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                             25 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 An electromechanical device for measuring the deposition rates of thin films Weissman, J
1969
19 12 p. 579-581
3 p.
artikel
2 Author index of abstracts 1969
19 12 p. 599-619
21 p.
artikel
3 A variable temperature cryostat with external coolant source for the preparation and measurement of thin film in vacuum Ahilea, E
1969
19 12 p. 541-543
3 p.
artikel
4 Biographies of authors 1969
19 12 p. 582-584
3 p.
artikel
5 Classified abstracts 1969
19 12 p. 597-
1 p.
artikel
6 Classified abstracts 1201–1393 1969
19 12 p. 597-598
2 p.
artikel
7 Commercial news 1969
19 12 p. 594-596
3 p.
artikel
8 Epitaxial growth of nickel films Kleefeld, J
1969
19 12 p. 561-563
3 p.
artikel
9 Erratum 1969
19 12 p. 620-621
2 p.
artikel
10 Exhibition of Vacuum Equipment at the First Israeli Vacuum Congress 1969
19 12 p. 585-589
5 p.
artikel
11 International Union for Vacuum Science, Technique and Applications 1969
19 12 p. 590-592
3 p.
artikel
12 New literature 1969
19 12 p. 596-
1 p.
artikel
13 Personal 1969
19 12 p. 596-
1 p.
artikel
14 Physical and technical aspects of ultra-high vacuum technology (Extended abstract) Adam, H
1969
19 12 p. 544-
1 p.
artikel
15 Some problems associated with the attainment of ultra high vacuum Fulker, M.J.
1969
19 12 p. 555-560
6 p.
artikel
16 Some vacuum aspects of vacuum ultraviolet spectroscopy Raz, B
1969
19 12 p. 571-574
4 p.
artikel
17 Technical and industrial developments 1969
19 12 p. 593-594
2 p.
artikel
18 The influence of preparation conditions on the optical properties of thin films Rabinovitch, K
1969
19 12 p. 564-566
3 p.
artikel
19 The Israeli Society for Vacuum Technology and its first congress Roth, A
1969
19 12 p. 539-540
2 p.
artikel
20 The Israeli Society for Vacuum Technology and the First Israeli Vacuum Congress, Tel-Aviv, 19–20 May 1969 Thomas, E
1969
19 12 p. 537-538
2 p.
artikel
21 The microelectronics laboratory at the Technion Bar-Lev, A
1969
19 12 p. 545-546
2 p.
artikel
22 The role of Auger electron spectroscopy in surface elemental analysis Taylor, N.J.
1969
19 12 p. 575-578
4 p.
artikel
23 The use of the partial pressure gauge for the analysis of residual gases in high-vacuum systems Estermann, I
1969
19 12 p. 553-554
2 p.
artikel
24 The vacuum system of “SOLIS” (Soreq on-line isotope separator) Oron, M
1969
19 12 p. 567-570
4 p.
artikel
25 Vacuum technology aspects in the design of electromagnetic isotope separators Chavet, I
1969
19 12 p. 547-552
6 p.
artikel
                             25 gevonden resultaten
 
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