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                             175 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Adherence of ion beam sputter deposited metal films on H-13 steel 1982
32 4 p. 214-
1 p.
artikel
2 4973. A first order diffusion approximation to atomic redistribution during ion bombardment of solids, II. Finite range approximation 1982
32 4 p. 218-
1 p.
artikel
3 4976. A gap reduction technique for obtaining submicron geometries utilizing redeposition effect 1982
32 4 p. 219-
1 p.
artikel
4 5021. Analysis of low-energy electron diffraction intensities from ZnS(110) 1982
32 4 p. 223-
1 p.
artikel
5 4887. An improved controller for mercury diffusion pumps 1982
32 4 p. 209-
1 p.
artikel
6 4891. A nonevaporable low temperature activatable getter material 1982
32 4 p. 210-
1 p.
artikel
7 4974. A novel technique for metal-silicide formation 1982
32 4 p. 218-
1 p.
artikel
8 4912. Anti-reflection coatings for thin-film polycrystalline CdS/Cu2S solar cells 1982
32 4 p. 212-
1 p.
artikel
9 4895. Application of a simple automatic null method for vapour pressure measurements by the torsion-Knudsen effusion-recoil technique 1982
32 4 p. 210-
1 p.
artikel
10 4892. A simple graphical method of pressure determination in a McLeod gauge. 1982
32 4 p. 210-
1 p.
artikel
11 4868. A small-scale cw HF laser based on a hollow-cathode discharge 1982
32 4 p. 208-
1 p.
artikel
12 5000. A study of the initial oxidation of polycrystalline Si using surface analysis techniques 1982
32 4 p. 221-
1 p.
artikel
13 5032. Atomic structure of laser annealed Si(111)(1 × 1) 1982
32 4 p. 224-
1 p.
artikel
14 4942. Atom probe analysis of rf-sputtered a-Si:H films 1982
32 4 p. 215-
1 p.
artikel
15 4816. A TSTA compound cryopump 1982
32 4 p. 208-
1 p.
artikel
16 4996. A two-dimensional velocity analyser for electrons produced in laboratory plasma experiments 1982
32 4 p. 221-
1 p.
artikel
17 5023. Auger analysis of surface deposits formed by exposure to plasma discharges in Doublet III 1982
32 4 p. 223-
1 p.
artikel
18 4997. Auger electron spectroscopy (AES) for surface analysis 1982
32 4 p. 221-
1 p.
artikel
19 5001. Auger lineshapes of solid surfaces—Atomic, bandlike, or something else? 1982
32 4 p. 221-
1 p.
artikel
20 4995. A velocity filter for ions of low energy 1982
32 4 p. 220-
1 p.
artikel
21 4982. Beam source for moderately fast neutral alkali atoms 1982
32 4 p. 219-
1 p.
artikel
22 4987. Beams steering and diffraction of magnetostatic backward volume waves 1982
32 4 p. 220-
1 p.
artikel
23 4871. Buried heterostructure lasers in the GaInAsP system: design 1982
32 4 p. 208-
1 p.
artikel
24 5007. Characterization of thin films for laser systems using surface analytical techniques 1982
32 4 p. 221-222
2 p.
artikel
25 5009. Chemical effects in ion scattering spectroscopy 1982
32 4 p. 222-
1 p.
artikel
26 5024. Chemical information from Auger electron spectroscopy 1982
32 4 p. 223-
1 p.
artikel
27 5002. Co-adsorbed phases of hydrogen and oxygen on W(001) 1982
32 4 p. 221-
1 p.
artikel
28 4946. Confinement studies on a plasma generated by CO2 laser irradiation of isolated D2 pellets within the CLEO stellarator 1982
32 4 p. 215-216
2 p.
artikel
29 4985. Continuous flow reflux oven as the source of an effusive molecular Cs beam 1982
32 4 p. 220-
1 p.
