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                             25 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Accelerated testing for failures of tantalum capacitors Virkki, J.
2010
50 2 p. 217-219
3 p.
artikel
2 Address generators for linear systolic array Stojčev, M.K.
2010
50 2 p. 292-303
12 p.
artikel
3 An application of DMADV methodology for increasing the yield rate of surveillance cameras Huang, Chiao-Tzu
2010
50 2 p. 266-272
7 p.
artikel
4 ANN based CMOS ASIC design for improved temperature-drift compensation of piezoresistive micro-machined high resolution pressure sensor Futane, N.P.
2010
50 2 p. 282-291
10 p.
artikel
5 A percolation study of RTS noise amplitudes in nano-MOSFETs by Monte Carlo simulation Zhongfa, Ma
2010
50 2 p. 179-182
4 p.
artikel
6 Assessment of ultra-thin Si wafer thickness in 3D wafer stacking Kim, Eun-Kyung
2010
50 2 p. 195-198
4 p.
artikel
7 Calendar 2010
50 2 p. I-II
nvt p.
artikel
8 Design of a fully CMOS compatible 3-μm size color pixel Langfelder, G.
2010
50 2 p. 169-173
5 p.
artikel
9 Effect of ytterbium doping on the optical and electrical properties of intrinsic In2O3 thin films Dakhel, A.A.
2010
50 2 p. 211-216
6 p.
artikel
10 Effects of novel carboxylic acid-based reductants on the wetting characteristics of anisotropic conductive adhesive with low melting point alloy filler Kim, Hyomi
2010
50 2 p. 258-265
8 p.
artikel
11 Electromigration behavior in Cu/Sn–8Zn–3Bi/Cu solder joint Liu, Lijuan
2010
50 2 p. 251-257
7 p.
artikel
12 Extraction of bias-dependent parasitic source/drain resistance in MOSFETs with an advanced mobility model Chang, Yang-Hua
2010
50 2 p. 174-178
5 p.
artikel
13 Improved method for determining the shear strength of chip component solder joints Krammer, O.
2010
50 2 p. 235-241
7 p.
artikel
14 Inside front cover - Editorial board 2010
50 2 p. IFC-
1 p.
artikel
15 Integration-based approach to evaluate the sub-threshold slope of MOSFETs Ortiz-Conde, Adelmo
2010
50 2 p. 312-315
4 p.
artikel
16 Micropower fully integrated CMOS readout interface for neural recording application Li, Hongge
2010
50 2 p. 273-281
9 p.
artikel
17 Modeling the charge transport mechanism in amorphous Al2O3 with multiphonon trap ionization effect Novikov, Yu.N.
2010
50 2 p. 207-210
4 p.
artikel
18 New dummy design and stiffener on warpage reduction in Ball Grid Array Printed Circuit Board Cho, Seunghyun
2010
50 2 p. 242-250
9 p.
artikel
19 On the importance of the V g,max–V th parameter on LTPS TFT stressing behavior Moschou, Despina C.
2010
50 2 p. 190-194
5 p.
artikel
20 Parameter selection for health monitoring of electronic products Kumar, Sachin
2010
50 2 p. 161-168
8 p.
artikel
21 Predictive modeling of board level shock-impact reliability of the HVQFN-family de Vries, J.
2010
50 2 p. 228-234
7 p.
artikel
22 Quantum circuit’s reliability assessment with VHDL-based simulated fault injection Boncalo, Oana
2010
50 2 p. 304-311
8 p.
artikel
23 Simulation and modelling of VDMOSFET self protection under TLP-stress Sauter, Martin
2010
50 2 p. 183-189
7 p.
artikel
24 Small signal parameter extraction of MESFET using quantum particle swarm optimization Sabat, Samrat L.
2010
50 2 p. 199-206
8 p.
artikel
25 Thin film joining for high-temperature performance of power semi-conductor devices Takahashi, Toshihide
2010
50 2 p. 220-227
8 p.
artikel
                             25 gevonden resultaten
 
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