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                             14 results found
no title author magazine year volume issue page(s) type
1 2. An uhv system for in situ preparation and analysis of thin films and surfaces Shapira, Y.
1978
28 12 p. 523-526
4 p.
article
2 8. A specimen-exchange device for an ultra-high vacuum atom-probe field-ion microscope Wagner, Alfred
1978
28 12 p. 543-545
3 p.
article
3 6. Conductivity effects in amorphous chalcogenide films Yaniv, Zvi
1978
28 12 p. 535-539
5 p.
article
4 12. Controlled deposition of protective aluminum films on aircraft steels Oron, Moshé
1978
28 12 p. 567-570
4 p.
article
5 10. Further developments with single structure vapour pumping groups Dennis, N.T.M.
1978
28 12 p. 551-558
8 p.
article
6 9. Improvement of electron gun brightness in conventional scanning electron microscope (SEM) by coating its tungsten filament with a zirconium carbide (ZrC) thin film Oron, Moshé
1978
28 12 p. 547-550
4 p.
article
7 13. Measurement of the lattice constant of SiGe heteroepitaxial layers grown on a silicon substrate Aharoni, Herzl
1978
28 12 p. 571-578
8 p.
article
8 7. Requirements for comprehensive surface analysis 1978
28 12 p. 541-
1 p.
article
9 The fifth Israeli vacuum congress 1978
28 12 p. 513-
1 p.
article
10 11. Thermal outgassing behaviour of Inconel 600 after different methods of surface preparation Reiter, F.W.
1978
28 12 p. 559-566
8 p.
article
11 3. Trends in the development of turbomolecular vacuum pumps Henning, J.
1978
28 12 p. 527-
1 p.
article
12 1. Ultra-high vacuum systems for surface research Margoninski, Y.
1978
28 12 p. 515-521
7 p.
article
13 5. VCNR type characteristic in thin film amorphous TeGeAsSi films Yaniv, Zvi
1978
28 12 p. 533-534
2 p.
article
14 4. Vertical electrode configuration to avoid contaminating particles in sputtered ZnO thin films Maniv, S.
1978
28 12 p. 529-532
4 p.
article
                             14 results found
 
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