artikel
30 4939. Control system dynamics using glow discharge mass spectroscopy for thin film sputtering 1982
32 4 p. 215-
1 p.
artikel
31 4961. Critical curves for implanted garnet films in the presence of a demagnetizing field 1982
32 4 p. 217-
1 p.
artikel
32 4898. Cryopumped beam mass spectrometry 1982
32 4 p. 211-
1 p.
artikel
33 4992. CW far-infrared laser-scattering apparatus for plasma wave studies 1982
32 4 p. 220-
1 p.
artikel
34 4888. Cyclic pressure fluctuations above rotary pumps and their effects on pumping speed measurements 1982
32 4 p. 210-
1 p.
artikel
35 4972. Defect formation in heavily doped Si upon irradiation 1982
32 4 p. 218-
1 p.
artikel
36 4938. Dependence of the surface morphology of copper coated laser fusion targets on the dc sputter source 1982
32 4 p. 215-
1 p.
artikel
37 4879. Design and preliminary tests of the liquid helium cooled MFTF cryopumping system 1982
32 4 p. 209-
1 p.
artikel
38 4967. Detection of residual damage in 75As implanted silicon single crystal by secondary ion mass spectrometry 1982
32 4 p. 218-
1 p.
artikel
39 Diagnostic system of the Lawrence Livermore National Laboratory two-stage light-gas gun 1982
32 4 p. 220-
1 p.
artikel
40 4870. Diffraction losses and mode structure of equivalent TEM00 optical resonators 1982
32 4 p. 208-
1 p.
artikel
41 4914. Digital thickness monitor using only one crystal oscillator 1982
32 4 p. 212-
1 p.
artikel
42 Directory of manufacturers of vacuum plant, components and associated equipment in the UK—1982 Yarwood, J
1982
32 4 p. 185-205
21 p.
artikel
43 4947. Dislocations in turbulent ionization waves 1982
32 4 p. 216-
1 p.
artikel
44 4878. Doublet III neutral beam cryopumping system 1982
32 4 p. 209-
1 p.
artikel
45 4889. Effect of hydrogen glow discharge conditioning on Zr/Al getter pumps 1982
32 4 p. 210-
1 p.
artikel
46 4935. Effect of ion bombardment during deposition on magnetic film properties 1982
32 4 p. 214-
1 p.
artikel
47 4966. Effect of ion implantation on CdSe thin film transistors 1982
32 4 p. 218-
1 p.
artikel
48 5014. Effect of oxygen implantation upon secondary ion yields 1982
32 4 p. 222-
1 p.
artikel
49 Effects of annealing in Hg vapour on the properties of rf-sputtered thin films of (Hg1-x Cd x)Te 1982
32 4 p. 213-
1 p.
artikel
50 4962. Effects of dosage and annealing on the magnetic behaviour of ion- implanted garnet films 1982
32 4 p. 217-
1 p.
artikel
51 Effects of sputtering on the surface composition of niobium oxides 1982
32 4 p. 214-
1 p.
artikel
52 4953. Electron energy distribution in CO and HeCO discharges: I 1982
32 4 p. 216-
1 p.
artikel
53 5030. Electronic states of Si(111) surfaces 1982
32 4 p. 224-
1 p.
artikel
54 4999. Electron microscopy study of the ferroelectric domains and domain wall structure in PbZr0.52 Ti0.48 O3 1982
32 4 p. 221-
1 p.
artikel
55 Energy spectrum diagnostics for collectively accelerated proton beams 1982
32 4 p. 220-
1 p.
artikel
56 4980. Field-emission liquid-metal ion source and triode ion gun 1982
32 4 p. 219-
1 p.
artikel
57 5508. Fourier analysis of linear surface kinetics in reactive molecular beam scattering 1982
32 4 p. 222-
1 p.
artikel
58 4860. Free convection flow through a porous medium bounded by a vertical surface 1982
32 4 p. 207-
1 p.
