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                             67 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Aircraft maintenance costs reduced by Jet-engine vibration monitor 1964
 3 2 p. 139-
1 p.
 artikel
2 A laboratory for the development of micromodules 1964
 3 2 p. 142-
1 p.
 artikel
3 A new approach to transistor reliability prediction 1964
 3 2 p. 140-
1 p.
 artikel
4 A new crossed-film cryotron structure with superimposed controls 1964
 3 2 p. 146-
1 p.
 artikel
5 A review of the growth and structure of thin films of germanium and silicon Newman, R.C.
 1964
 3 2 p. 121-128
8 p.
 artikel
6 Bureau of ships maintainability specification 1964
 3 2 p. 142-
1 p.
 artikel
7 Characteristics of broadband parametric amplifiers using filter networks 1964
 3 2 p. 148-
1 p.
 artikel
8 Choosing logic for microcircuits 1964
 3 2 p. 142-
1 p.
 artikel
9 Component parts reliability programmes in USAERDL 1964
 3 2 p. 140-
1 p.
 artikel
10 Electron current through metal-insulator-metal sandwiches 1964
 3 2 p. 144-
1 p.
 artikel
11 Electronic system reliability—an American viewpoint 1964
 3 2 p. 139-
1 p.
 artikel
12 Electron mobilities in organic semiconductors 1964
 3 2 p. 145-
1 p.
 artikel
13 Evaluation of film and filmless radiographic systems for the non-destructive testing of thin materials and electronic assemblies 1964
 3 2 p. 148-
1 p.
 artikel
14 Experimental study of the phenomena associated with the presence of high electric fields in the thin insulating films 1964
 3 2 p. 146-
1 p.
 artikel
15 Failure analysis of potted electronic modules 1964
 3 2 p. 140-
1 p.
 artikel
16 Flip chips easier to connect 1964
 3 2 p. 142-
1 p.
 artikel
17 High vacuum with sputter-ion pumps 1964
 3 2 p. 148-
1 p.
 artikel
18 How much does redundancy improve reliability? 1964
 3 2 p. 141-
1 p.
 artikel
19 Impedance of semiconductor-insulator-metal capacitors 1964
 3 2 p. 144-145
2 p.
 artikel
20 Improvements in semiconductor reliability 1964
 3 2 p. 141-
1 p.
 artikel
21 Integrated-circuit oscillator requires few components 1964
 3 2 p. 143-
1 p.
 artikel
22 Integrated circuits—new thoughts on computer circuit design Aleksander, I.
 1964
 3 2 p. 81-90
10 p.
 artikel
23 Integrated semiconductor networks in electromechanical control systems 1964
 3 2 p. 143-
1 p.
 artikel
24 Investigation of the outgassing process of silicone rubber 1964
 3 2 p. 145-146
2 p.
 artikel
25 Letter to the editor Liben, William
 1964
 3 2 p. 151-
1 p.
 artikel
26 Logic principles for multi-emitter transistors 1964
 3 2 p. 145-
1 p.
 artikel
27 Magnetic film storage elements 1964
 3 2 p. 147-
1 p.
 artikel
28 Measurement of gas emission from solid surfaces 1964
 3 2 p. 144-
1 p.
 artikel
29 Metallographic polishing techniques for semiconductor components 1964
 3 2 p. 140-
1 p.
 artikel
30 Microcomputer comes off the line 1964
 3 2 p. 142-143
2 p.
 artikel
31 Microelectronic components: capability and availability 1964
 3 2 p. 142-
1 p.
 artikel
32 Microelectronics—the thin film approach 1964
 3 2 p. 147-
1 p.
 artikel
33 Multiple pin-hole camera for microelectronics 1964
 3 2 p. 149-
1 p.
 artikel
34 New semiconductor networks reduce system complexity 1964
 3 2 p. 144-
1 p.
 artikel
35 Novel field-effect device provides broadband gain 1964
 3 2 p. 145-
1 p.
 artikel
36 Optical coupling: new approach to microcircuit interconnections 1964
 3 2 p. 143-
1 p.
 artikel
37 Packaging flat-pack integrated circuit blocks 1964
 3 2 p. 143-
1 p.
 artikel
38 Predicting system checkout error 1964
 3 2 p. 139-
1 p.
 artikel
39 Progress and pitfalls in microelectronics 1964
 3 2 p. 142-
1 p.
 artikel
40 Progress report on diffusion pump development 1964
 3 2 p. 146-
1 p.
 artikel
41 Pyrolytic deposition of silicon dioxide for 600°C thin film capacitors 1964
 3 2 p. 147-148
2 p.
 artikel
42 Redundancy techniques for reliable flight-control computers 1964
 3 2 p. 141-142
2 p.
 artikel
43 Reliability data for integrated circuits 1964
 3 2 p. 145-
1 p.
 artikel
44 Reliability physics (the physics of failure) 1964
 3 2 p. 139-
1 p.
 artikel
45 Reliability tradeoff: circuit redundancy vs. circuit checkout 1964
 3 2 p. 141-
1 p.
 artikel
46 Reliability trends in space electronics 1964
 3 2 p. 142-
1 p.
 artikel
47 Routiner searches out line faults 1964
 3 2 p. 142-
1 p.
 artikel
48 Semiconductor integrated circuits 1964
 3 2 p. 145-
1 p.
 artikel
49 SSB system goal is 20-year life 1964
 3 2 p. 141-
1 p.
 artikel
50 Surface self-diffusion of iodide ions in thin films 1964
 3 2 p. 147-
1 p.
 artikel
51 Synthesis of correcting network for a feedback amplifier 1964
 3 2 p. 149-
1 p.
 artikel
52 Techniques for sputtering single and multilayer films of uniform resistivity 1964
 3 2 p. 147-
1 p.
 artikel
53 The average conductivity of diffused layers in semiconductors 1964
 3 2 p. 143-144
2 p.
 artikel
54 The deposition of alumina, silica and magnesia films by electron bombardment evaporation Lewis, Brian
 1964
 3 2 p. 109-120
12 p.
 artikel
55 The design of feedback tuned amplifiers using distributed bridged T networks Gay, M.J.
 1964
 3 2 p. 93-107
15 p.
 artikel
56 The dip-soldering of printed circuitry 1964
 3 2 p. 148-149
2 p.
 artikel
57 The effect of fabrication variables on chromium thin film resistors 1964
 3 2 p. 145-
1 p.
 artikel
58 The future of thin-film active devices 1964
 3 2 p. 146-
1 p.
 artikel
59 The preparation of evaporated micro-circuit 1964
 3 2 p. 147-
1 p.
 artikel
60 The reliability of metallized paper capacitors: practical experiences 1964
 3 2 p. 141-
1 p.
 artikel
61 Thermal evaporation techniques 1964
 3 2 p. 147-
1 p.
 artikel
62 Thermoelectric cooling—an application in solid state electronics 1964
 3 2 p. 148-
1 p.
 artikel
63 The uses of photomechanical processes in the manufacture of micro-miniature circuit 1964
 3 2 p. 148-
1 p.
 artikel
64 Thin film packaging and interconnections: the development of a packaging philosophy 1964
 3 2 p. 147-
1 p.
 artikel
65 Thin film thermocouples for substrate temperature measurement 1964
 3 2 p. 146-
1 p.
 artikel
66 Using microcircuits in high-resolution range counters 1964
 3 2 p. 143-
1 p.
 artikel
67 Weibull distribution in reliability analysis of certain electronic components 1964
 3 2 p. 140-
1 p.
 artikel
                             67 gevonden resultaten
 
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