nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Analog circuit fault diagnosis based on noise measurement
|
Dai, Yisong |
|
1999 |
39 |
8 |
p. 1293-1298 6 p. |
artikel |
2 |
Electrical characteristics of advanced lateral insulated-gate bipolar transistor structures at 77 K
|
Vellvehi, M. |
|
1999 |
39 |
8 |
p. 1239-1246 8 p. |
artikel |
3 |
Failure modes in surface micromachined microelectromechanical actuation systems
|
Miller, S.L |
|
1999 |
39 |
8 |
p. 1229-1237 9 p. |
artikel |
4 |
Incomplete ionization in a semiconductor and its implications to device modeling
|
Xiao, G |
|
1999 |
39 |
8 |
p. 1299-1303 5 p. |
artikel |
5 |
Material property, compatibility, and reliability issues in diamond-enhanced, GaAs-based plastic packages
|
Fabis, Philip M. |
|
1999 |
39 |
8 |
p. 1275-1291 17 p. |
artikel |
6 |
Modeling of ionizing irradiation influence on Schottky-gate field-effect transistor
|
Demarina, N.V |
|
1999 |
39 |
8 |
p. 1247-1263 17 p. |
artikel |
7 |
On the extraction of the source and drain series resistances of MOSFETs
|
Garcı́a Sánchez, F.J. |
|
1999 |
39 |
8 |
p. 1173-1184 12 p. |
artikel |
8 |
Reliability of radio frequency/microwave power packages: the effects of component materials and assembly processes
|
Fabis, Philip M |
|
1999 |
39 |
8 |
p. 1265-1274 10 p. |
artikel |
9 |
Single-quantum well InGaN green light emitting diode degradation under high electrical stress
|
Barton, Daniel L. |
|
1999 |
39 |
8 |
p. 1219-1227 9 p. |
artikel |
10 |
Thin RF sputtered and thermal Ta2O5 on Si for high density DRAM application
|
Atanassova, E |
|
1999 |
39 |
8 |
p. 1185-1217 33 p. |
artikel |