artikel
59 4862. Gas flow in the column of a TIG welding arc 1982
32 4 p. 207-
1 p.
artikel
60 4940. Glow discharge mass spectrometry of sputtered tantalum nitride 1982
32 4 p. 215-
1 p.
artikel
61 4909. Grain boundary diffusion in thin film couples 1982
32 4 p. 212-
1 p.
artikel
62 4948. High-energy electron distribution in an electron-beam-generated argon plasma 1982
32 4 p. 216-
1 p.
artikel
63 4971. High-purity thermal treatment of silicon 1982
32 4 p. 218-
1 p.
artikel
64 High rate deposition of transparent conducting films by modified reactive planar magnetron sputtering of Cd2Sn alloy 1982
32 4 p. 213-
1 p.
artikel
65 5015. Hydrogen depth profiling using SIMS—Problems and their solutions 1982
32 4 p. 222-
1 p.
artikel
66 4945. Hydrogen isotope analysis by quadrupole mass spectrometry 1982
32 4 p. 215-
1 p.
artikel
67 4963. Implantability of small bubble diameter garnet films 1982
32 4 p. 217-
1 p.
artikel
68 4933. Improved step coverage by ion beam resputtering 1982
32 4 p. 214-
1 p.
artikel
69 4915. Impurities-related memory traps in silicon nitride thin films 1982
32 4 p. 212-
1 p.
artikel
70 Indium doped cadmium sulfide films deposited by cylindrical magnetron reactive sputtering 1982
32 4 p. 213-
1 p.
artikel
71 4957. Influence of ion bombardment and intermediate layers on the adherence of gold to oxide substrates 1982
32 4 p. 217-
1 p.
artikel
72 4861. Influence of velocity gradients on measurements of velocity and streamwise vorticity with hot-wire X-array probes 1982
32 4 p. 207-
1 p.
artikel
73 4944. In-line production system for sputter deposition of graded index solar absorbing films 1982
32 4 p. 215-
1 p.
artikel
74 4955. Instrument to measure stratospheric ozone with high resolution 1982
32 4 p. 216-
1 p.
artikel
75 Internal stresses in amorphous silicon films deposited by cylindrical magnetron sputtering using Ne, Ar, Kr, Xe and Ar + H2 1982
32 4 p. 213-
1 p.
artikel
76 4873. Interrupted pumpdown of a vacuum system 1982
32 4 p. 208-
1 p.
artikel
77 5011. Intrinsic secondary ion emission from binary alloys during Ar+ bombardment 1982
32 4 p. 222-
1 p.
artikel
78 4959. Investigation of plasma etching mechanisms using beams of reactive gas ions 1982
32 4 p. 217-
1 p.
artikel
79 Ion beam deposition of special film structures 1982
32 4 p. 214-
1 p.
artikel
80 4977. Ion-beam-induced-current (IBIC) monitoring of uniform and selective ion-etching processes in layered structures 1982
32 4 p. 219-
1 p.
artikel
81 4978. Ion extraction from a plasma 1982
32 4 p. 219-
1 p.
artikel
82 4969. Ion implanted species dependence in silicon oxidation 1982
32 4 p. 218-
1 p.
artikel
83 4920. Ionization of atomic clusters sputterd from TiO2 and SrTiO3 surfaces 1982
32 4 p. 213-
1 p.
artikel
84 4988. Large acceptance angle retarding-potential analysers 1982
32 4 p. 220-
1 p.
artikel
85 4965. Laser annealing and epitaxy 1982
32 4 p. 217-218
2 p.
artikel
86 4964. Laser annealing of epitaxial garnet films under controlled atmospheres 1982
32 4 p. 217-
1 p.
artikel
87 5020. LEED intensity analysis of the structure of Al on GaAs(110) 1982
32 4 p. 223-
1 p.
artikel
88 4984. Liquid metal source of gold ions 1982
32 4 p. 219-
1 p.
