| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
Analog circuit fault diagnosis based on noise measurement
|
Dai, Yisong
|
|
1999
|
39 |
8 |
p. 1293-1298
6 p.
|
article
|
| 2 |
Electrical characteristics of advanced lateral insulated-gate bipolar transistor structures at 77 K
|
Vellvehi, M.
|
|
1999
|
39 |
8 |
p. 1239-1246
8 p.
|
article
|
| 3 |
Failure modes in surface micromachined microelectromechanical actuation systems
|
Miller, S.L
|
|
1999
|
39 |
8 |
p. 1229-1237
9 p.
|
article
|
| 4 |
Incomplete ionization in a semiconductor and its implications to device modeling
|
Xiao, G
|
|
1999
|
39 |
8 |
p. 1299-1303
5 p.
|
article
|
| 5 |
Material property, compatibility, and reliability issues in diamond-enhanced, GaAs-based plastic packages
|
Fabis, Philip M.
|
|
1999
|
39 |
8 |
p. 1275-1291
17 p.
|
article
|
| 6 |
Modeling of ionizing irradiation influence on Schottky-gate field-effect transistor
|
Demarina, N.V
|
|
1999
|
39 |
8 |
p. 1247-1263
17 p.
|
article
|
| 7 |
On the extraction of the source and drain series resistances of MOSFETs
|
Garcı́a Sánchez, F.J.
|
|
1999
|
39 |
8 |
p. 1173-1184
12 p.
|
article
|
| 8 |
Reliability of radio frequency/microwave power packages: the effects of component materials and assembly processes
|
Fabis, Philip M
|
|
1999
|
39 |
8 |
p. 1265-1274
10 p.
|
article
|
| 9 |
Single-quantum well InGaN green light emitting diode degradation under high electrical stress
|
Barton, Daniel L.
|
|
1999
|
39 |
8 |
p. 1219-1227
9 p.
|
article
|
| 10 |
Thin RF sputtered and thermal Ta2O5 on Si for high density DRAM application
|
Atanassova, E
|
|
1999
|
39 |
8 |
p. 1185-1217
33 p.
|
article
|
Journal description