239 Plasma deposition of amorphous hydrogenated carbon films on III–V semiconductors 1989
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1 p.
artikel
240 Plasma enhanced chemical vapor deposition of polycrystalline diamond and diamondlike films 1989
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1 p.
artikel
241 Plasma etching with a microwave cavity plasma disk source 1989
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1 p.
artikel
242 Plasma oscillation modes in a low-pressure plane positive column 1989
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1 p.
artikel
243 Plasma polymerized thin films containing small silver particles 1989
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1 p.
artikel
244 Platinum silicide contact to arsenic-doped polycrystalline silicon 1989
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1 p.
artikel
245 Preparation and characteristics of ZnS thin films by intense pulsed ion beam 1989
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1 p.
artikel
246 Preparation properties and applications of boron nitride thin films 1989
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1 p.
artikel
247 Pressure stability in reactive magnetron sputtering 1989
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1 p.
artikel
248 Primary vacuum pumps for the fusion reactor fuel cycle 1989
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1 p.
artikel
249 Properties of AIN films deposited on N-implanted Al 1989
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1 p.
artikel
250 Properties of hard tungsten films prepared by sputtering 1989
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1 p.
artikel
251 Properties of ion-beam-sputtered Ni/Fe artificial lattice film 1989
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1 p.
artikel
252 Properties of polycrystalline silicon grown on insulating subtrates by electron beam gun evaporation 1989
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1 p.
artikel
253 Proposal for a sensitive leak test telescope 1989
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1 p.
artikel
254 Pumping mechanism for N2 gas in a triode ion pump with A1100 aluminum cathode 1989
39 10 p. 969-
1 p.
artikel
255 Quantitative analysis and depth profiling of rare gases in solids by secondary-ion mass spectrometry : detection of (CsR)+ molecular ions (R = rare gas) 1989
39 10 p. 1002-
1 p.
artikel
256 Quantitative analysis of channeling data for the determination of the amorphous fraction in ion bombarded single crystals 1989
39 10 p. 1001-
1 p.
artikel
257 Quantitative measurements with quadrupole mass spectrometers: important specifications for reliable measurements 1989
39 10 p. 971-
1 p.
artikel
258 Radiation effects in thin films of high T c superconductors 1989
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1 p.
artikel
259 Radiation effects on metal-insulator-semiconductor diode energetic ion detectors 1989
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1 p.
artikel
260 (111) random and 〈110〉 channeled implantation profiles and range parameters in Hg1−x Cd x Te 1989
39 10 p. 1001-
1 p.
artikel
261 Range distribution of implanted cesium ions in silicon dioxide films 1989
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1 p.
artikel
262 Range measurements and thermal stability study of AZ111 photoresist implanted with Bi ions 1989
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1 p.
artikel
263 Range profiles of Ar implanted into C films 1989
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1 p.
artikel
264 Range profiles of helium in solids 1989
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1 p.
artikel
265 Reaction of atomic and molecular bromine with aluminum 1989
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1 p.
artikel
266 Reactive and chemically assisted ion beam etching of Si and SiO2 1989
39 10 p. 997-
1 p.
artikel
267 Reactive and nonreactive ion mixing of Ti films on carbon substrates 1989
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1 p.
artikel
268 Reconsidering the mechanisms of laser sputtering with Knudsen-layer formation taken into account 1989
39 10 p. 976-
1 p.
artikel
269 Reflection electron microscopy observation of the Si-SiO2 interface 1989
39 10 p. 996-
1 p.
artikel
270 Reflection high-energy electron diffraction observations during growth of ZnS x Se1−x (0 ⩽ x ⩽ 1) by molecular-beam epitaxy 1989
39 10 p. 990-
1 p.
artikel
271 Reflection high-energy electron diffraction studies of principal streak intensity profiles and adatom coverage of (100) GaAs grown by molecular-beam epitaxy 1989
39 10 p. 1003-
1 p.
