| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
A fault model for multivalued NMOS dynamic random access memories
|
Venkatapathi Naidu, R.
|
|
1989
|
29 |
2 |
p. 137-143
7 p.
|
article
|
| 2 |
An age replacement policy with increasing minimal repair cost
|
Yun, Won Young
|
|
1989
|
29 |
2 |
p. 153-157
5 p.
|
article
|
| 3 |
A new method for fuzzy fault tree analysis
|
Misra, Krishna B.
|
|
1989
|
29 |
2 |
p. 195-216
22 p.
|
article
|
| 4 |
An n unit system with spares
|
Subramanian, R.
|
|
1989
|
29 |
2 |
p. 95-105
11 p.
|
article
|
| 5 |
4736108 Apparatus and method for testing coplanarity of semiconductor components
|
Comstock, RobertL
|
|
1989
|
29 |
2 |
p. 288-
1 p.
|
article
|
| 6 |
4755746 Apparatus and methods for semiconductor wafer testing
|
Mallory, Cheste
|
|
1989
|
29 |
2 |
p. 292-293
2 p.
|
article
|
| 7 |
4736375 Apparatus for fast generation of large quantities of test data words in a test facility
|
Tannhauser, Rol
|
|
1989
|
29 |
2 |
p. 288-
1 p.
|
article
|
| 8 |
4733172 Apparatus for testing I.C. chip
|
Smolley, Robert
|
|
1989
|
29 |
2 |
p. 285-
1 p.
|
article
|
| 9 |
4736374 Automated test apparatus for use with multiple equipment
|
Kump, Donal
|
|
1989
|
29 |
2 |
p. 288-
1 p.
|
article
|
| 10 |
Bayes estimation of the reliability of a system under a random environment governed by a Dirichlet prior
|
Kumar, S.
|
|
1989
|
29 |
2 |
p. 255-265
11 p.
|
article
|
| 11 |
Bibliography of literature on safety factors
|
Dhillon, B.S.
|
|
1989
|
29 |
2 |
p. 267-280
14 p.
|
article
|
| 12 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1989
|
29 |
2 |
p. 81-85
5 p.
|
article
|
| 13 |
Comparative reliability study of n +−n and n +−n−n + Gunn diodes
|
Mojzes, I.
|
|
1989
|
29 |
2 |
p. 131-132
2 p.
|
article
|
| 14 |
Comparison of a simulation and an exact method for reliability evaluation of large networks using a personal computer
|
Kalyan, R.
|
|
1989
|
29 |
2 |
p. 133-136
4 p.
|
article
|
| 15 |
Correlation between thermal resistance, channel temperature, infrared thermal maps and failure mechanisms in low power MESFET devices
|
Canali, C.
|
|
1989
|
29 |
2 |
p. 117-124
8 p.
|
article
|
| 16 |
4739258 Dynamic testing of thin-film conductor
|
Schwarz, JamesA
|
|
1989
|
29 |
2 |
p. 286-
1 p.
|
article
|
| 17 |
4733394 Electrically programmable semiconductor memory showing redundance
|
Giebel, Burkhard
|
|
1989
|
29 |
2 |
p. 286-
1 p.
|
article
|
| 18 |
Erratum
|
|
|
1989
|
29 |
2 |
p. 295-
1 p.
|
article
|
| 19 |
4749947 Grid-based, cross-check test structure for testing integrated circuits
|
Gheewala, TusharR
|
|
1989
|
29 |
2 |
p. 290-
1 p.
|
article
|
| 20 |
4757523 High speed testing of integrated circuit
|
Tran, BaoG
|
|
1989
|
29 |
2 |
p. 294-
1 p.
|
article
|
| 21 |
4739505 IC chip error detecting and correcting apparatus with automatic self-checking of chip operation
|
Leslie, Duane
|
|
1989
|
29 |
2 |
p. 287-
1 p.
|
article
|
| 22 |
Improving reliability in computer based systems
|
Duffuaa, Salih O.
|
|
1989
|
29 |
2 |
p. 177-184
8 p.
|
article
|
| 23 |
Increase of critical current density and voltage for triggering avalanche injection through use of graded collector doping
|
Hassan, M.M.Shahidul
|
|
1989
|
29 |
2 |
p. 217-226
10 p.
|
article
|
| 24 |
4740970 Integrated circuit arrangement
|
Burrows, David
|
|
1989
|
29 |
2 |
p. 287-
1 p.
|
article
|
| 25 |
Material processing with Nd-lasers
|
G.W.A.D.,
|
|
1989
|
29 |
2 |
p. 283-
1 p.
|
article
|
| 26 |
Memo to all Indian authors
|
G.W.A.D,
|
|
1989
|
29 |
2 |
p. 93-
1 p.
|
article
|
| 27 |
4737236 Method of making microwave integrated circuits
|
Perko, RichardJ
|
|
1989
|
29 |
2 |
p. 289-
1 p.
|
article
|
| 28 |
4752590 Method of producing SOI devices
|
Adams, ArthurC
|
|
1989
|
29 |
2 |
p. 291-
1 p.
|
article
|
| 29 |
4740713 MOS semiconductor integrated circuit in which the production of hot carriers near the drain of a short N channel conductivity type MOS transistor is decreased
|
Sakurai, Takayasu
|
|
1989
|
29 |
2 |
p. 287-
1 p.
|
article
|
| 30 |
On ranking of system components with respect to different improvement actions
|
Xie, M.
|
|
1989
|
29 |
2 |
p. 159-164
6 p.