artikel
89 4908. Low pressure CVD of III-V compounds 1982
32 4 p. 212-
1 p.
artikel
90 5016. Magnetically suspended cross-correlation chopper in molecular beam- surface experiments 1982
32 4 p. 223-
1 p.
artikel
91 4993. Measurement of ion energy distribution in an orbitron device 1982
32 4 p. 220-
1 p.
artikel
92 4921. Measurement of neutral and ion sputtering yields by matrix isolation spectroscopy 1982
32 4 p. 213-
1 p.
artikel
93 4896. Measurement of neutral gas density with ionization gauges in plasma physics research 1982
32 4 p. 210-
1 p.
artikel
94 4884. Mechanical boosters on clean or corrosive applications 1982
32 4 p. 209-
1 p.
artikel
95 4917. Mechanical properties of chemical vapour deposited coatings for fusion reactor application 1982
32 4 p. 212-
1 p.
artikel
96 4937. Metal coatings for laser fusion targets by electroplating 1982
32 4 p. 215-
1 p.
artikel
97 4906. Metallic coating of microspheres 1982
32 4 p. 211-
1 p.
artikel
98 4968. Microstructure of beam-annealed silicon 1982
32 4 p. 218-
1 p.
artikel
99 4899. Molecular and radiation transmissivities of chevron type baffles for cryopumping 1982
32 4 p. 211-
1 p.
artikel
100 5010. Molecular secondary ion mass spectrometry (SIMS) 1982
32 4 p. 222-
1 p.
artikel
101 4941. Mössbauer characterization of reactively sputtered iron nitride films 1982
32 4 p. 215-
1 p.
artikel
102 5017. New type of position sensitive photomultiplier 1982
32 4 p. 223-
1 p.
artikel
103 4894. Nitrogen sensitivities of a sample of commercial hot cathode ionization gauge tubes 1982
32 4 p. 210-
1 p.
artikel
104 4890. Nonevaporable getter for ion beam fusion 1982
32 4 p. 210-
1 p.
artikel
105 4952. Nonlinear dispersion relation of finite amplitude ionization waves: I. Theory and numerical calculation 1982
32 4 p. 216-
1 p.
artikel
106 Novel charged particle analyser for momentum determination in the multichanneling mode: I. Design aspects and electron/ion optical properties 1982
32 4 p. 220-
1 p.
artikel
107 4093. Novel device structures by molecular beam epitaxy 1982
32 4 p. 211-
1 p.
artikel
108 4867. Oscillating feedback currents in cylindrical electron multiplier 1982
32 4 p. 208-
1 p.
artikel
109 4913. Oscillatory behaviour of resistivity with thickness in bismuth thin films 1982
32 4 p. 212-
1 p.
artikel
110 5029. Oxidation of Si(111), 7 × 7 and 2 × 1: A comparison 1982
32 4 p. 224-
1 p.
artikel
111 Oxygen induced preferred orientation of dc sputtered platinum 1982
32 4 p. 214-
1 p.
artikel
112 4975. Pattern profile control utilizing shadowing effect in oblique ion-beam etching 1982
32 4 p. 218-
1 p.
artikel
113 4897. Performance of a simplified directional detector for gas molecules 1982
32 4 p. 210-211
2 p.
artikel
114 4877. Performance of BNL-TSTA compound cryopump 1982
32 4 p. 208-209
2 p.
artikel
115 4979. Plasma dynamics of an arc-driven, electromagnetic, projectile accelerator 1982
32 4 p. 219-
1 p.
artikel
116 4994. Plasma probe system with automatic sweep adjustment 1982
32 4 p. 220-
1 p.
artikel
117 4950. Plasma production by staged laser irradiation of mm-size deuterium pellets 1982
32 4 p. 216-
1 p.
artikel
118 4907. Plastic coating of microsphere substrates 1982
32 4 p. 211-
1 p.
