| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
A cyclic queueing system with three servers and optional two-way feedback
|
Madan, K.C.
|
|
1988
|
28 |
6 |
p. 873-875
3 p.
|
article
|
| 2 |
Availability of the feeding system in the sugar industry
|
Kumar, Dinesh
|
|
1988
|
28 |
6 |
p. 867-871
5 p.
|
article
|
| 3 |
Calendar of International Conferences, Symposia, Lectures and Meetings of Interest
|
|
|
1988
|
28 |
6 |
p. 841-843
3 p.
|
article
|
| 4 |
4724378 Calibrated automatic test system
|
Murray, DonaldF
|
|
1988
|
28 |
6 |
p. 999-
1 p.
|
article
|
| 5 |
Device failure analysis in VLSI circuits due to missing flashes in mask fabrication process—A case study
|
Srivastava, A.
|
|
1988
|
28 |
6 |
p. 885-888
4 p.
|
article
|
| 6 |
4730316 Digital integrated circuits
|
Desyllas, PeterLL
|
|
1988
|
28 |
6 |
p. 1000-
1 p.
|
article
|
| 7 |
4730317 Digital integrated circuits
|
Desyllas, PeterLL
|
|
1988
|
28 |
6 |
p. 1000-
1 p.
|
article
|
| 8 |
Electronic alarm circuits manual
|
G.W.A.D.,
|
|
1988
|
28 |
6 |
p. 992-993
2 p.
|
article
|
| 9 |
Estimation of series system reliability for exponentially distributed component life times
|
Dey, Dipak K.
|
|
1988
|
28 |
6 |
p. 909-917
9 p.
|
article
|
| 10 |
Handbook of contamination control in microelectronics
|
G.W.A.D.,
|
|
1988
|
28 |
6 |
p. 994-
1 p.
|
article
|
| 11 |
4730232 High density microelectronic packaging module for high speed chips
|
Lindberg, FrankA
|
|
1988
|
28 |
6 |
p. 999-
1 p.
|
article
|
| 12 |
4724380 Integrated circuit having a built-in self test design
|
Burrows, David
|
|
1988
|
28 |
6 |
p. 999-
1 p.
|
article
|
| 13 |
4731759 Integrated circuit with built-in indicator of internal repair
|
Watanabe, Takayuk
|
|
1988
|
28 |
6 |
p. 1000-
1 p.
|
article
|
| 14 |
4734923 Lithographic system mask inspection device
|
Frankel, RobertD
|
|
1988
|
28 |
6 |
p. 1001-
1 p.
|
article
|
| 15 |
LSI interfacing
|
G.W.A.D.,
|
|
1988
|
28 |
6 |
p. 995-996
2 p.
|
article
|
| 16 |
Memo to all Indian authors
|
G.W.A.D,
|
|
1988
|
28 |
6 |
p. 855-
1 p.
|
article
|
| 17 |
4734641 Method for the thermal characterization of semiconductor packaging systems
|
Byrd, Dee
|
|
1988
|
28 |
6 |
p. 1000-
1 p.
|
article
|
| 18 |
MTBRD analysis of fail-safe systems
|
Zhou, Zhibang
|
|
1988
|
28 |
6 |
p. 857-860
4 p.
|
article
|
| 19 |
MTBRD evaluation of an actual fail-safe system
|
Zhou, Zhibang
|
|
1988
|
28 |
6 |
p. 861-864
4 p.
|
article
|
| 20 |
Non-linear regression for predicting software reliability
|
Xizi, Huang
|
|
1988
|
28 |
6 |
p. 865-866
2 p.
|
article
|
| 21 |
On a two-unit cold standby redundant system with random switching time
|
Mahmoud, M.A.W.
|
|
1988
|
28 |
6 |
p. 897-900
4 p.
|
article
|
| 22 |
On the determination of overall computer network reliability with m-level hierachical routing
|
Mandaltsis, D.
|
|
1988
|
28 |
6 |
p. 967-977
11 p.
|
article
|
| 23 |
Optimization of maintenance facility for a repairable system subject to availability constraint
|
Shetty, B.N.
|
|
1988
|
28 |
6 |
p. 893-896
4 p.
|
article
|
| 24 |
Parallel processing, distributed systems and local area networks
|
Canter, L.H.
|
|
1988
|
28 |
6 |
p. 919-927
9 p.
|
article
|
| 25 |
Power reduction methods for NMOS dynamic random access memories
|
Naidu, R.Venkatapathi
|
|
1988
|
28 |
6 |
p. 877-883
7 p.
|
article
|
| 26 |
Practical electronics handbook — Second edition
|
G.W.A.D.,
|
|
1988
|
28 |
6 |
p. 993-
1 p.
|
article
|
| 27 |
Publications, notices, calls for papers, etc.
|
|
|
1988
|
28 |
6 |
p. 845-854
10 p.
|
article
|
| 28 |
Reliability analysis of a repairable system in a changing environment subject to a general alternating renewal process
|
Cao, Jinhua
|
|
1988
|
28 |
6 |
p. 889-892
4 p.
|
article
|
| 29 |
Rigid-flex printed wiring design for production readiness
|
G.W.A.D.,
|
|
1988
|
28 |
6 |
p. 996-
1 p.
|
article
|
| 30 |
Sensors and transducers
|
G.W.A.D.,
|
|
1988
|
28 |
6 |
p. 991-
1 p.
|
article
|
| 31 |
Shrinkage testimators for the variance of a normal distribution at single and double stages
|
Pandey, B.N.
|
|
1988
|
28 |
6 |
p. 929-944
16 p.
|
article
|
| 32 |
4730749 Singulatory apparatus
|
Buesing, Jonathan
|
|
1988
|
28 |
6 |
p. 1000-
1 p.
|
article
|
| 33 |
4734872 Temperature control for device under test
|
Eager, George
|
|
1988
|
28 |
6 |
p. 1001-
1 p.
|
article
|
| 34 |
Testing whether F is “more NBU” than is G with randomly censored data
|
Wells, Martin T.
|
|
1988
|
28 |
6 |
p. 901-908
8 p.
|
article
|
| 35 |
The conquest of the microchip
|
G.W.A.D.,
|
|
1988
|
28 |
6 |
p. 997-
1 p.
|
article
|
| 36 |
The hybrid approach for improving the reliability of ring systems
|
Roda, Valentin Obac
|
|
1988
|
28 |
6 |
p. 979-989
11 p.
|
article
|
| 37 |
Title section, volume contents and author index, volume 28, 1988
|
|
|
1988
|
28 |
6 |
p. i-x
nvt p.
|
article
|
| 38 |
Tolerance design of electronic circuits
|
G.W.A.D.,
|
|
1988
|
28 |
6 |
p. 991-992
2 p.
|
article
|
| 39 |
Uncertainty propagation in fault-tree analyses using an exact method of moments
|
Rushdi, Ali M.
|
|
1988
|
28 |
6 |
p. 945-965
21 p.
|
article
|
| 40 |
VLSI electronics — Microstructure science
|
G.W.A.D.,
|
|
1988
|
28 |
6 |
p. 994-995
2 p.
|
article
|
Journal description