| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Activities in vacuum science and technology in the USSR and Eastern Europe
|
Colligon, J
|
|
1981
|
31 |
2 |
p. 121-127
7 p.
|
artikel
|
| 2 |
A high vacuum gauge expansion calibration system with a selective getter pump
|
Bang, Huang Zhen
|
|
1981
|
31 |
2 |
p. 119-120
2 p.
|
artikel
|
| 3 |
A miniature high-valued resistor
|
Singh, Awatar
|
|
1981
|
31 |
2 |
p. 129-
1 p.
|
artikel
|
| 4 |
An optical thin film thickness monitor
|
Chitnis, V.T.
|
|
1981
|
31 |
2 |
p. 113-115
3 p.
|
artikel
|
| 5 |
Correlation of experimental trapping efficiency and calculated radiation defects on an ion-bombarded tin surface
|
Karpuzov, D.S.
|
|
1981
|
31 |
2 |
p. 130-
1 p.
|
artikel
|
| 6 |
Gas dynamics at low pressures in a vacuum microbalance
|
Fierro, J.L. García
|
|
1981
|
31 |
2 |
p. 79-84
6 p.
|
artikel
|
| 7 |
On constant molecular gas flow through cylindrical tubes. A note concerning the information content of clausing's equations
|
Bröhl, Walter H
|
|
1981
|
31 |
2 |
p. 117-118
2 p.
|
artikel
|
| 8 |
Quantitative thermal desorption spectrometry of ionically implanted inert gases—I. Fundamental aspects
|
Gorkum, A.A. van
|
|
1981
|
31 |
2 |
p. 89-98
10 p.
|
artikel
|
| 9 |
Quantitative thermal desorption spectrometry of ionically implanted inert gases—II. Technical requirements
|
Kornelsen, E.V.
|
|
1981
|
31 |
2 |
p. 99-111
13 p.
|
artikel
|
| 10 |
Semiconducting behaviour in Bi60Sb40 alloy thin films
|
Das, V Damodara
|
|
1981
|
31 |
2 |
p. 75-77
3 p.
|
artikel
|
| 11 |
Special coupling and sealing devices for vacuum components
|
Kaan, A.P.
|
|
1981
|
31 |
2 |
p. 85-88
4 p.
|
artikel
|
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