| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A case study of component failures
|
|
|
1964
|
3 |
1 |
p. 69-
1 p.
|
artikel
|
| 2 |
A circuit packaging model for high-speed computer technology
|
|
|
1964
|
3 |
1 |
p. 70-71
2 p.
|
artikel
|
| 3 |
A comparison of duplicate and triplicate redundancy schemes for binary logical networks
|
Cluley, J.C.
|
|
1964
|
3 |
1 |
p. 51-59
9 p.
|
artikel
|
| 4 |
A model for the reliability estimation of space systems
|
|
|
1964
|
3 |
1 |
p. 70-
1 p.
|
artikel
|
| 5 |
An aid to efficient maintenance
|
Mortley, W.S.
|
|
1964
|
3 |
1 |
p. 1-2
2 p.
|
artikel
|
| 6 |
An analysis of the effect of impurity diffusion on current density in tunnel diodes
|
|
|
1964
|
3 |
1 |
p. 73-
1 p.
|
artikel
|
| 7 |
An integrated radar system. Part 1: Statistical approach to fault analysis in system design. Part 2: Practical switching arrangement for integrated marine radar system with particular reference to an installation on board SS. Canberra
|
|
|
1964
|
3 |
1 |
p. 69-
1 p.
|
artikel
|
| 8 |
A punched-tape comparator using integrated circuits
|
Forte, P.D.
|
|
1964
|
3 |
1 |
p. 45-48
4 p.
|
artikel
|
| 9 |
Assured reliability in soldered connections
|
|
|
1964
|
3 |
1 |
p. 67-
1 p.
|
artikel
|
| 10 |
Circuit design considerations for integrated circuits
|
|
|
1964
|
3 |
1 |
p. 73-
1 p.
|
artikel
|
| 11 |
Cleaning by ultrasonics
|
|
|
1964
|
3 |
1 |
p. 75-
1 p.
|
artikel
|
| 12 |
Coherent structures of non-identical components
|
|
|
1964
|
3 |
1 |
p. 69-
1 p.
|
artikel
|
| 13 |
Component design, construction and evaluation for satellites
|
|
|
1964
|
3 |
1 |
p. 68-
1 p.
|
artikel
|
| 14 |
Criteria for the identification of a probability distribution based on analysis of life test data
|
|
|
1964
|
3 |
1 |
p. 69-
1 p.
|
artikel
|
| 15 |
Current developments in microminiaturization
|
Bobenrieth, A.
|
|
1964
|
3 |
1 |
p. 35-38
4 p.
|
artikel
|
| 16 |
Development of a peripheral vision command indicator for instrument flight
|
|
|
1964
|
3 |
1 |
p. 76-
1 p.
|
artikel
|
| 17 |
Echo capsule for medical use—a battery-less endoradiosonde
|
|
|
1964
|
3 |
1 |
p. 72-
1 p.
|
artikel
|
| 18 |
Editorial Board
|
|
|
1964
|
3 |
1 |
p. IFC-
1 p.
|
artikel
|
| 19 |
Editor's note
|
|
|
1964
|
3 |
1 |
p. 79-
1 p.
|
artikel
|
| 20 |
Etude de la resistivité électrique des alliages binaires ordonnés
|
|
|
1964
|
3 |
1 |
p. 72-
1 p.
|
artikel
|
| 21 |
Evaluation of wrapped polyethylene terephthalate capacitors
|
|
|
1964
|
3 |
1 |
p. 69-
1 p.
|
artikel
|
| 22 |
Failure modes in high reliability components
|
|
|
1964
|
3 |
1 |
p. 67-
1 p.
|
artikel
|
| 23 |
Flow graph techniques for reliability engineering
|
|
|
1964
|
3 |
1 |
p. 65-66
2 p.
|
artikel
|
| 24 |
Hole injection into CdS from Cu2S
|
|
|
1964
|
3 |
1 |
p. 74-
1 p.
|
artikel
|
| 25 |
Homogeneous semiconductors—a new generation of devices
|
|
|
1964
|
3 |
1 |
p. 73-
1 p.
|
artikel
|
| 26 |
How important are resistor tolerances?
|
|
|
1964
|
3 |
1 |
p. 68-69
2 p.
|
artikel
|
| 27 |
Investigation of the life of capacitors
|
|
|
1964
|
3 |
1 |
p. 68-
1 p.
|
artikel
|
| 28 |
Letter to the editor
|
Palmer, Drayton S.
|
|
1964
|
3 |
1 |
p. 77-
1 p.
