nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A calorimeter-Faraday cup to measure energy content of ion beams
|
Luzzi, G |
|
1984 |
34 |
1-2 |
p. 235-238 4 p. |
artikel |
2 |
A comparison of SIMS with other techniques based on ion-beam solid interactions
|
Werner, HW |
|
1984 |
34 |
1-2 |
p. 83-101 19 p. |
artikel |
3 |
A compilation of mass spectra from liquid metal sources
|
Broughton, D |
|
1984 |
34 |
1-2 |
p. 275-279 5 p. |
artikel |
4 |
A high-current beam transport facility for hollow beams
|
Krejcik, P |
|
1984 |
34 |
1-2 |
p. 11-15 5 p. |
artikel |
5 |
A liquid metal source of caesium ions for secondary ion mass spectrometry
|
Prewett, PD |
|
1984 |
34 |
1-2 |
p. 107-111 5 p. |
artikel |
6 |
A low energy ion beam system for thermal evolution measurements of damage in ion bombarded single crystals
|
Bailey, P |
|
1984 |
34 |
1-2 |
p. 239-244 6 p. |
artikel |
7 |
An ion beam system for ion scattering, bombardment induced light emission and secondary ion mass spectrometry
|
Armour, DG |
|
1984 |
34 |
1-2 |
p. 217-221 5 p. |
artikel |
8 |
Atom beam source
|
Franks, J |
|
1984 |
34 |
1-2 |
p. 259-261 3 p. |
artikel |
9 |
Beam-induced broadening effects in sputter depth profiling
|
Wittmaack, Klaus |
|
1984 |
34 |
1-2 |
p. 119-137 19 p. |
artikel |
10 |
Charge-changing collisions in the JET neutral injection bending magnets
|
Nielsen, BR |
|
1984 |
34 |
1-2 |
p. 37-40 4 p. |
artikel |
11 |
Computational models of liquid metal ion sources
|
Evans, GA |
|
1984 |
34 |
1-2 |
p. 47-50 4 p. |
artikel |
12 |
CORDIS—an improved high-current ion source for gases
|
Keller, R |
|
1984 |
34 |
1-2 |
p. 31-35 5 p. |
artikel |
13 |
Current status of the Daresbury Isotope separator
|
MacGregor, IJD |
|
1984 |
34 |
1-2 |
p. 3-6 4 p. |
artikel |
14 |
Damage effects in silicon and MNOS structures caused by beams of ionized and neutral argon atoms with energies below 5 keV
|
Bangert, U |
|
1984 |
34 |
1-2 |
p. 163-166 4 p. |
artikel |
15 |
Deterministic models of ion erosion, reflection and redeposition
|
Smith, R |
|
1984 |
34 |
1-2 |
p. 175-180 6 p. |
artikel |
16 |
Editorial Board
|
|
|
1984 |
34 |
1-2 |
p. IFC- 1 p. |
artikel |
17 |
Effect of plasma imperfections on the divergence and emittance of the beam extracted from duoplasmatron sources
|
Aubert, J |
|
1984 |
34 |
1-2 |
p. 229-234 6 p. |
artikel |
18 |
Effects of Ga ion irradiation from a liquid metal ion source
|
Moore, VJ |
|
1984 |
34 |
1-2 |
p. 189-191 3 p. |
artikel |
19 |
Energy distribution, intensity modulation and emittance of the beam extracted from a duopigatron source
|
Grandchamp, JP |
|
1984 |
34 |
1-2 |
p. 67-71 5 p. |
artikel |
20 |
Energy loss spectra for single electron capture in Ar3+-He collisions
|
Kamber, EY |
|
1984 |
34 |
1-2 |
p. 63-65 3 p. |
artikel |
21 |
Field emission deposition: ion assisted deposition using liquid metal sources
|
Mahony, C |
|
1984 |
34 |
1-2 |
p. 301-304 4 p. |
artikel |
22 |
High power beams for neutral injection heating
|
Martin, AR |
|
1984 |
34 |
1-2 |
p. 17-24 8 p. |
artikel |
23 |
HV-gap geometries for high current heavy ion acceleration and beam transport
|
Spädtke, P |
|
1984 |
34 |
1-2 |
p. 73-82 10 p. |
artikel |
24 |
Introduction
|
Grant, WA |
|
1984 |
34 |
1-2 |
p. 1- 1 p. |
artikel |
25 |
Ion beam etching GaAs for integrated optical applications
|
Webb, AP |
|
1984 |
34 |
1-2 |
p. 159-162 4 p. |
artikel |
26 |
JET Milestone
|
|
|
1984 |
34 |
1-2 |
p. 333- 1 p. |
artikel |
27 |
Measurement of ion beam parameters with electrostatic induction electrodes
|
Szajnowski, WJ |
|
1984 |
34 |
1-2 |
p. 285-289 5 p. |
artikel |
28 |
Measurements of space charge compensation of ion beams
|
Kreisler, P |
|
1984 |
34 |
1-2 |
p. 215-216 2 p. |
artikel |
29 |
Micro ion beams for fabrication
|
Ahmed, H |
|
1984 |
34 |
1-2 |
p. 41- 1 p. |
artikel |
30 |
Microwave ion source for high current metal beams
|
Noriyuki Sakudo, |
|
1984 |
34 |
1-2 |
p. 245-249 5 p. |
artikel |
31 |
Nanometre structures in semiconductors formed by low energy ion implantation
|
Shannon, JM |
|
1984 |
34 |
1-2 |
p. 193-197 5 p. |
artikel |
