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                             84 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A case study of component failures 1964
3 1 p. 69-
1 p.
artikel
2 A circuit packaging model for high-speed computer technology 1964
3 1 p. 70-71
2 p.
artikel
3 A comparison of duplicate and triplicate redundancy schemes for binary logical networks Cluley, J.C.
1964
3 1 p. 51-59
9 p.
artikel
4 A model for the reliability estimation of space systems 1964
3 1 p. 70-
1 p.
artikel
5 An aid to efficient maintenance Mortley, W.S.
1964
3 1 p. 1-2
2 p.
artikel
6 An analysis of the effect of impurity diffusion on current density in tunnel diodes 1964
3 1 p. 73-
1 p.
artikel
7 An integrated radar system. Part 1: Statistical approach to fault analysis in system design. Part 2: Practical switching arrangement for integrated marine radar system with particular reference to an installation on board SS. Canberra 1964
3 1 p. 69-
1 p.
artikel
8 A punched-tape comparator using integrated circuits Forte, P.D.
1964
3 1 p. 45-48
4 p.
artikel
9 Assured reliability in soldered connections 1964
3 1 p. 67-
1 p.
artikel
10 Circuit design considerations for integrated circuits 1964
3 1 p. 73-
1 p.
artikel
11 Cleaning by ultrasonics 1964
3 1 p. 75-
1 p.
artikel
12 Coherent structures of non-identical components 1964
3 1 p. 69-
1 p.
artikel
13 Component design, construction and evaluation for satellites 1964
3 1 p. 68-
1 p.
artikel
14 Criteria for the identification of a probability distribution based on analysis of life test data 1964
3 1 p. 69-
1 p.
artikel
15 Current developments in microminiaturization Bobenrieth, A.
1964
3 1 p. 35-38
4 p.
artikel
16 Development of a peripheral vision command indicator for instrument flight 1964
3 1 p. 76-
1 p.
artikel
17 Echo capsule for medical use—a battery-less endoradiosonde 1964
3 1 p. 72-
1 p.
artikel
18 Editorial Board 1964
3 1 p. IFC-
1 p.
artikel
19 Editor's note 1964
3 1 p. 79-
1 p.
artikel
20 Etude de la resistivité électrique des alliages binaires ordonnés 1964
3 1 p. 72-
1 p.
artikel
21 Evaluation of wrapped polyethylene terephthalate capacitors 1964
3 1 p. 69-
1 p.
artikel
22 Failure modes in high reliability components 1964
3 1 p. 67-
1 p.
artikel
23 Flow graph techniques for reliability engineering 1964
3 1 p. 65-66
2 p.
artikel
24 Hole injection into CdS from Cu2S 1964
3 1 p. 74-
1 p.
artikel
25 Homogeneous semiconductors—a new generation of devices 1964
3 1 p. 73-
1 p.
artikel
26 How important are resistor tolerances? 1964
3 1 p. 68-69
2 p.
artikel
27 Investigation of the life of capacitors 1964
3 1 p. 68-
1 p.
artikel
28 Letter to the editor Palmer, Drayton S.
1964
3 1 p. 77-
1 p.
artikel
29 Logical analysis of redundant reliability flow networks 1964
3 1 p. 66-
1 p.
artikel
30 Measuring FET parameters—only simple circuits needed 1964
3 1 p. 75-
1 p.
artikel
31 Microelectronics around the world 1964
3 1 p. 72-
1 p.
artikel
32 Micromodule reliability 1964
3 1 p. 71-
1 p.
artikel
33 Micro-packaging for microelectronics 1964
3 1 p. 71-
1 p.
artikel
34 Micropower circuits: new frontier in solid state 1964
3 1 p. 71-
1 p.
artikel
35 Microwave measurements on the surface properties of metals 1964
3 1 p. 75-
1 p.
artikel
36 Microwelding—laser or electron beam? 1964
3 1 p. 72-
1 p.
artikel
37 Modular construction of electronic servo-system elements 1964
3 1 p. 75-
1 p.
artikel
38 Nickel-cadmium cells for the spacecraft battery 1964
3 1 p. 68-
1 p.
artikel
39 Operator loading tasks 1964
3 1 p. 76-
1 p.
artikel
40 Optimum redundancy when components are subject to two kinds of failure 1964
3 1 p. 67-
1 p.
artikel
41 Practical applications of the Weibull distribution 1964
3 1 p. 69-
1 p.
artikel
42 Pre-launch calculation of space system reliability 1964
3 1 p. 70-
1 p.
artikel
43 Problems in detecting leaks with long time constants in long life vacuum devices with sealed glass envelopes 1964
3 1 p. 74-
1 p.
artikel
44 Random hazard in reliability problems 1964
3 1 p. 65-
1 p.