|
artikel
|
| 29 |
Logical analysis of redundant reliability flow networks
|
|
|
1964
|
3 |
1 |
p. 66-
1 p.
|
artikel
|
| 30 |
Measuring FET parameters—only simple circuits needed
|
|
|
1964
|
3 |
1 |
p. 75-
1 p.
|
artikel
|
| 31 |
Microelectronics around the world
|
|
|
1964
|
3 |
1 |
p. 72-
1 p.
|
artikel
|
| 32 |
Micromodule reliability
|
|
|
1964
|
3 |
1 |
p. 71-
1 p.
|
artikel
|
| 33 |
Micro-packaging for microelectronics
|
|
|
1964
|
3 |
1 |
p. 71-
1 p.
|
artikel
|
| 34 |
Micropower circuits: new frontier in solid state
|
|
|
1964
|
3 |
1 |
p. 71-
1 p.
|
artikel
|
| 35 |
Microwave measurements on the surface properties of metals
|
|
|
1964
|
3 |
1 |
p. 75-
1 p.
|
artikel
|
| 36 |
Microwelding—laser or electron beam?
|
|
|
1964
|
3 |
1 |
p. 72-
1 p.
|
artikel
|
| 37 |
Modular construction of electronic servo-system elements
|
|
|
1964
|
3 |
1 |
p. 75-
1 p.
|
artikel
|
| 38 |
Nickel-cadmium cells for the spacecraft battery
|
|
|
1964
|
3 |
1 |
p. 68-
1 p.
|
artikel
|
| 39 |
Operator loading tasks
|
|
|
1964
|
3 |
1 |
p. 76-
1 p.
|
artikel
|
| 40 |
Optimum redundancy when components are subject to two kinds of failure
|
|
|
1964
|
3 |
1 |
p. 67-
1 p.
|
artikel
|
| 41 |
Practical applications of the Weibull distribution
|
|
|
1964
|
3 |
1 |
p. 69-
1 p.
|
artikel
|
| 42 |
Pre-launch calculation of space system reliability
|
|
|
1964
|
3 |
1 |
p. 70-
1 p.
|
artikel
|
| 43 |
Problems in detecting leaks with long time constants in long life vacuum devices with sealed glass envelopes
|
|
|
1964
|
3 |
1 |
p. 74-
1 p.
|
artikel
|
| 44 |
Random hazard in reliability problems
|
|
|
1964
|
3 |
1 |
p. 65-
1 p.
|
artikel
|
| 45 |
Rationalized packaging—an evolutionary approach to microminiaturization
|
|
|
1964
|
3 |
1 |
p. 72-
1 p.
|
artikel
|
| 46 |
Redundant semiconductor switching circuits
|
|
|
1964
|
3 |
1 |
p. 70-
1 p.
|
artikel
|
| 47 |
Relationship between system failure rate and component failure rate
|
|
|
1964
|
3 |
1 |
p. 66-
1 p.
|
artikel
|
| 48 |
Reliability and value engineering
|
|
|
1964
|
3 |
1 |
p. 65-
1 p.
|
artikel
|
| 49 |
Reliability, democracy and man in systems
|
|
|
1964
|
3 |
1 |
p. 66-67
2 p.
|
artikel
|
| 50 |
Reliability studies of mesa transistors
|
|
|
1964
|
3 |
1 |
p. 68-
1 p.
|
artikel
|
| 51 |
Reliability through redundancy and error-checking codes
|
|
|
1964
|
3 |
1 |
p. 71-
1 p.
|
artikel
|
| 52 |
Reliable circuits through redundancy. Part 1: Redundant circuit philosophy. Part 2: Redundant circuit design
|
|
|
1964
|
3 |
1 |
p. 71-
1 p.
|
artikel
|
| 53 |
Saving microcircuit power with tunnel-diode coupling
|
|
|
1964
|
3 |
1 |
p. 72-
1 p.
|
artikel
|
| 54 |
Silicon heavily doped by energetic cesium ions
|
|
|
1964
|
3 |
1 |
p. 72-73
2 p.
|
artikel
|
| 55 |
Some methods of leak testing in high-vacuum systems and components
|
|
|
1964
|
3 |
1 |
p. 73-
1 p.
|
artikel
|
| 56 |
Some problems related to the practical application of exponential reliability law
|
|
|
1964
|
3 |
1 |
p. 65-
1 p.
|
artikel
|
| 57 |
Sorption pumping at high and ultra-high vacua
|
|
|
1964
|
3 |
1 |
p. 74-75
2 p.
