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                             27 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Amorphous silicon technology for large area digital X-ray and optical imaging Nathan, Arokia
2002
42 4-5 p. 735-746
12 p.
artikel
2 Analysis and modeling of a digital CMOS circuit operation and reliability after gate oxide breakdown: a case study Kaczer, B.
2002
42 4-5 p. 555-564
10 p.
artikel
3 Application of adhesive bonding techniques in hard disk drive head assembly Luk, C.F.
2002
42 4-5 p. 767-777
11 p.
artikel
4 A review of recent MOSFET threshold voltage extraction methods Ortiz-Conde, A.
2002
42 4-5 p. 583-596
14 p.
artikel
5 A thermodynamic limit for digital electronics De Mey, Gilbert
2002
42 4-5 p. 507-510
4 p.
artikel
6 Construction of a cost-effective failure analysis service network––microelectronic failure analysis service in Japan Nakajima, S
2002
42 4-5 p. 511-521
11 p.
artikel
7 Defects in silicon oxynitride gate dielectric films Wong, Hei
2002
42 4-5 p. 597-605
9 p.
artikel
8 DRAM reliability Kim, Kinam
2002
42 4-5 p. 543-553
11 p.
artikel
9 Effects of high electric field and elevated-temperature bias stressing on radiation response in power VDMOSFETs Stojadinovic, N.
2002
42 4-5 p. 669-677
9 p.
artikel
10 Effects of hydrogen transport and reactions on microelectronics radiation response and reliability Fleetwood, D.M.
2002
42 4-5 p. 523-541
19 p.
artikel
11 Electrical and structural investigations in reliability characterisation of modern passives and passive integrated components Dziedzic, Andrzej
2002
42 4-5 p. 709-719
11 p.
artikel
12 Electrical noise and RTS fluctuations in advanced CMOS devices Ghibaudo, G.
2002
42 4-5 p. 573-582
10 p.
artikel
13 Enhancing reliability with thermal transient testing Székely, V.
2002
42 4-5 p. 629-640
12 p.
artikel
14 Failure modes and mechanisms of InP-based and metamorphic high electron mobility transistors Meneghesso, Gaudenzio
2002
42 4-5 p. 685-708
24 p.
artikel
15 Logarithmic distributions in reliability analysis Jones, B.K.
2002
42 4-5 p. 779-786
8 p.
artikel
16 Mechanical reliability in electronic packaging Amagai, Masazumi
2002
42 4-5 p. 607-627
21 p.
artikel
17 [No title] Stojadinovic, Ninoslav
2002
42 4-5 p. 463-
1 p.
artikel
18 Optical semiconductor device reliability Fukuda, Mitsuo
2002
42 4-5 p. 679-683
5 p.
artikel
19 Physical analysis of hard and soft breakdown failures in ultrathin gate oxides Radhakrishnan, M.K.
2002
42 4-5 p. 565-571
7 p.
artikel
20 Reliability issues of silicon LSIs facing 100-nm technology node Takeda, Eiji
2002
42 4-5 p. 493-506
14 p.
artikel
21 RF CMOS technology for MMIC Chang, Chun-Yen
2002
42 4-5 p. 721-733
13 p.
artikel
22 Selected failure mechanisms of modern power modules Ciappa, Mauro
2002
42 4-5 p. 653-667
15 p.
artikel
23 Silicon integrated circuit technology from past to future Iwai, Hiroshi
2002
42 4-5 p. 465-491
27 p.
artikel
24 Statistical modeling of MOS devices for parametric yield prediction Liou, Juin J.
2002
42 4-5 p. 787-795
9 p.
artikel
25 The “trouble not identified” phenomenon in automotive electronics Thomas, Dawn A.
2002
42 4-5 p. 641-651
11 p.
artikel
26 Use of preliminary ultraviolet and infrared illumination for diagnostics of MOS and bipolar devices radiation response Pershenkov, V.S.
2002
42 4-5 p. 797-804
8 p.
artikel
27 Zapping thin film transistors Tošić Golo, N.
2002
42 4-5 p. 747-765
19 p.
artikel
                             27 gevonden resultaten
 
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