nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
An electromechanical device for measuring the deposition rates of thin films
|
Weissman, J |
|
1969 |
19 |
12 |
p. 579-581 3 p. |
artikel |
2 |
Author index of abstracts
|
|
|
1969 |
19 |
12 |
p. 599-619 21 p. |
artikel |
3 |
A variable temperature cryostat with external coolant source for the preparation and measurement of thin film in vacuum
|
Ahilea, E |
|
1969 |
19 |
12 |
p. 541-543 3 p. |
artikel |
4 |
Biographies of authors
|
|
|
1969 |
19 |
12 |
p. 582-584 3 p. |
artikel |
5 |
Classified abstracts
|
|
|
1969 |
19 |
12 |
p. 597- 1 p. |
artikel |
6 |
Classified abstracts 1201–1393
|
|
|
1969 |
19 |
12 |
p. 597-598 2 p. |
artikel |
7 |
Commercial news
|
|
|
1969 |
19 |
12 |
p. 594-596 3 p. |
artikel |
8 |
Epitaxial growth of nickel films
|
Kleefeld, J |
|
1969 |
19 |
12 |
p. 561-563 3 p. |
artikel |
9 |
Erratum
|
|
|
1969 |
19 |
12 |
p. 620-621 2 p. |
artikel |
10 |
Exhibition of Vacuum Equipment at the First Israeli Vacuum Congress
|
|
|
1969 |
19 |
12 |
p. 585-589 5 p. |
artikel |
11 |
International Union for Vacuum Science, Technique and Applications
|
|
|
1969 |
19 |
12 |
p. 590-592 3 p. |
artikel |
12 |
New literature
|
|
|
1969 |
19 |
12 |
p. 596- 1 p. |
artikel |
13 |
Personal
|
|
|
1969 |
19 |
12 |
p. 596- 1 p. |
artikel |
14 |
Physical and technical aspects of ultra-high vacuum technology (Extended abstract)
|
Adam, H |
|
1969 |
19 |
12 |
p. 544- 1 p. |
artikel |
15 |
Some problems associated with the attainment of ultra high vacuum
|
Fulker, M.J. |
|
1969 |
19 |
12 |
p. 555-560 6 p. |
artikel |
16 |
Some vacuum aspects of vacuum ultraviolet spectroscopy
|
Raz, B |
|
1969 |
19 |
12 |
p. 571-574 4 p. |
artikel |
17 |
Technical and industrial developments
|
|
|
1969 |
19 |
12 |
p. 593-594 2 p. |
artikel |
18 |
The influence of preparation conditions on the optical properties of thin films
|
Rabinovitch, K |
|
1969 |
19 |
12 |
p. 564-566 3 p. |
artikel |
19 |
The Israeli Society for Vacuum Technology and its first congress
|
Roth, A |
|
1969 |
19 |
12 |
p. 539-540 2 p. |
artikel |
20 |
The Israeli Society for Vacuum Technology and the First Israeli Vacuum Congress, Tel-Aviv, 19–20 May 1969
|
Thomas, E |
|
1969 |
19 |
12 |
p. 537-538 2 p. |
artikel |
21 |
The microelectronics laboratory at the Technion
|
Bar-Lev, A |
|
1969 |
19 |
12 |
p. 545-546 2 p. |
artikel |
22 |
The role of Auger electron spectroscopy in surface elemental analysis
|
Taylor, N.J. |
|
1969 |
19 |
12 |
p. 575-578 4 p. |
artikel |
23 |
The use of the partial pressure gauge for the analysis of residual gases in high-vacuum systems
|
Estermann, I |
|
1969 |
19 |
12 |
p. 553-554 2 p. |
artikel |
24 |
The vacuum system of “SOLIS” (Soreq on-line isotope separator)
|
Oron, M |
|
1969 |
19 |
12 |
p. 567-570 4 p. |
artikel |
25 |
Vacuum technology aspects in the design of electromagnetic isotope separators
|
Chavet, I |
|
1969 |
19 |
12 |
p. 547-552 6 p. |
artikel |