|
artikel
|
| 58 |
Sources of surface contamination in vacuum evaporation systems
|
|
|
1964
|
3 |
1 |
p. 74-
1 p.
|
artikel
|
| 59 |
System worth and incentive contracts
|
|
|
1964
|
3 |
1 |
p. 66-
1 p.
|
artikel
|
| 60 |
Techniques for achieving operational reliability and maintainability in digital computers
|
|
|
1964
|
3 |
1 |
p. 71-
1 p.
|
artikel
|
| 61 |
The application of statistical techniques to vibration analysis and testing
|
|
|
1964
|
3 |
1 |
p. 67-
1 p.
|
artikel
|
| 62 |
The computer reliability report
|
|
|
1964
|
3 |
1 |
p. 70-
1 p.
|
artikel
|
| 63 |
The course on genral concepts of electronic equipment reliability at Borough Polytechnic, London, 11–13 June, 1963
|
|
|
1964
|
3 |
1 |
p. 66-
1 p.
|
artikel
|
| 64 |
The design and construction of the electronics package
|
|
|
1964
|
3 |
1 |
p. 67-
1 p.
|
artikel
|
| 65 |
The effect of rate and direction of display movement upon visual search
|
|
|
1964
|
3 |
1 |
p. 75-
1 p.
|
artikel
|
| 66 |
The electrical characteristics of the “Telstar” conical horn-reflector antenna
|
|
|
1964
|
3 |
1 |
p. 70-
1 p.
|
artikel
|
| 67 |
The first international colloquium on the application of vacuum techniques to the semiconductor industry
|
|
|
1964
|
3 |
1 |
p. 73-
1 p.
|
artikel
|
| 68 |
The impact of microelectronics
|
|
|
1964
|
3 |
1 |
p. 71-
1 p.
|
artikel
|
| 69 |
The influence of fore-vacuum conditions on ultra-high vacuum pumping systems with oil diffusion pumps
|
|
|
1964
|
3 |
1 |
p. 74-
1 p.
|
artikel
|
| 70 |
The life-expectancy of cold-cathode tubes
|
|
|
1964
|
3 |
1 |
p. 68-
1 p.
|
artikel
|
| 71 |
The mechanical design of the “Telstar” horn-reflector antenna and radome
|
|
|
1964
|
3 |
1 |
p. 70-
1 p.
|
artikel
|
| 72 |
The practical significance of reliability predictions
|
|
|
1964
|
3 |
1 |
p. 65-
1 p.
|
artikel
|
| 73 |
The reliability of microelectronic circuit packages as compared to that of conventional circuit packages
|
|
|
1964
|
3 |
1 |
p. 66-
1 p.
|
artikel
|
| 74 |
The satellite ferrimagnetic power limiter
|
|
|
1964
|
3 |
1 |
p. 75-
1 p.
|
artikel
|
| 75 |
The spacecraft power supply system
|
|
|
1964
|
3 |
1 |
p. 75-76
2 p.
|
artikel
|
| 76 |
The structure of vacuum condensed Ni-Cr films
|
Bicknell, R.W.
|
|
1964
|
3 |
1 |
p. 61-62
2 p.
|
artikel
|
| 77 |
Thin film circuits—Part III. Engineering a microcircuit module
|
Manfield, H.G.
|
|
1964
|
3 |
1 |
p. 25-34
10 p.
|
artikel
|
| 78 |
Thin film circuits—Part II. The development of thin film resistors and capacitors for microcircuits
|
Manfield, H.G.
|
|
1964
|
3 |
1 |
p. 13-16
4 p.
|
artikel
|
| 79 |
Thin film circuits—Part I. The uses of photomechanical processes in the manufacture of micro-miniature circuits
|
Manfield, H.G.
|
|
1964
|
3 |
1 |
p. 5-6
2 p.
|
artikel
|
| 80 |
Try field-effect transistors for redundancy
|
|
|
1964
|
3 |
1 |
p. 72-
1 p.
|
artikel
|
| 81 |
Ultra-high vacuum in small glass systems
|
|
|
1964
|
3 |
1 |
p. 74-
1 p.
|
artikel
|
| 82 |
Use of the military standard plans for hazard rate under the Weibull distribution
|
|
|
1964
|
3 |
1 |
p. 69-70
2 p.
|
artikel
|
| 83 |
Variables influencing operator information processing
|
|
|
1964
|
3 |
1 |
p. 76-
1 p.
|
artikel
|
| 84 |
Will lasers weld circuit components?
|
|
|
1964
|
3 |
1 |
p. 72-
1 p.
|
artikel
|
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