artikel
119 4902. Platinum silicide formation under ultrahigh vacuum and controlled impurity ambients 1982
32 4 p. 211-
1 p.
artikel
120 4970. Pn junction formation in CdTe by ion implantation and pulsed ruby laser annealing 1982
32 4 p. 218-
1 p.
artikel
121 4986. Polarized He (23S) thermal metastable atom source 1982
32 4 p. 220-
1 p.
artikel
122 Practical aspects of constructing, operating amd maintaining rotary vane and diffusion-pumped systems 1982
32 4 p. 208-
1 p.
artikel
123 4934. Preferential sputtering from disordered GaAs 1982
32 4 p. 214-
1 p.
artikel
124 4981. Preliminary experiment on the Lambdatron ion source for the JT-60 neutral beam injector 1982
32 4 p. 219-
1 p.
artikel
125 4886. Pumped oil feed systems for rotary vacuum pumps 1982
32 4 p. 209-
1 p.
artikel
126 4881. Pumping behaviour of sputter ion pumps 1982
32 4 p. 209-
1 p.
artikel
127 4880. Pumping efficiencies of three-dimensional cryopumping structures 1982
32 4 p. 209-
1 p.
artikel
128 4883. Pumping of corrosive or hazardous gases with turbomolecular and oil-filled rotary vane backing pumps 1982
32 4 p. 209-
1 p.
artikel
129 5022. Quantitative analysis of iron oxides using Auger electron spectroscopy combined with ion sputtering 1982
32 4 p. 223-
1 p.
artikel
130 4929. Reactively sputter-deposited high-emissivity tungsten carbide/carbon coatings 1982
32 4 p. 214-
1 p.
artikel
131 4936. Recent advances in Pt coating of microspheres by a batch magnetron sputtering process 1982
32 4 p. 214-215
2 p.
artikel
132 5025. Resonant satellites in photoemission and Auger spectra of d-band metals 1982
32 4 p. 223-224
2 p.
artikel
133 5004. Scanning Auger microprobe study of gold-nickel-copper diffusion in thin films 1982
32 4 p. 221-
1 p.
artikel
134 5013. Secondary ion mass spectrometry analysis of semiconductor layers 1982
32 4 p. 222-
1 p.
artikel
135 5012. Secondary ion mass spectrometry and Rutherford backscattering spectroscopy for the analysis of thin films 1982
32 4 p. 222-
1 p.
artikel
136 4900. Selection and evaluation of an ultrahigh vacuum gate valve for ISABELLE beam line vacuum system 1982
32 4 p. 211-
1 p.
artikel
137 4904. Semiconducting behaviour in antimony-doped bismuth films 1982
32 4 p. 211-
1 p.
artikel
138 4918. SiCAl O compound coatings on molybdenum for application to fusion reactor first wall components 1982
32 4 p. 213-
1 p.
artikel
139 5019. Si(111): Ni surface studies by AES, UPS, LEED, and ion scattering 1982
32 4 p. 223-
1 p.
artikel
140 4983. Source plasma characteristics of the coaxial duoPIGatron ion source 1982
32 4 p. 219-
1 p.
artikel
141 4943. Sputtered iron oxide/silicon heterostructures 1982
32 4 p. 215-
1 p.
artikel
142 Sputtered TiW/Au Schottky barriers on GaAs 1982
32 4 p. 213-
1 p.
artikel
143 4911. Steam corrosion of glass under polymer thin films 1982
32 4 p. 212-
1 p.
artikel
144 4872. Steam ejector-condenser—stage 1 of a differential vacuum pumping station 1982
32 4 p. 208-
1 p.
artikel
145 4905. Structural aspects of tunnel-junction coupled granular lead films 1982
32 4 p. 211-
1 p.
artikel
146 4949. Structure study of AuSi interface by MeV ion scattering 1982
32 4 p. 216-
1 p.
