| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A high-quality cross-sectional transmission electron microscope specimen preparation technique for structural and interfacial property studies in microelectronic packaging
|
Marks, M.R.
|
|
1995
|
35 |
5 |
p. 807-815
9 p.
|
artikel
|
| 2 |
An algorithm for evaluating all the minimal cuts of a graph
|
Singh, Brijendra
|
|
1995
|
35 |
5 |
p. 865-867
3 p.
|
artikel
|
| 3 |
A new technique for active minimal cut set selection used in substation reliability evaluation
|
Billinton, Roy
|
|
1995
|
35 |
5 |
p. 797-805
9 p.
|
artikel
|
| 4 |
An improved algorithm for cutset evaluation from paths
|
Schäbe, Hendrik
|
|
1995
|
35 |
5 |
p. 783-787
5 p.
|
artikel
|
| 5 |
A simple ordering policy with linear lifetime for a unit
|
Sridharan, V.
|
|
1995
|
35 |
5 |
p. 847-849
3 p.
|
artikel
|
| 6 |
Bayes estimation of P(Y > X) in the geometric case
|
Ahmad, K.E.
|
|
1995
|
35 |
5 |
p. 817-820
4 p.
|
artikel
|
| 7 |
Behaviour of a priority standby redundant system with different types of repair facilities
|
Singh Joorel, J.P.
|
|
1995
|
35 |
5 |
p. 833-836
4 p.
|
artikel
|
| 8 |
Biased estimates of variance components
|
Shaban, Adel Magid M.
|
|
1995
|
35 |
5 |
p. 777-782
6 p.
|
artikel
|
| 9 |
GERT analysis of a two-unit cold standby system with repair
|
Shankar, Gauri
|
|
1995
|
35 |
5 |
p. 837-840
4 p.
|
artikel
|
| 10 |
Probabilistic analysis of a n-unit cold-standby system with general failure and repair time distributions
|
Gopalan, M.N.
|
|
1995
|
35 |
5 |
p. 851-857
7 p.
|
artikel
|
| 11 |
Probabilistic analysis of a two-unit cold standby system with instructions at need
|
Kumar, Ashok
|
|
1995
|
35 |
5 |
p. 829-832
4 p.
|
artikel
|
| 12 |
Reliability analysis of a finite range failure model
|
Siddiqui, S.A.
|
|
1995
|
35 |
5 |
p. 859-862
4 p.
|
artikel
|
| 13 |
Salvaging solder joints accidentally exposed to nitric acid: A case study
|
Rajopadhye, N.R.
|
|
1995
|
35 |
5 |
p. 863-864
2 p.
|
artikel
|
| 14 |
Simulation study of a priority queueing system
|
Yadavalli, V.S.S.
|
|
1995
|
35 |
5 |
p. 789-796
8 p.
|
artikel
|
| 15 |
Study of hot electron degradation in submicrometer gate length MOS transistor fabricated with selectively doped substrate engineering
|
Andhare, P.N.
|
|
1995
|
35 |
5 |
p. 821-826
6 p.
|
artikel
|
| 16 |
The structural reliability of cable television
|
Schwartz, Ladislav
|
|
1995
|
35 |
5 |
p. 827-828
2 p.
|
artikel
|
| 17 |
Two non-identical operative unit system with repair and inspection
|
Agnihotri, R.K.
|
|
1995
|
35 |
5 |
p. 869-874
6 p.
|
artikel
|
| 18 |
Two-sided bounds of reliability for large systems
|
Gurov, Sergey V.
|
|
1995
|
35 |
5 |
p. 841-845
5 p.
|
artikel
|
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