|
article
|
| 31 |
Performance analysis of a safety monitoring system under human-machine interface of safety-presentation type
|
Inagaki, Toshiyuki
|
|
1989
|
29 |
2 |
p. 165-175
11 p.
|
article
|
| 32 |
4736520 Process for assembling integrated circuit packages
|
Morris, James
|
|
1989
|
29 |
2 |
p. 289-
1 p.
|
article
|
| 33 |
4754408 Progressive insertion placement of elements on an integrated circuit
|
Carpenter, KurtD
|
|
1989
|
29 |
2 |
p. 292-
1 p.
|
article
|
| 34 |
Publications, notices, calls for papers, etc.
|
|
|
1989
|
29 |
2 |
p. 87-92
6 p.
|
article
|
| 35 |
4748491 Redundant circuit of semiconductor device and method of producing same
|
Takagi, Hiroshi
|
|
1989
|
29 |
2 |
p. 289-290
2 p.
|
article
|
| 36 |
Reliability analysis of a two-unit cold standby system with a replaceable repair facility
|
Cao, Jinhua
|
|
1989
|
29 |
2 |
p. 145-150
6 p.
|
article
|
| 37 |
R-reliable intervals and confidences for the lifetime of a parallel system
|
Jaisingh, Lloyd R.
|
|
1989
|
29 |
2 |
p. 237-253
17 p.
|
article
|
| 38 |
4732865 Self-aligned internal mobile ion getter for multi-layer metallization on integrated circuits
|
Evans, DavidR
|
|
1989
|
29 |
2 |
p. 285-
1 p.
|
article
|
| 39 |
4754215 Self-diagnosable integrated circuit device capable of testing sequential circuit elements
|
Kawai, Masato
|
|
1989
|
29 |
2 |
p. 292-
1 p.
|
article
|
| 40 |
4757503 Self-testing dynamic RAM
|
Hayes, JohnP
|
|
1989
|
29 |
2 |
p. 294-
1 p.
|
article
|
| 41 |
4739250 Semiconductor integrated circuit device with test circuit
|
Tanizawa, Tets
|
|
1989
|
29 |
2 |
p. 286-
1 p.
|
article
|
| 42 |
4752914 Semiconductor integrated circuit with redundant circuit replacement
|
Nakano, Masao
|
|
1989
|
29 |
2 |
p. 291-
1 p.
|
article
|
| 43 |
4757475 Semiconductor memory device having diode matrix type decoder and redundancy configuration
|
Awaya, Tomoharu
|
|
1989
|
29 |
2 |
p. 293-294
2 p.
|
article
|
| 44 |
4757474 Semiconductor memory device having redundancy circuit portion
|
Fukushi, Isao
|
|
1989
|
29 |
2 |
p. 293-
1 p.
|
article
|
| 45 |
4748597 Semiconductor memory device with redundancy circuits
|
Saito, Shozo
|
|
1989
|
29 |
2 |
p. 290-
1 p.
|
article
|
| 46 |
4733372 Semiconductor memory having redundancy
|
Nanbu, Hiroaki
|
|
1989
|
29 |
2 |
p. 285-286
2 p.
|
article
|
| 47 |
4751611 Semiconductor package structure
|
Arai, Toshiyuk
|
|
1989
|
29 |
2 |
p. 291-
1 p.
|
article
|
| 48 |
4746856 Semiconductor testing and apparatus therefor
|
Allred, LaurenceL
|
|
1989
|
29 |
2 |
p. 289-
1 p.
|
article
|
| 49 |
Statistical procedures for the exponential power distribution
|
Koh, Viroy C.
|
|
1989
|
29 |
2 |
p. 227-236
10 p.
|
article
|
| 50 |
Step stress tests: Monte Carlo simulation and evaluation
|
Trujillo, Hector
|
|
1989
|
29 |
2 |
p. 281-282
2 p.
|
article
|
| 51 |
Stochastic behaviour of a two-unit cold standby system with preparation time for repair
|
Tong De, Guo
|
|
1989
|
29 |
2 |
p. 125-129
5 p.
|
article
|
| 52 |
4752927 Synchronous changeover
|
Melling, LaurentA
|
|
1989
|
29 |
2 |
p. 292-
1 p.
|
article
|
| 53 |
Technological centering—An experimental approach to VLSI ICs yield maximization
|
Patyra, Marek J.
|
|
1989
|
29 |
2 |
p. 107-116
10 p.
|
article
|
| 54 |
4752729 Test circuit for VSLI integrated circuits
|
Jackson, Keit
|
|
1989
|
29 |
2 |
p. 291-
1 p.
|
article
|
| 55 |
4751458 Test pads for integrated circuit chips
|
Elward, JohnP
|
|
1989
|
29 |
2 |
p. 290-291
2 p.
|
article
|
| 56 |
4739257 Testsite system
|
Jenson, Dennis
|
|
1989
|
29 |
2 |
p. 286-
1 p.
|
article
|
| 57 |
4750890 Test socket for an integrated circuit package
|
Dube, Milford
|
|
1989
|
29 |
2 |
p. 290-
1 p.
|
article
|
| 58 |
The lower confidence limit for the mean of positive random variables
|
Do Le Minh,
|
|
1989
|
29 |
2 |
p. 151-152
2 p.
|
article
|
| 59 |
The role of atomic actions in a distributed system
|
Hura, Gurdeep Singh
|
|
1989
|
29 |
2 |
p. 185-193
9 p.
|
article
|
| 60 |
4745355 Weighted random pattern testing apparatus and method
|
Eichelberger, EdwardB
|
|
1989
|
29 |
2 |
p. 289-
1 p.
|
article
|
Journal description