| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A note on expected Fisher information for the Burr XII distribution
|
Watkins, A.J.
|
|
1997
|
37 |
12 |
p. 1849-1852
4 p.
|
artikel
|
| 2 |
A survey of the thermal stability of an active heat sink
|
De Baetselier, Erwin
|
|
1997
|
37 |
12 |
p. 1805-1812
8 p.
|
artikel
|
| 3 |
Calendar of forthcoming events
|
|
|
1997
|
37 |
12 |
p. 1883-1893
11 p.
|
artikel
|
| 4 |
Capability indices for non-normal distributions with an application in electrolytic capacitor manufacturing
|
Pearn, W.L.
|
|
1997
|
37 |
12 |
p. 1853-1858
6 p.
|
artikel
|
| 5 |
Design of a new test structure for the study of electromigration with early resistance change measurements
|
De Ceuninck, W.
|
|
1997
|
37 |
12 |
p. 1813-1816
4 p.
|
artikel
|
| 6 |
Efficient critical area measurements of IC layout applied to quality and reliability enhancement
|
Allan, Gerard A.
|
|
1997
|
37 |
12 |
p. 1825-1833
9 p.
|
artikel
|
| 7 |
LSI failure analysis using focused laser beam heating
|
Nikawa, Kiyoshi
|
|
1997
|
37 |
12 |
p. 1841-1847
7 p.
|
artikel
|
| 8 |
Procedure for evaluation of thermal management requirements in a laser diode structure
|
Kamath, Rajesh R.
|
|
1997
|
37 |
12 |
p. 1817-1823
7 p.
|
artikel
|
| 9 |
Robustness of the exponential sequential probability ratio test (SPRT) when Weibull distributed failures are transformed using a “known” shape parameter
|
Hauck, Daryl J.
|
|
1997
|
37 |
12 |
p. 1835-1840
6 p.
|
artikel
|
| 10 |
Shortest bayes credibility intervals for the lognormal failure model
|
Chen, Keh-Wei
|
|
1997
|
37 |
12 |
p. 1859-1863
5 p.
|
artikel
|
| 11 |
Weaknesses of the conventional three-state model in station-oriented reliability evaluation
|
Billinton, R.
|
|
1997
|
37 |
12 |
p. 1799-1804
6 p.
|
artikel
|
| 12 |
World abstract on microelectronics and reliability 1. Realibility—General
|
|
|
1997
|
37 |
12 |
p. 1865-1881
17 p.
|
artikel
|
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