artikel
272 Reordering of polycrystalline Pd2Si on epitaxial Pd2Si 1989
39 10 p. 996-
1 p.
artikel
273 Role of the modifications induced by ion beam irradiation in the optical and conducting properties of polyimide 1989
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1 p.
artikel
274 Rotary pump backstreaming: an analytical appraisal of practical results and the factors affecting them 1989
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1 p.
artikel
275 Scanning differential polarization microscope : its use to image linear and circular differential scattering 1989
39 10 p. 1003-
1 p.
artikel
276 Scanning electron microscopy study of seeded recrystallization of silicon-on-insulator layers with either polycrystalline or epitaxially deposited silicon in the seed windows 1989
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1 p.
artikel
277 Scanning positron microbeam 1989
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1 p.
artikel
278 Scanning tunneling microscopy imaging of microbridges under scanning electron microscopy control 1989
39 10 p. 1005-
1 p.
artikel
279 Scanning tunneling microscopy of graphite adsorbed metal species and sliding charge-density wave systems 1989
39 10 p. 1005-
1 p.
artikel
280 Scanning tunneling microscopy topography of electron-beam evaporated niobium thin films in Nb-NbO x -Pb tunnel junctions on quartz substrates 1989
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1 p.
artikel
281 Secondary ion beam profile calculations in a 252Cf plasma desorption time-of-light mass spectrometer 1989
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1 p.
artikel
282 Secondary ion mass spectrometry sensitivity factors versus ionization potential and electron affinity for many elements in HgCdTe and CdTe using oxygen and cesium ion beams 1989
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1 p.
artikel
283 Secondary ion yield changes in Si and GaAs due to topography changes during O+ 2 or Cs+ ion bombardment 1989
39 10 p. 986-
1 p.
artikel
284 Seed shape dependence of Si solid-phase epitaxy : preferential facet growth 1989
39 10 p. 990-
1 p.
artikel
285 Self-similar expansions in ion beam fusion 1989
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1 p.
artikel
286 Shattering solids by irradiating supercurrent ion beams 1989
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1 p.
artikel
287 Silicon and silicon dioxide thermal bonding for silicon-on-insulator applications 1989
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1 p.
artikel
288 Simulation of isotopic mass effects in sputtering, II 1989
39 10 p. 978-
1 p.
artikel
289 Solid lubricating fluorine-containing polymer film synthesized by perfluoropolyether sputtering 1989
39 10 p. 975-
1 p.
artikel
290 Some characteristics of an inverted magnetron cold cathode ionization gauge with dual feedthroughs 1989
39 10 p. 971-
1 p.
artikel
291 Specimen damage by nuclear microbeams and its avoidance 1989
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1 p.
artikel
292 Spectron finds leak in Oxford street megastore 1989
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2 p.
artikel
293 Spectroscopic studies of fluorescent emission in plasma etching of silicon nitride 1989
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1 p.
artikel
294 Sputtered cluster mass distributions, thermodynamic equilibrium and critical phenomena 1989
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1 p.
artikel
295 Sputtering of insulators 1989
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1 p.
artikel
296 Static and dynamic deformations stimulated by ion implantation 1989
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1 p.
artikel
297 Stopping powers of Be, Al, Ti, V, Fe, Co, Ni, Cu, Zn, Mo, Rh, Ag, Sn, Ta, Pt and Au for 6.5 MeV protons 1989
39 10 p. 1001-
1 p.
artikel
298 Stress distribution in released vacuum-deposited aluminum films 1989
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1 p.
artikel
299 Stress modification of NiFe films by ion bombardment concurrent with film growth by alloy evaporation 1989
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1 p.
artikel
300 Striations in a gas discharge 1989
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1 p.
artikel
301 Structural and electrical properties of silicon nitride films prepared by multipolar plasma-enhanced deposition 1989
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1 p.
