nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Computing reflectance ratios from an image
|
Nayar, Shree K. |
|
1993 |
26 |
10 |
p. 1529-1542 14 p. |
artikel |
2 |
Editorial: Software survey section
|
|
|
1993 |
26 |
10 |
p. I-IV nvt p. |
artikel |
3 |
Elliptical object detection by using its geometric properties
|
Wu, Wen-Yen |
|
1993 |
26 |
10 |
p. 1499-1509 11 p. |
artikel |
4 |
Feature detection via linear contrast techniques
|
Hafed Benteftifa, M. |
|
1993 |
26 |
10 |
p. 1487-1497 11 p. |
artikel |
5 |
Finding contour-based abstractions of planar patterns
|
Arcelli, Carlo |
|
1993 |
26 |
10 |
p. 1563-1577 15 p. |
artikel |
6 |
Fingerprint recognition in low quality images
|
Coetzee, Louis |
|
1993 |
26 |
10 |
p. 1441-1460 20 p. |
artikel |
7 |
Multiscale fourier descriptors for classifying semivowels in spectrograms
|
Pinkowski, Ben |
|
1993 |
26 |
10 |
p. 1593-1602 10 p. |
artikel |
8 |
Optical flow from constraint lines parametrization
|
Ben-Tzvi, D. |
|
1993 |
26 |
10 |
p. 1549-1561 13 p. |
artikel |
9 |
Parallel hypothesis verification
|
Moody, John |
|
1993 |
26 |
10 |
p. 1521-1527 7 p. |
artikel |
10 |
Parallel vision algorithms using sparse array representations
|
Shankar, Ravi V. |
|
1993 |
26 |
10 |
p. 1511-1519 9 p. |
artikel |
11 |
Recognition and inspection of manufactured parts using line moments of their boundaries
|
Wen, Wei |
|
1993 |
26 |
10 |
p. 1461-1471 11 p. |
artikel |
12 |
Recovering scene structures from scattered surface points
|
Goshtasby, Ardeshir |
|
1993 |
26 |
10 |
p. 1543-1547 5 p. |
artikel |
13 |
The complex cepstrum applied to two-dimensional images
|
Lee, James K. |
|
1993 |
26 |
10 |
p. 1579-1592 14 p. |
artikel |
14 |
Vertex directed segmentation of handwritten numerals
|
Westall, J.M. |
|
1993 |
26 |
10 |
p. 1473-1486 14 p. |
artikel |