nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Accelerated hot electron effects in DRAMs
|
Yuliasto, Tony T. |
|
1994 |
34 |
2 |
p. 197-200 4 p. |
artikel |
2 |
Analysis of a standby system with dependent repair time and slow switching device
|
Goel, L.R. |
|
1994 |
34 |
2 |
p. 383-386 4 p. |
artikel |
3 |
Analysis of posterior availability distributions of series and parallel systems
|
Sharma, K.K. |
|
1994 |
34 |
2 |
p. 379-381 3 p. |
artikel |
4 |
A new hardware-based fault-tolerant clock synchronization scheme for real-time multiprocessor systems
|
Baek, Yunju |
|
1994 |
34 |
2 |
p. 335-349 15 p. |
artikel |
5 |
A system with pre-inspection and two types of repairman
|
Tuteja, R.K. |
|
1994 |
34 |
2 |
p. 373-377 5 p. |
artikel |
6 |
Bayes prediction results for the inverse gaussian distribution utilizing guess values of parameters
|
Upadhyay, S.K. |
|
1994 |
34 |
2 |
p. 351-355 5 p. |
artikel |
7 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1994 |
34 |
2 |
p. 387-389 3 p. |
artikel |
8 |
Comparing of system reliabilities of repairable coherent systems in a changing environment
|
Deng, Yonglu |
|
1994 |
34 |
2 |
p. 317-321 5 p. |
artikel |
9 |
Critical time of the lognormal distribution
|
Chang, Dong Shang |
|
1994 |
34 |
2 |
p. 261-266 6 p. |
artikel |
10 |
Design and analysis of a fault-tolerant reconfigurable random access memory chip
|
Mehdi, Kamal A. |
|
1994 |
34 |
2 |
p. 297-315 19 p. |
artikel |
11 |
Interrelationship between queueing models with balking and reneging and machine repair problem with warm spares
|
Gupta, Surendra M. |
|
1994 |
34 |
2 |
p. 201-209 9 p. |
artikel |
12 |
Modeling and analysis of standby redundant computing systems
|
Chaganty, N.R. |
|
1994 |
34 |
2 |
p. 323-334 12 p. |
artikel |
13 |
Parametric what-if analysis in MTTF: A single-run Monte-Carlo-based approach
|
Davani, Darush |
|
1994 |
34 |
2 |
p. 275-281 7 p. |
artikel |
14 |
Polygon-to-chain reductions work for networks with imperfect vertices
|
Lai, M.K.F. |
|
1994 |
34 |
2 |
p. 267-274 8 p. |
artikel |
15 |
Probability analysis of a 2-out-of-n: F system with common cause failure, multiple failure and dependent failure
|
Harada, Koosuke |
|
1994 |
34 |
2 |
p. 289-296 8 p. |
artikel |
16 |
Quality assessment criteria in C++ classes
|
Han, Kyu Jung |
|
1994 |
34 |
2 |
p. 361-368 8 p. |
artikel |
17 |
Reliability analysis of a repairable system without being repaired “as good as new”
|
Shao-Ming, Wu |
|
1994 |
34 |
2 |
p. 357-360 4 p. |
artikel |
18 |
Reliability analysis of the naphtha fuel oil system in a thermal power plant
|
Kaushik, Sudhakar |
|
1994 |
34 |
2 |
p. 369-372 4 p. |
artikel |
19 |
Reliability bounds and tolerance limits of two inverse Gaussian models
|
Tang, Loon Ching |
|
1994 |
34 |
2 |
p. 247-259 13 p. |
artikel |
20 |
Reliability enhancement by the reversal of token for a basic token ring in the case of a single component failure
|
Chakraborty, Rabindra Nath |
|
1994 |
34 |
2 |
p. 283-288 6 p. |
artikel |
21 |
Reliability physics of electronic devices through material characterization and environmental stress testing techniques
|
Rao, S.U.M. |
|
1994 |
34 |
2 |
p. 229-245 17 p. |
artikel |
22 |
Residual lifetime distribution and its applications
|
Siddiqui, M.M. |
|
1994 |
34 |
2 |
p. 211-227 17 p. |
artikel |