nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A reliability analysis of a k-out-of-N:G redundant system with common-cause failures and critical human errors
|
Who Kee Chung, |
|
1990 |
30 |
2 |
p. 237-241 5 p. |
artikel |
2 |
A three-unit standby redundant system with repair and preventive maintenance
|
Mokaddis, G.S. |
|
1990 |
30 |
2 |
p. 313-325 13 p. |
artikel |
3 |
4835459 Automatic fault insertion system (AFIS)
|
Hamlin, JackW |
|
1990 |
30 |
2 |
p. ii- 1 p. |
artikel |
4 |
Bibliography of literature on testability
|
Dhillon, B.S. |
|
1990 |
30 |
2 |
p. 375-415 41 p. |
artikel |
5 |
Combining vertex decompositions with factoring in an all-terminal network reliability algorithm
|
Page, Lavon B. |
|
1990 |
30 |
2 |
p. 249-263 15 p. |
artikel |
6 |
Common-cause failures and critical human errors in repairable and non-repairable systems
|
Who Kee Chung, |
|
1990 |
30 |
2 |
p. 243-247 5 p. |
artikel |
7 |
4837502 Computer-aided, logic pulsing probe for locating faulty circuits on a printed circuit card
|
Ugenti, Michael |
|
1990 |
30 |
2 |
p. ii-iii nvt p. |
artikel |
8 |
4835464 Decoupling apparatus for use with integrated circuit tester
|
Slye, BradleyD |
|
1990 |
30 |
2 |
p. ii- 1 p. |
artikel |
9 |
4832250 Electronic circuit board rework and repair system
|
Spigarelli, Donald |
|
1990 |
30 |
2 |
p. i- 1 p. |
artikel |
10 |
Fault-tolerant synchronization using phase-locked clocks
|
Krishna, C.M. |
|
1990 |
30 |
2 |
p. 275-287 13 p. |
artikel |
11 |
Functional burn-in for integrated circuits
|
Wurnik, Franz |
|
1990 |
30 |
2 |
p. 265-274 10 p. |
artikel |
12 |
4835469 Integrated circuit clip for circuit analyzer
|
Jones, WayneR |
|
1990 |
30 |
2 |
p. ii- 1 p. |
artikel |
13 |
4833676 Interleaved method and circuitry for testing for stuck open faults
|
Koo, Frances |
|
1990 |
30 |
2 |
p. i- 1 p. |
artikel |
14 |
4833396 Lead frame short tester
|
Haberland, Ernest |
|
1990 |
30 |
2 |
p. i- 1 p. |
artikel |
15 |
Modular fault tolerant VLSI parallel processor architectures with dynamic redundancy
|
Rayapati, Venkatapathi Naidu |
|
1990 |
30 |
2 |
p. 213-236 24 p. |
artikel |
16 |
4837552 Non-volatile fault display with magnetic reset switch for adaptive braking system
|
Vandemotter, PatrickJ |
|
1990 |
30 |
2 |
p. iii- 1 p. |
artikel |
17 |
4837764 Programmable apparatus and method for testing computer peripherals
|
Russello, VincentJ |
|
1990 |
30 |
2 |
p. iii- 1 p. |
artikel |
18 |
Publications, notices, calls for papers, etc.
|
|
|
1990 |
30 |
2 |
p. 205-209 5 p. |
artikel |
19 |
Society of reliability engineers bulletin
|
|
|
1990 |
30 |
2 |
p. 211- 1 p. |
artikel |
20 |
Soldering in electronics
|
G.W.A.D., |
|
1990 |
30 |
2 |
p. 417-418 2 p. |
artikel |
21 |
System reliability
|
G.W.A.D., |
|
1990 |
30 |
2 |
p. 418-419 2 p. |
artikel |
22 |
4837765 Test control circuit for integrated circuit
|
Suzuki, Takamas |
|
1990 |
30 |
2 |
p. iii-iv nvt p. |
artikel |
23 |
Threshold systems and their reliability
|
Rushdi, Ali M. |
|
1990 |
30 |
2 |
p. 299-312 14 p. |
artikel |
24 |
Two models for two unit warm standby redundant system with two different kinds of repair and tolerable time
|
Mokaddis, G.S. |
|
1990 |
30 |
2 |
p. 327-374 48 p. |
artikel |
25 |
Two unit repairable redundant standby system
|
Singh, R.P. |
|
1990 |
30 |
2 |
p. 289-298 10 p. |
artikel |