artikel
45 Rationalized packaging—an evolutionary approach to microminiaturization 1964
3 1 p. 72-
1 p.
artikel
46 Redundant semiconductor switching circuits 1964
3 1 p. 70-
1 p.
artikel
47 Relationship between system failure rate and component failure rate 1964
3 1 p. 66-
1 p.
artikel
48 Reliability and value engineering 1964
3 1 p. 65-
1 p.
artikel
49 Reliability, democracy and man in systems 1964
3 1 p. 66-67
2 p.
artikel
50 Reliability studies of mesa transistors 1964
3 1 p. 68-
1 p.
artikel
51 Reliability through redundancy and error-checking codes 1964
3 1 p. 71-
1 p.
artikel
52 Reliable circuits through redundancy. Part 1: Redundant circuit philosophy. Part 2: Redundant circuit design 1964
3 1 p. 71-
1 p.
artikel
53 Saving microcircuit power with tunnel-diode coupling 1964
3 1 p. 72-
1 p.
artikel
54 Silicon heavily doped by energetic cesium ions 1964
3 1 p. 72-73
2 p.
artikel
55 Some methods of leak testing in high-vacuum systems and components 1964
3 1 p. 73-
1 p.
artikel
56 Some problems related to the practical application of exponential reliability law 1964
3 1 p. 65-
1 p.
artikel
57 Sorption pumping at high and ultra-high vacua 1964
3 1 p. 74-75
2 p.
artikel
58 Sources of surface contamination in vacuum evaporation systems 1964
3 1 p. 74-
1 p.
artikel
59 System worth and incentive contracts 1964
3 1 p. 66-
1 p.
artikel
60 Techniques for achieving operational reliability and maintainability in digital computers 1964
3 1 p. 71-
1 p.
artikel
61 The application of statistical techniques to vibration analysis and testing 1964
3 1 p. 67-
1 p.
artikel
62 The computer reliability report 1964
3 1 p. 70-
1 p.
artikel
63 The course on genral concepts of electronic equipment reliability at Borough Polytechnic, London, 11–13 June, 1963 1964
3 1 p. 66-
1 p.
artikel
64 The design and construction of the electronics package 1964
3 1 p. 67-
1 p.
artikel
65 The effect of rate and direction of display movement upon visual search 1964
3 1 p. 75-
1 p.
artikel
66 The electrical characteristics of the “Telstar” conical horn-reflector antenna 1964
3 1 p. 70-
1 p.
artikel
67 The first international colloquium on the application of vacuum techniques to the semiconductor industry 1964
3 1 p. 73-
1 p.
artikel
68 The impact of microelectronics 1964
3 1 p. 71-
1 p.
artikel
69 The influence of fore-vacuum conditions on ultra-high vacuum pumping systems with oil diffusion pumps 1964
3 1 p. 74-
1 p.
artikel
70 The life-expectancy of cold-cathode tubes 1964
3 1 p. 68-
1 p.
artikel
71 The mechanical design of the “Telstar” horn-reflector antenna and radome 1964
3 1 p. 70-
1 p.
artikel
72 The practical significance of reliability predictions 1964
3 1 p. 65-
1 p.
artikel
73 The reliability of microelectronic circuit packages as compared to that of conventional circuit packages 1964
3 1 p. 66-
1 p.
artikel
74 The satellite ferrimagnetic power limiter 1964
3 1 p. 75-
1 p.
artikel
75 The spacecraft power supply system 1964
3 1 p. 75-76
2 p.
artikel
76 The structure of vacuum condensed Ni-Cr films Bicknell, R.W.
1964
3 1 p. 61-62
2 p.
artikel
77 Thin film circuits—Part III. Engineering a microcircuit module Manfield, H.G.
1964
3 1 p. 25-34
10 p.
artikel
78 Thin film circuits—Part II. The development of thin film resistors and capacitors for microcircuits Manfield, H.G.
1964
3 1 p. 13-16
4 p.
artikel
79 Thin film circuits—Part I. The uses of photomechanical processes in the manufacture of micro-miniature circuits Manfield, H.G.
1964
3 1 p. 5-6
2 p.
artikel
80 Try field-effect transistors for redundancy 1964
3 1 p. 72-
1 p.
artikel
81 Ultra-high vacuum in small glass systems 1964
3 1 p. 74-
1 p.
artikel
82 Use of the military standard plans for hazard rate under the Weibull distribution 1964
3 1 p. 69-70
2 p.
artikel
83 Variables influencing operator information processing 1964
3 1 p. 76-
1 p.
artikel
84 Will lasers weld circuit components? 1964
3 1 p. 72-
1 p.
artikel
                             84 gevonden resultaten
 
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