| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Attribute data reliability decay models
|
Nolander, J.L.
|
|
1994
|
34 |
10 |
p. 1565-1596
32 p.
|
artikel
|
| 2 |
Bayesian reliability analysis for the MED
|
Bhattacharya, Samir K.
|
|
1994
|
34 |
10 |
p. 1685-1687
3 p.
|
artikel
|
| 3 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1994
|
34 |
10 |
p. 1701-1704
4 p.
|
artikel
|
| 4 |
Call for papers
|
|
|
1994
|
34 |
10 |
p. 1705-
1 p.
|
artikel
|
| 5 |
Concurrent engineering and design for manufacture of electronic products
|
Catuneanu, V.M.
|
|
1994
|
34 |
10 |
p. 1693-
1 p.
|
artikel
|
| 6 |
Decision modeling for thermal stress screening of commercial electronics
|
Landers, Thomas L.
|
|
1994
|
34 |
10 |
p. 1643-1656
14 p.
|
artikel
|
| 7 |
Digital integrated circuit testing from a quality persepctive
|
Nikolić, Z.
|
|
1994
|
34 |
10 |
p. 1697-1698
2 p.
|
artikel
|
| 8 |
Introduction to semiconductor device yield modeling
|
Dimitrijev, S.
|
|
1994
|
34 |
10 |
p. 1696-
1 p.
|
artikel
|
| 9 |
Mixed-Weibull parameter estimation for burn-in data using the Bayesian approach
|
Kececioglu, Dimitri
|
|
1994
|
34 |
10 |
p. 1657-1679
23 p.
|
artikel
|
| 10 |
Modelling common cause failures under data uncertainty of the system unavailability
|
Kulkarni, R.N.
|
|
1994
|
34 |
10 |
p. 1615-1622
8 p.
|
artikel
|
| 11 |
New trends in system reliability evaluation
|
G.W.A.D.,
|
|
1994
|
34 |
10 |
p. 1699-1700
2 p.
|
artikel
|
| 12 |
On the effect of weather condition in a two unit cold standby system
|
Singh, S.K.
|
|
1994
|
34 |
10 |
p. 1681-1684
4 p.
|
artikel
|
| 13 |
Optimal repair-cost limit for a consumer following expiry of a warranty
|
Chung, Kun-Jen
|
|
1994
|
34 |
10 |
p. 1689-1692
4 p.
|
artikel
|
| 14 |
Profit analysis of the machine repair problem with cold standbys and two modes of failure
|
Wang, Kuo-Hsiung
|
|
1994
|
34 |
10 |
p. 1635-1642
8 p.
|
artikel
|
| 15 |
Stuck fault test generation for dynamic CMOS
|
Ismaeel, Asad A.
|
|
1994
|
34 |
10 |
p. 1597-1613
17 p.
|
artikel
|
| 16 |
Thermal stress and strain in microelectronics packaging
|
Stojadinović, N.D.
|
|
1994
|
34 |
10 |
p. 1694-1695
2 p.
|
artikel
|
| 17 |
Time-dependent optimality of an alarm subsystem
|
Wang, D.
|
|
1994
|
34 |
10 |
p. 1623-1633
11 p.
|
artikel
|
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