artikel
302 Structure of reactively sputtered chromium-carbon films 1989
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1 p.
artikel
303 Structure of TiN coatings deposited at relatively high rates and low temperatures by magnetron sputtering 1989
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1 p.
artikel
304 Study of metal surfaces by scanning tunneling microscopy with field ion microscopy 1989
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1 p.
artikel
305 Superconducting and transport properties and the mixing process in Al/Si multilayer films 1989
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1 p.
artikel
306 Surface analysis of bulk polymers using single- and multiple-photon ionization 1989
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1 p.
artikel
307 Surface chemical analysis of polydiacetylene films exposed to electron beam and ultraviolet irradiation 1989
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1 p.
artikel
308 Surface cracking of vitreous fused silica induced by MeV ion beam bombardment 1989
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1 p.
artikel
309 Surface effects on the stability of hot cathode ionization gauges 1989
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1 p.
artikel
310 Techniques for testing cryopump capacity 1989
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1 p.
artikel
311 The application of dynamic recoil mixing to enhance adhesion of gold films on silica substrates 1989
39 10 p. 978-
1 p.
artikel
312 The deposition rate dependence of plasma polymerization on the radius of curvature of the substrate 1989
39 10 p. 982-
1 p.
artikel
313 The design of a versatile scanning proton microprobe of high resolution and efficiency 1989
39 10 p. 1006-
1 p.
artikel
314 The development and use of a time-of-flight system to analyse energy spectra produced by a fast atom beam source 1989
39 10 p. 982-
1 p.
artikel
315 The effect of a thin ultraviolet grown oxide on metal-GaAs contacts 1989
39 10 p. 989-
1 p.
artikel
316 The effect of cooling rate on the surface reconstruction of annealed silicon(111) studied by scanning tunneling microscopy and low-energy electron diffraction 1989
39 10 p. 1004-
1 p.
artikel
317 The effect of stoichiometry on sputtering deuterium retention and surface damage in titanium carbide films 1989
39 10 p. 974-
1 p.
artikel
318 The effects of p + implant species and dose on black gold formation 1989
39 10 p. 988-
1 p.
artikel
319 The electron-beam column for a high-dose and high-voltage electronbeam exposure system Ex-7 1989
39 10 p. 983-
1 p.
artikel
320 The emerging technologies of oil-free vacuum pumps 1989
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1 p.
artikel
321 The formation of an amorphous silicide by thermal reaction of sputter-deposited Ti and Si layers 1989
39 10 p. 996-
1 p.
artikel
322 The friction and wear of ion-implanted ceramics: the role of adhesion 1989
39 10 p. 978-
1 p.
artikel
323 The influence of heavier gases in pumping helium and hydrogen in an ion pump 1989
39 10 p. 972-
1 p.
artikel
324 The influence of thermal relaxation on implantation induced disorder accumulation 1989
39 10 p. 987-
1 p.
artikel
325 The interaction of copper and nickel : nickel monolayers on a Cu{100} single crystal 1989
39 10 p. 994-
1 p.
artikel
326 The metastable C49 structure in sputtered TiSi2 thin films 1989
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1 p.
artikel
327 The microbeam facility at the University of Montreal 1989
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1 p.
artikel
328 The molecular drag pump: principle, characteristics, and applications 1989
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1 p.
artikel
329 The oxidation of PtSi, Pt2Si and polycrystalline silicon in ultrahigh vacuum residual gas 1989
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1 p.
artikel
330 The properties of aluminum thin films sputter deposited at elevated temperatures 1989
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1 p.
artikel
331 Thermal stability and Bi diffusion in the implanted AZ111 photoresist 1989
39 10 p. 985-
1 p.
artikel
332 Thermochemical modeling of interfacial reactions and selective deposition at growth from the vapor 1989
39 10 p. 994-
1 p.
artikel
333 Thin palladium films prepared by metal-organic plasma-enhanced chemical vapour deposition 1989
39 10 p. 981-
1 p.
