| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A bulk queueing system with random failures and two phase repairs
|
Madan, K.C.
|
|
1992
|
32 |
5 |
p. 669-677
9 p.
|
artikel
|
| 2 |
After CFCs? options for cleaning electronics assemblies
|
G.W.A.D.,
|
|
1992
|
32 |
5 |
p. 737-738
2 p.
|
artikel
|
| 3 |
A general replacement of a system subject to shocks
|
Sheu, Shey-Huei
|
|
1992
|
32 |
5 |
p. 657-662
6 p.
|
artikel
|
| 4 |
A new model for a lifetime distribution with bathtub shaped failure rate
|
Haupt, Elvira
|
|
1992
|
32 |
5 |
p. 633-639
7 p.
|
artikel
|
| 5 |
A note on a paper by Gupta and Kumar
|
Manna, D.K.
|
|
1992
|
32 |
5 |
p. 733-735
3 p.
|
artikel
|
| 6 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1992
|
32 |
5 |
p. 747-750
4 p.
|
artikel
|
| 7 |
Chip yield modeling related to photolithographic defects
|
Stamenković, Z.
|
|
1992
|
32 |
5 |
p. 663-668
6 p.
|
artikel
|
| 8 |
Electromigration reliability evaluation for a three-level metallization process
|
Triantafyllou, Markos
|
|
1992
|
32 |
5 |
p. 621-631
11 p.
|
artikel
|
| 9 |
Estimation of environmental factors for the log normal distribution
|
Wang, Hong-Zhou
|
|
1992
|
32 |
5 |
p. 679-685
7 p.
|
artikel
|
| 10 |
Failure modes and effects analysis — Bibliography
|
Dhillon, B.S.
|
|
1992
|
32 |
5 |
p. 719-731
13 p.
|
artikel
|
| 11 |
Foundations for microstrip circuit design — Second Edition
|
G.W.A.D.,
|
|
1992
|
32 |
5 |
p. 739-740
2 p.
|
artikel
|
| 12 |
Human factors in product design
|
Popentiu, Fl.
|
|
1992
|
32 |
5 |
p. 744-
1 p.
|
artikel
|
| 13 |
Markov availability models on neural networks
|
Suliman, Mamoun
|
|
1992
|
32 |
5 |
p. 687-697
11 p.
|
artikel
|
| 14 |
Mental Models and Human-Computer Interaction—2
|
Popentiu, Fl
|
|
1992
|
32 |
5 |
p. 742-
1 p.
|
artikel
|
| 15 |
Mental Models and Human-Computer Interaction—I
|
Popentiu, Fl.
|
|
1992
|
32 |
5 |
p. 741-
1 p.
|
artikel
|
| 16 |
Network Reliability and Algebraic Structures
|
Popentiu, Fl
|
|
1992
|
32 |
5 |
p. 745-
1 p.
|
artikel
|
| 17 |
Optimal replacement of a k-out-of-n system subject to shocks
|
Sheu, Shey-Huei
|
|
1992
|
32 |
5 |
p. 649-655
7 p.
|
artikel
|
| 18 |
Optimal smoothing parameter of Fourier series density estimates under an autoregressive dependence model
|
Hosni, A.K.
|
|
1992
|
32 |
5 |
p. 617-620
4 p.
|
artikel
|
| 19 |
Optimal system-profit design of k-to-l-out-of-n systems
|
Pham, Hoang
|
|
1992
|
32 |
5 |
p. 711-718
8 p.
|
artikel
|
| 20 |
Parallel-series and series-parallel redundant systems consisting of units having two kinds of failure rates
|
Yamashiro, Mitsuo
|
|
1992
|
32 |
5 |
p. 611-613
3 p.
|
artikel
|
| 21 |
Physical aspects and a method for evaluating CMOS IC workability when affected by destabilizing factors
|
Chernyshev, Alexander A.
|
|
1992
|
32 |
5 |
p. 615-616
2 p.
|
artikel
|
| 22 |
Publications, notices, calls for papers, etc.
|
|
|
1992
|
32 |
5 |
p. 751-754
4 p.
|
artikel
|
| 23 |
Reliability analysis of a system in a fluctuating environment
|
Singh, Jai
|
|
1992
|
32 |
5 |
p. 601-603
3 p.
|
artikel
|
| 24 |
Reliability-centered maintenance: Management and Engineering Methods
|
Popentiu, Fl
|
|
1992
|
32 |
5 |
p. 743-
1 p.
|
artikel
|
| 25 |
Representation of reliability-decay processes by time-dependent autoregressive models
|
Singh, N.
|
|
1992
|
32 |
5 |
p. 641-648
8 p.
|
artikel
|
| 26 |
Software reliability growth model with debugging efforts
|
Leung, Yiu-Wing
|
|
1992
|
32 |
5 |
p. 699-704
6 p.
|
artikel
|
| 27 |
Test against a change in NBUE trends with change-point unknown
|
Wei, Xianhua
|
|
1992
|
32 |
5 |
p. 605-606
2 p.
|
artikel
|
| 28 |
Test exponentiality against a monotone hazard function alternative based on TTT transformation
|
Wei, Xianhua
|
|
1992
|
32 |
5 |
p. 607-610
4 p.
|
artikel
|
| 29 |
The service Erlangian machine interference with balking
|
Al-Seedy, R.O.
|
|
1992
|
32 |
5 |
p. 705-710
6 p.
|
artikel
|
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