| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
A comparison between reliability analyses based primarily on disjointness or statistical independence: The case of the generalized indra network
|
Rushdi, Ali M.
|
|
1993
|
33 |
7 |
p. 965-978
14 p.
|
article
|
| 2 |
A note on solving a system reliability problem
|
Wong, Jsun Y.
|
|
1993
|
33 |
7 |
p. 1045-1051
7 p.
|
article
|
| 3 |
A table for the lower boundary of the region of useful redundancy for k-out-of-n systems
|
Rushdi, Ali M.
|
|
1993
|
33 |
7 |
p. 979-992
14 p.
|
article
|
| 4 |
A versatile failure time distribution
|
Mukherjee, S.P.
|
|
1993
|
33 |
7 |
p. 1053-1056
4 p.
|
article
|
| 5 |
B-test of goodness of fit of an empirical distribution to a supposedly theoretical one
|
Brkić, D.M.
|
|
1993
|
33 |
7 |
p. 957-964
8 p.
|
article
|
| 6 |
Enumeration of minimal cutsets from matrix representation of directed/undirected networks
|
Ghosh, S.K.
|
|
1993
|
33 |
7 |
p. 947-949
3 p.
|
article
|
| 7 |
G/G y /m queueing system with discouragement via diffusion approximation
|
Garg, K.M.
|
|
1993
|
33 |
7 |
p. 1057-1059
3 p.
|
article
|
| 8 |
Microelectronics manufacturing diagnostics handbook
|
G.W.A.D.,
|
|
1993
|
33 |
7 |
p. 1066-1067
2 p.
|
article
|
| 9 |
New application of laser beam to failure analysis of LSI with multi-metal layers
|
Sanada, Masaru
|
|
1993
|
33 |
7 |
p. 993-1009
17 p.
|
article
|
| 10 |
Note on integrity versus reliability
|
Badenius, Duncan
|
|
1993
|
33 |
7 |
p. 1041-1044
4 p.
|
article
|
| 11 |
Performance-related reliability measures for a repairable two-unit gracefully degrading system
|
Agarwal, Manju
|
|
1993
|
33 |
7 |
p. 921-927
7 p.
|
article
|
| 12 |
Quality through engineering design
|
G.W.A.D.,
|
|
1993
|
33 |
7 |
p. 1065-1066
2 p.
|
article
|
| 13 |
Reliability analysis of a three-state multi-component warm standby redundant complex system with waiting for repair
|
Gupta, P.P.
|
|
1993
|
33 |
7 |
p. 1061-1063
3 p.
|
article
|
| 14 |
Reliability of a cascade system with normal stress and exponential strength
|
Uma Maheswari, T.S.
|
|
1993
|
33 |
7 |
p. 929-936
8 p.
|
article
|
| 15 |
Reversible dielectric breakdown of thin gate oxides in MOS devices
|
Suñé, J.
|
|
1993
|
33 |
7 |
p. 1031-1039
9 p.
|
article
|
| 16 |
The analysis of the states of buffer in a CIMS production line
|
Min, Tan
|
|
1993
|
33 |
7 |
p. 937-940
4 p.
|
article
|
| 17 |
The paradox of monotony of systems by fuzzy probability
|
Utkin, Lev V.
|
|
1993
|
33 |
7 |
p. 951-955
5 p.
|
article
|
| 18 |
The reliability of laser diodes and laser transmitter modules
|
Sim, S.P.
|
|
1993
|
33 |
7 |
p. 1011-1030
20 p.
|
article
|
| 19 |
The truncated service time Erlangian overflow queues with balking
|
Abou-El-Ata, M.O.
|
|
1993
|
33 |
7 |
p. 941-945
5 p.
|
article
|
Journal description