32 |
Neutral emissions from liquid metal ion sources
|
Thompson, SP |
|
1984 |
34 |
1-2 |
p. 223-228 6 p. |
artikel |
33 |
New patents
|
|
|
1984 |
34 |
1-2 |
p. 335-339 5 p. |
artikel |
34 |
Observations of electron stimulated desorption during SIMS profiling of insulators
|
Kilner, JA |
|
1984 |
34 |
1-2 |
p. 139-143 5 p. |
artikel |
35 |
Oxygen distributions in synthesized SiO2 layers formed by high dose O+ implantation into silicon
|
Hemment, PLF |
|
1984 |
34 |
1-2 |
p. 203-208 6 p. |
artikel |
36 |
Physical and chemical mechanisms in the ion-enhanced etching of silicon
|
Coburn, JW |
|
1984 |
34 |
1-2 |
p. 157-158 2 p. |
artikel |
37 |
Plasma enhanced deposition of ‘silicon nitride’ for use as an encapsulant for silicon ion-implanted gallium arsenide
|
Bartle, DC |
|
1984 |
34 |
1-2 |
p. 315-320 6 p. |
artikel |
38 |
Production of a dense low energy positive hydrogen ion beam
|
van Bommel, PJM |
|
1984 |
34 |
1-2 |
p. 25-29 5 p. |
artikel |
39 |
Pulsed Cs beam development for the BNL polarized H− source
|
Alessi, JG |
|
1984 |
34 |
1-2 |
p. 7-10 4 p. |
artikel |
40 |
Reactive ion plating of TiO2
|
Howson, RP |
|
1984 |
34 |
1-2 |
p. 291-294 4 p. |
artikel |
41 |
Recent developments in high current liquid metal ion sources for space propulsion
|
Bartoli, C. |
|
1984 |
34 |
1-2 |
p. 43-46 4 p. |
artikel |
42 |
Recoil profiles produced by ion implantation through dielectric layers
|
Blunt, RT |
|
1984 |
34 |
1-2 |
p. 281-284 4 p. |
artikel |
43 |
Shallow ion implantation in gallium arsenide
|
Grange, JD |
|
1984 |
34 |
1-2 |
p. 199-201 3 p. |
artikel |
44 |
SIMS of solid hydrogen
|
Clampitt, R |
|
1984 |
34 |
1-2 |
p. 113-117 5 p. |
artikel |
45 |
Small, simple and high efficiency arsenic ion source
|
Lejeune, C |
|
1984 |
34 |
1-2 |
p. 251-257 7 p. |
artikel |
46 |
Some mechanisms of sputtered negative ion production
|
Underwood, MC |
|
1984 |
34 |
1-2 |
p. 153-156 4 p. |
artikel |
47 |
Surface damage of PET sheet in rf bias ion plating
|
Suzuki, K |
|
1984 |
34 |
1-2 |
p. 181-187 7 p. |
artikel |
48 |
Surface morphology of Si(100), GaAs(100) and InP(100) following O2 + and Cs+ ion bombardment
|
Duncan, S |
|
1984 |
34 |
1-2 |
p. 145-151 7 p. |
artikel |
49 |
The application of liquid metal ion sources to SIMS
|
Waugh, AR |
|
1984 |
34 |
1-2 |
p. 103-106 4 p. |
artikel |
50 |
The Center for Professional Advancement
|
|
|
1984 |
34 |
1-2 |
p. 333-334 2 p. |
artikel |
51 |
The characteristics of the ion and neutral fluxes incident on the substrate in an ion plating discharge
|
Armour, DG |
|
1984 |
34 |
1-2 |
p. 295-300 6 p. |
artikel |
52 |
The deposition of inert gas ions in poly-N-vinylcarbazole (PVK)
|
Barbaszewski, T |
|
1984 |
34 |
1-2 |
p. 329-332 4 p. |
artikel |
53 |
The effect of ion species on morphological structure development of ion bombarded (1131) single crystal Cu
|
Carter, G |
|
1984 |
34 |
1-2 |
p. 167-173 7 p. |
artikel |
54 |
The effects of plasma and ion beam processing on the properties of n-GaAs Schottky diodes
|
Smith, PJ |
|
1984 |
34 |
1-2 |
p. 209-213 5 p. |
artikel |
55 |
The epitaxial synthesis of diamond by the deposition of low energy carbon ions
|
Freeman, JH |
|
1984 |
34 |
1-2 |
p. 305-314 10 p. |
artikel |
56 |
The influence of ion bombardment on the composition of reactively deposited alloy oxide films
|
Ridge, Martin I |
|
1984 |
34 |
1-2 |
p. 327- 1 p. |
artikel |
57 |
The ion optics of low-energy ion beams
|
Drummond, IW |
|
1984 |
34 |
1-2 |
p. 51-61 11 p. |
artikel |
58 |
The measurement of charge transfer cross-sections for a variety of ions on air and argon
|
Kheyrandish, H |
|
1984 |
34 |
1-2 |
p. 269-273 5 p. |
artikel |
59 |
The 11th International Symposium on Discharges and Electrical Insulation in Vacuum
|
|
|
1984 |
34 |
1-2 |
p. 334- 1 p. |
artikel |
60 |
The use of an LMIS and argon ion sputtering in studies of thin film strain gauges
|
Taylor, AG |
|
1984 |
34 |
1-2 |
p. 321-325 5 p. |
artikel |
61 |
Topography evolution in sputtered stratified media and in spatio-time variable ion flux conditions
|
Carter, G |
|
1984 |
34 |
1-2 |
p. 263-267 5 p. |
artikel |