artikel
147 5006. Studies of surface, thin film and interface properties by automatic spectroscopic ellipsometry 1982
32 4 p. 221-
1 p.
artikel
148 4866. Study of the activation of nonevaporable getters 1982
32 4 p. 207-
1 p.
artikel
149 4958. Surface morphologies produced by ion milling on ion-implanted 18Cr8Ni steels 1982
32 4 p. 217-
1 p.
artikel
150 4998. Surface phases of GaAs(100) and AlAs(100) 1982
32 4 p. 221-
1 p.
artikel
151 5003. Surface rearrangement of adsorbate-covered Mo(001) 1982
32 4 p. 221-
1 p.
artikel
152 5027. Surface structure of the Ni{001}C(2 × 2) NO system 1982
32 4 p. 224-
1 p.
artikel
153 4960. Temperature measurements of glass substrates during plasma etching 1982
32 4 p. 217-
1 p.
artikel
154 The 11B(d,γ0)13C reaction in the region of the giant dipole resonance 1982
32 4 p. 216-
1 p.
artikel
155 4916. The effect of substrate temperature on the electrical resistivity of thin manganese films 1982
32 4 p. 212-
1 p.
artikel
156 4910. The interaction of tin oxide films with O2, H2, NO, and H2S 1982
32 4 p. 212-
1 p.
artikel
157 5031. Theoretical studies of Si(111) surface structures 1982
32 4 p. 224-
1 p.
artikel
158 4863. Theory of chemisorption on d-band metals 1982
32 4 p. 207-
1 p.
artikel
159 4932. The production of amorphous silicon without hydrogen 1982
32 4 p. 214-
1 p.
artikel
160 4865. Thermal decomposition of Ti getter films from the DITE tokamak 1982
32 4 p. 207-
1 p.
artikel
161 4864. Thermal desorption and UPS study of Co adsorbed on Cu-covered Ru (0001) 1982
32 4 p. 207-
1 p.
artikel
162 4901. Thermoelectric power measurements in thin tin films 1982
32 4 p. 211-
1 p.
artikel
163 5033. The Si(111) 7 × 7 to ‘1 × 1’ transition: A summary 1982
32 4 p. 224-
1 p.
artikel
164 5028. The structure of NH3 on Ni(111) 1982
32 4 p. 224-
1 p.
artikel
165 4919. Thickness periodicity in the Auger line shapes from epitaxial (111) Pd/(111) Cu films 1982
32 4 p. 213-
1 p.
artikel
166 4882. Ultimate pressure of mechanical pumps and the effectiveness of foreline traps 1982
32 4 p. 209-
1 p.
artikel
167 4874. “Vacuum” layer double-shell cryogenic inertial fusion targets 1982
32 4 p. 208-
1 p.
artikel
168 4885. Vacuum pumping of aggressive and dust laden vapours 1982
32 4 p. 209-
1 p.
artikel
169 4954. Vacuum UV and soft X-ray optical emissions from electron impact on metals 1982
32 4 p. 216-
1 p.
artikel
170 5026. Variations in the stoichiometry of thin oxides on silicon as seen in the Si LVV Auger spectrum 1982
32 4 p. 224-
1 p.
artikel
171 4869. Versatile high-power single-longitudinal-mode pulsed dye laser 1982
32 4 p. 208-
1 p.
artikel
172 4956. Vertical wind velocity measurements by a Doppler lidar and comparisons with a Doppler sodar 1982
32 4 p. 216-
1 p.
artikel
173 4893. Water vapour pressure gauge 1982
32 4 p. 210-
1 p.
artikel
174 5018. XPS investigation of the oxidation of Hg1-x Cd xTe surfaces 1982
32 4 p. 223-
1 p.
artikel
175 5005. X-ray photoelectron and Auger analysis of thin films 1982
32 4 p. 221-
1 p.
artikel
                             175 gevonden resultaten
 
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