artikel
334 Thirty years of turbomolecular pumps: a review and recent developments 1989
39 10 p. 970-
1 p.
artikel
335 Time of flight measurements of the ratio of radial diffusion coefficient and mobility for electron swarms in helium, argon, neon and krypton at high E/N 1989
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artikel
336 Tip contamination effects in ambient pressure scanning tunneling microscopy imaging of graphite 1989
39 10 p. 1005-
1 p.
artikel
337 Titanium silicides formed by rapid thermal vacuum processing 1989
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1 p.
artikel
338 Torvac now offers comprehensive furnace capability 1989
39 10 p. 1016-
1 p.
artikel
339 Total and partial pressure measurement in vacuum systems Steckelmacher, W.
1989
39 10 p. 1021-
1 p.
artikel
340 “Tracking” tunneling microscopy 1989
39 10 p. 1004-
1 p.
artikel
341 Transient annealing of Sn+ implanted GaAs 1989
39 10 p. 995-
1 p.
artikel
342 Transient boron diffusion in ion-implanted crystalline and amorphous silicon 1989
39 10 p. 987-
1 p.
artikel
343 Transverse straggling of MeV oxygen ions implanted in silicon 1989
39 10 p. 987-
1 p.
artikel
344 Tritium removal from noble gas streams 1989
39 10 p. 972-
1 p.
artikel
345 Tungsten-rhenium alloys as diffusion barriers between aluminum and silicon 1989
39 10 p. 993-
1 p.
artikel
346 Tunneling microscopy of NbSe2 in air 1989
39 10 p. 1004-
1 p.
artikel
347 Uhv linear actuators for NSLS beam lines 1989
39 10 p. 982-
1 p.
artikel
348 UHV system aids MIT's research into high temperature superconductors 1989
39 10 p. 1017-1018
2 p.
artikel
349 Ultrahigh vacuum in situ transmission electron microscopy observations of molecular-beam epitaxially grown InSb( 111 ) 1989
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1 p.
artikel
350 Unconstrained optimization in LEED : application to Ge(111) (1 x 1)-H 1989
39 10 p. 1003-
1 p.
artikel
351 Uniform composition TeSe film preparation from alloy sources 1989
39 10 p. 973-
1 p.
artikel
352 Use of porous plugs in the transition flow range for the calibration of vacuum gauges 1989
39 10 p. 970-
1 p.
artikel
353 Vacuum furnace for steel powder atomising 1989
39 10 p. 1012-
1 p.
artikel
354 Vacuum pumping system for the Lanzhou cyclotron 1989
39 10 p. 970-
1 p.
artikel
355 Vacuum vapor deposited thin films of a perylene dicarboximide derivative: microstructure versus deposition parameters 1989
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1 p.
artikel
356 Valence-band photoemission and electron-energy-loss studies of reactive ion etched silicon dioxide 1989
39 10 p. 997-
1 p.
artikel
357 Vapor-deposited superconducting lanthanum sulfide films 1989
39 10 p. 973-
1 p.
artikel
358 Variation of yield with thickness in SIMS and PDMS : measurements of secondary ion emission from organized molecular films 1989
39 10 p. 1002-
1 p.
artikel
359 Variations in the reflectance of TiN, ZrN and HfN 1989
39 10 p. 981-
1 p.
artikel
360 VAT series 14 gate valves 1989
39 10 p. 1010-
1 p.
artikel
361 Veeco instruments appoints new UK sales manager 1989
39 10 p. 1017-
1 p.
artikel
362 Wet-chemical etching of III–V semiconductors 1989
39 10 p. 998-
1 p.
artikel
363 X-ray photoemission spectroscopy characterization of silicon surfaces after CF4/H2 magnetron ion etching : comparisons to reactive ion etching 1989
39 10 p. 1006-
1 p.
artikel
                             363 gevonden resultaten
 
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