nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A high-quality cross-sectional transmission electron microscope specimen preparation technique for structural and interfacial property studies in microelectronic packaging
|
Marks, M.R. |
|
1995 |
35 |
5 |
p. 807-815 9 p. |
artikel |
2 |
An algorithm for evaluating all the minimal cuts of a graph
|
Singh, Brijendra |
|
1995 |
35 |
5 |
p. 865-867 3 p. |
artikel |
3 |
A new technique for active minimal cut set selection used in substation reliability evaluation
|
Billinton, Roy |
|
1995 |
35 |
5 |
p. 797-805 9 p. |
artikel |
4 |
An improved algorithm for cutset evaluation from paths
|
Schäbe, Hendrik |
|
1995 |
35 |
5 |
p. 783-787 5 p. |
artikel |
5 |
A simple ordering policy with linear lifetime for a unit
|
Sridharan, V. |
|
1995 |
35 |
5 |
p. 847-849 3 p. |
artikel |
6 |
Bayes estimation of P(Y > X) in the geometric case
|
Ahmad, K.E. |
|
1995 |
35 |
5 |
p. 817-820 4 p. |
artikel |
7 |
Behaviour of a priority standby redundant system with different types of repair facilities
|
Singh Joorel, J.P. |
|
1995 |
35 |
5 |
p. 833-836 4 p. |
artikel |
8 |
Biased estimates of variance components
|
Shaban, Adel Magid M. |
|
1995 |
35 |
5 |
p. 777-782 6 p. |
artikel |
9 |
GERT analysis of a two-unit cold standby system with repair
|
Shankar, Gauri |
|
1995 |
35 |
5 |
p. 837-840 4 p. |
artikel |
10 |
Probabilistic analysis of a n-unit cold-standby system with general failure and repair time distributions
|
Gopalan, M.N. |
|
1995 |
35 |
5 |
p. 851-857 7 p. |
artikel |
11 |
Probabilistic analysis of a two-unit cold standby system with instructions at need
|
Kumar, Ashok |
|
1995 |
35 |
5 |
p. 829-832 4 p. |
artikel |
12 |
Reliability analysis of a finite range failure model
|
Siddiqui, S.A. |
|
1995 |
35 |
5 |
p. 859-862 4 p. |
artikel |
13 |
Salvaging solder joints accidentally exposed to nitric acid: A case study
|
Rajopadhye, N.R. |
|
1995 |
35 |
5 |
p. 863-864 2 p. |
artikel |
14 |
Simulation study of a priority queueing system
|
Yadavalli, V.S.S. |
|
1995 |
35 |
5 |
p. 789-796 8 p. |
artikel |
15 |
Study of hot electron degradation in submicrometer gate length MOS transistor fabricated with selectively doped substrate engineering
|
Andhare, P.N. |
|
1995 |
35 |
5 |
p. 821-826 6 p. |
artikel |
16 |
The structural reliability of cable television
|
Schwartz, Ladislav |
|
1995 |
35 |
5 |
p. 827-828 2 p. |
artikel |
17 |
Two non-identical operative unit system with repair and inspection
|
Agnihotri, R.K. |
|
1995 |
35 |
5 |
p. 869-874 6 p. |
artikel |
18 |
Two-sided bounds of reliability for large systems
|
Gurov, Sergey V. |
|
1995 |
35 |
5 |
p. 841-845 5 p. |
artikel |